SCHEMBL15470565

SCHEMBL15470565

C=C(C)C(=O)OC(C)(C1CC=C(C)CC1)C1CC2CCC1S2

nearest known ligand 0.41

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
LMNA P02545 3/20 0.41
CYP3A4 P08684 2/20 0.41
ALOX15 P16050 2/20 0.41
PTPN1 P18031 1/20 0.36
STAT3 P40763 2/20 0.36
MEN1 O00255 1/20 0.36
MAPK1 P28482 1/20 0.36
KMT2A Q03164 1/20 0.36
CHRNA7 P36544 1/20 0.36
CES2 O00748 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15470545 0.83 LMNA (0.49) LMNACYP3A4ALOX15PTPN1STAT3
SCHEMBL15470560 0.82 LMNA (0.41) LMNACYP3A4ALOX15PTPN1STAT3
SCHEMBL15470544 0.81 LMNA (0.47) LMNACYP3A4ALOX15PTPN1STAT3
SCHEMBL15470543 0.81 LMNA (0.47) LMNACYP3A4ALOX15PTPN1STAT3
SCHEMBL15470557 0.80 LMNA (0.46) LMNACYP3A4ALOX15PTPN1STAT3
SCHEMBL15470556 0.78 LMNA (0.40) LMNACYP3A4ALOX15PTPN1STAT3
SCHEMBL15470540 0.78 LMNA (0.51) LMNACYP3A4ALOX15PTPN1STAT3
SCHEMBL15470552 0.74 LMNA (0.48) LMNACYP3A4ALOX15PTPN1STAT3
SCHEMBL15470551 0.74 LMNA (0.54) LMNACYP3A4ALOX15PTPN1STAT3
SCHEMBL15470546 0.73 LMNA (0.46) LMNACYP3A4ALOX15PTPN1STAT3

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9075308-B2 Positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-07-07 US disclosed
US-9075308-B2 Positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-07-07 US disclosed
US-20140045122-A1 POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-13 US disclosed
US-20140045122-A1 POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-13 US disclosed