SCHEMBL1593672

SCHEMBL1593672

C[S+](C)c1ccc(O)c2ccccc12.O=S(=O)([O-])C(F)(F)C(F)(F)C(F)(F)F

nearest known ligand 0.39

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
LDHA P00338 1/20 0.39
PSD A5PKW4 1/20 0.37
EP300 Q09472 2/20 0.35
KAT2B Q92831 2/20 0.35
KAT8 Q9H7Z6 2/20 0.35
IDO1 P14902 3/20 0.34
GAA P10253 4/20 0.32
MEN1 O00255 4/20 0.32
KMT2A Q03164 4/20 0.32
HKDC1 Q2TB90 2/20 0.32
MITF O75030 1/20 0.32
ALDH1A1 P00352 1/20 0.32
LMNA P02545 1/20 0.32
TP53 P04637 1/20 0.32
MAPT P10636 1/20 0.32
THRB P10828 1/20 0.32
HPGD P15428 1/20 0.32
ALOX15 P16050 1/20 0.32
CASP1 P29466 1/20 0.32
GFER P55789 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL271896 0.96 LDHA (0.38) LDHAPSDEP300KAT2BKAT8
SCHEMBL3120012 0.95 LDHA (0.37) LDHAPSDEP300KAT2BKAT8
Trifluoromethanesulfonic Acid SCHEMBL31168271 0.88 LDHA (0.44) LDHAPSDEP300KAT2BKAT8
Trifluoromethanesulfonic Acid SCHEMBL36124 0.88 LDHA (0.44) LDHAPSDEP300KAT2BKAT8
SCHEMBL3122221 0.83 PSD (0.34) LDHAPSDEP300KAT2BKAT8
SCHEMBL30316829 0.83 CA1 (0.34)
SCHEMBL5698053 0.83 CA1 (0.34)
SCHEMBL3117405 0.82 CA1 (0.34) LDHAPSDEP300KAT2BKAT8
SCHEMBL3120425 0.82 CYP1A2 (0.34)
SCHEMBL3122212 0.81 CYP1A2 (0.33)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9176381-B2 Positive type photosensitive resin composition CHEIL INDUSTRIES INC. (KR) 2015-11-03 US disclosed
US-20110159428-A1 Positive Type Photosensitive Resin Composition CHEIL INDUSTRIES INC. (KR) 2011-06-30 US disclosed
US-20110091818-A1 PROCESS FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-04-21 US disclosed
US-20100279226-A1 RESIST PROCESSING METHOD SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-11-04 US disclosed
US-20100273113-A1 PROCESS FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-10-28 US disclosed
US-20100273112-A1 PROCESS FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-10-28 US disclosed