SCHEMBL16074902

SCHEMBL16074902

CCCCC(C)(O)CCC(C)(C)O

nearest known ligand 0.53

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.53
FDPS P14324 10/20 0.33
GGPS1 O95749 6/20 0.33
ESR1 P03372 1/20 0.31
ESR2 Q92731 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16074725 0.92 ALDH1A1 (0.50) ALDH1A1FDPSGGPS1
SCHEMBL5872627 0.92 FDPS (0.37) ALDH1A1FDPSGGPS1ESR1ESR2
SCHEMBL16074823 0.90 ALDH1A1 (0.48) ALDH1A1FDPSGGPS1
SCHEMBL16074817 0.90 ALDH1A1 (0.48) ALDH1A1FDPSGGPS1
SCHEMBL16074947 0.90 ALDH1A1 (0.48) ALDH1A1FDPSGGPS1
SCHEMBL16074861 0.90 ALDH1A1 (0.48) ALDH1A1FDPSGGPS1
SCHEMBL16074882 0.90 ALDH1A1 (0.48) ALDH1A1FDPSGGPS1
SCHEMBL16077462 0.90 ALDH1A1 (0.48) ALDH1A1FDPSGGPS1
SCHEMBL16074760 0.90 ALDH1A1 (0.48) ALDH1A1FDPSGGPS1
SCHEMBL16077464 0.90 ALDH1A1 (0.48) ALDH1A1FDPSGGPS1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9188866-B2 Composition for forming titanium-containing resist underlayer film and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-11-17 US disclosed
US-9176382-B2 Composition for forming titanium-containing resist underlayer film and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-11-03 US disclosed
US-9176382-B2 Composition for forming titanium-containing resist underlayer film and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-11-03 US disclosed
US-20140273448-A1 COMPOSITION FOR FORMING TITANIUM-CONTAINING RESIST UNDERLAYER FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-18 US disclosed
US-20140273448-A1 COMPOSITION FOR FORMING TITANIUM-CONTAINING RESIST UNDERLAYER FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-18 US disclosed
US-20140273447-A1 COMPOSITION FOR FORMING TITANIUM-CONTAINING RESIST UNDERLAYER FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-18 US disclosed
US-20140273447-A1 COMPOSITION FOR FORMING TITANIUM-CONTAINING RESIST UNDERLAYER FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-18 US disclosed