SCHEMBL1664370

SCHEMBL1664370

C=C(C)C(=O)OCOC1CCCC1

nearest known ligand 0.44

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.44
TSHR P16473 3/20 0.41
THRB P10828 1/20 0.39
EPHX1 P07099 3/20 0.35
NAAA Q02083 2/20 0.32
HTT P42858 1/20 0.30
TP53 P04637 1/20 0.30
CYP3A4 P08684 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14982776 0.98 ALDH1A1 (0.43) ALDH1A1TSHRTHRBEPHX1NAAA
SCHEMBL36342 0.98 ALDH1A1 (0.43) ALDH1A1TSHRTHRBEPHX1NAAA
SCHEMBL5528985 0.92 ALDH1A1 (0.47) ALDH1A1TSHRTHRBEPHX1HTT
SCHEMBL2735074 0.89 ALDH1A1 (0.39) ALDH1A1TSHRTHRBEPHX1NAAA
SCHEMBL13289645 0.87 ALDH1A1 (0.43) ALDH1A1TSHRTHRB
SCHEMBL18876486 0.86 ALDH1A1 (0.46) ALDH1A1TSHRTHRB
SCHEMBL27646066 0.84 THRB (0.50) ALDH1A1TSHRTHRBEPHX1NAAA
SCHEMBL2735080 0.83 THRB (0.41) ALDH1A1TSHRTHRBEPHX1NAAA
SCHEMBL317213 0.82 THRB (0.49) ALDH1A1TSHRTHRBEPHX1NAAA
SCHEMBL2739881 0.80 EPHX1 (0.37) ALDH1A1TSHREPHX1NAAAHTT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 10 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230161257-A1 PHOTORESIST COMPOSITIONS AND PATTERN FORMATION METHODS U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT 2023-05-25 US disclosed
US-20230152697-A1 PHOTORESIST COMPOSITIONS AND PATTERN FORMATION METHODS U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT 2023-05-18 US disclosed
US-9023580-B2 Method of forming polymeric compound, resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2015-05-05 US disclosed
US-20130137049-A1 METHOD OF FORMING POLYMERIC COMPOUND, RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2013-05-30 US disclosed
US-7919227-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2011-04-05 US disclosed
US-7919227-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2011-04-05 US disclosed
US-7919227-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2011-04-05 US disclosed
US-20100040970-A1 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2010-02-18 US disclosed
US-20100040970-A1 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2010-02-18 US disclosed
US-20100040970-A1 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2010-02-18 US disclosed