SCHEMBL1666728

SCHEMBL1666728

[c]1[c]cc2c([c]1)c1ccccc1c1ccccc21

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4830263 0.70 HPRT1 (0.32)
SCHEMBL20300628 0.70 CYP1A2 (0.42)
SCHEMBL15987523 0.69 GPR3 (0.48)
SCHEMBL15987660 0.69 KDM4E (0.42)
SCHEMBL1666285 0.65 KDM4E (0.48)
SCHEMBL1666094 0.64 ALDH1A1 (0.48)
SCHEMBL2409866 0.62
Triphenylene SCHEMBL25597 0.62 HPRT1 (0.57)
Triphenylene SCHEMBL311118 0.62 HPRT1 (0.57)
SCHEMBL1006251 0.62 HPRT1 (0.57)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 13 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20240122065-A1 METAL PATTERNING MATERIAL, AMINE COMPOUND, ELECTRONIC DEVICE, AND METHOD FOR FORMING METAL PATTERN TOSOH CORPORATION (JP) 2024-04-11 US claimed
EP-4198163-A1 METAL PATTERNING MATERIAL, AMINE COMPOUND, ELECTRONIC DEVICE, AND METHOD FOR FORMING METAL PATTERN Tosoh Corporation (JP) 2023-06-21 EP claimed
US-20240122065-A1 METAL PATTERNING MATERIAL, AMINE COMPOUND, ELECTRONIC DEVICE, AND METHOD FOR FORMING METAL PATTERN TOSOH CORPORATION (JP) 2024-04-11 US disclosed
EP-4198163-A1 METAL PATTERNING MATERIAL, AMINE COMPOUND, ELECTRONIC DEVICE, AND METHOD FOR FORMING METAL PATTERN Tosoh Corporation (JP) 2023-06-21 EP disclosed
WO-2023013697-A1 MATERIAL FOR METAL PATTERNING, FLUORO COMPOUND, THIN FILM FOR METAL PATTERNING, ORGANIC ELECTROLUMINESCENCE DEVICE, ELECTRONIC DEVICE, AND METHOD FOR FORMING METAL PATTERN 東ソー株式会社 2023-02-09 WO disclosed
EP-2767407-B1 Ink-jet recording method and device FUJIFILM CORP (JP) 2015-12-02 EP disclosed
US-8888246-B2 Inkjet recording method and inkjet recording device FUJIFILM CORPORATION (JP) 2014-11-18 US disclosed
EP-2311918-B1 Ink composition, and inkjet recording method FUJIFILM CORP (JP) 2014-10-22 EP disclosed
US-20140232790-A1 INKJET RECORDING METHOD AND INKJET RECORDING DEVICE FUJIFILM CORPORATION (JP) 2014-08-21 US disclosed
EP-2767407-A1 Ink-jet recording method and device FUJIFILM Corporation (JP) 2014-08-20 EP disclosed
US-8211508-B2 radiation curing ink cures with high sensitivity to form a high quality, durable image resistant to cracking, peeling and has excellent impact resistance, flexibility, and adhesion; cyclic monofunctional acrylic or N-vinyl monomers FUJIFILM CORPORATION (JP) 2012-07-03 US disclosed
EP-2311918-A1 Ink composition, and inkjet recording method FUJIFILM Corporation (JP) 2011-04-20 EP disclosed
US-20080075882-A1 PROCESS FOR PRODUCING MOLDED PRINTED MATERIAL, AND MOLDED PRINTED MATERIAL FUJIFILM CORPORATION (JP) 2008-03-27 US disclosed