SCHEMBL1666979

SCHEMBL1666979

O=S(=O)(c1ccc(C(F)(F)F)cc1)S(=O)(=O)c1ccc(C(F)(F)F)cc1

nearest known ligand 0.59

Predicted protein targets (top 17)

geneUniProtsupporting neighboursconfidence
KIF11 P52732 3/20 0.59
CA1 P00915 4/20 0.48
CA2 P00918 4/20 0.48
CA9 Q16790 2/20 0.48
PTGS2 P35354 4/20 0.47
PTGS1 P23219 2/20 0.47
CA12 O43570 1/20 0.47
MAPT P10636 1/20 0.47
CES2 O00748 1/20 0.46
CES1 P23141 1/20 0.46
MMP1 P03956 2/20 0.46
AKR1B1 P15121 1/20 0.46
CYP19A1 P11511 1/20 0.46
ALDH1A1 P00352 1/20 0.44
BCHE P06276 1/20 0.44
ACHE P22303 1/20 0.44
KMT2A Q03164 1/20 0.44

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6743839 0.89 CNR2 (0.51) KIF11CA1CA2CA9CA12
SCHEMBL14509403 0.89 ALDH1A1 (0.58) KIF11CA1CA2CA9PTGS2
SCHEMBL3151057 0.84 KIF11 (0.59) KIF11CA1CA2CA9PTGS2
SCHEMBL11151267 0.83 KIF11 (0.48) KIF11CA1CA2CA9PTGS2
SCHEMBL11151265 0.83 KIF11 (0.48) KIF11CA1CA2CA9PTGS2
SCHEMBL16140114 0.82 KIF11 (0.57) KIF11CA1CA2CA9PTGS2
SCHEMBL1146306 0.82 KIF11 (0.57) KIF11CA1CA2CA9PTGS2
SCHEMBL20345345 0.80 KIF11 (0.55) KIF11CA1CA2CA9PTGS2
Silver SCHEMBL6115105 0.80 KIF11 (0.55) KIF11CA1CA2CA9PTGS2
SCHEMBL863126 0.80 PTGS2 (0.68) KIF11CA1CA2PTGS2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 162 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20250362597-A1 RESIST COMPOSITION AND RESIST FILM FORMING METHOD USING SAME MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2025-11-27 US disclosed
US-20250321485-A1 RESIST AUXILIARY FILM COMPOSITION, AND PATTERN FORMING METHOD USING SAME MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2025-10-16 US disclosed
CN-119452307-A Resist auxiliary film composition and pattern forming method using the same 三菱瓦斯化学株式会社 2025-02-14 CN disclosed
CN-119422108-A Resist composition and method for forming resist film using same 三菱瓦斯化学株式会社 2025-02-11 CN disclosed
US-20240369924-A1 RESIST COMPOSITION AND RESIST FILM FORMING METHOD USING SAME MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2024-11-07 US disclosed
US-20240369925-A1 RESIST AUXILIARY FILM COMPOSITION, AND PATTERN FORMING METHOD USING SAID COMPOSITION MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2024-11-07 US disclosed
CN-117769684-A Resist auxiliary film composition and pattern forming method using the same 三菱瓦斯化学株式会社 2024-03-26 CN disclosed
CN-117716290-A Resist composition and method for forming resist film using the same 三菱瓦斯化学株式会社 2024-03-15 CN disclosed
WO-2024014330-A1 RESIST AUXILIARY FILM COMPOSITION, AND PATTERN FORMING METHOD USING SAME 三菱瓦斯化学株式会社 2024-01-18 WO disclosed
WO-2024014329-A1 RESIST COMPOSITION AND RESIST FILM FORMING METHOD USING SAME 三菱瓦斯化学株式会社 2024-01-18 WO disclosed
US-7192681-B2 Positive photosensitive composition FUJI PHOTO FILM CO., LTD. (JP) 2007-03-20 US disclosed
US-7179578-B2 Positive resist composition FUJI PHOTO FILM CO., LTD. (JP) 2007-02-20 US disclosed
US-20070003871-A1 Positive photosensitive composition FUJI PHOTO FILM CO., LTD. 2007-01-04 US disclosed
US-7157208-B2 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. (JP) 2007-01-02 US disclosed
EP-1637927-A1 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. (JP) 2006-03-22 EP disclosed
US-20060046195-A1 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. 2006-03-02 US disclosed
US-20050277060-A1 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. 2005-12-15 US disclosed
US-20050186506-A1 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. 2005-08-25 US disclosed
EP-1566694-A1 Positive resist composition and pattern forming method using the same Fuji Photo Film Co., Ltd. (JP) 2005-08-24 EP disclosed
US-20040253538-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. 2004-12-16 US disclosed