SCHEMBL16683100

SCHEMBL16683100

CCC(C)c1ccc(OC(CC(c2ccccc2)c2ccccc2)OCCC2CCCCC2)cc1

nearest known ligand 0.41

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
SLC7A5 Q01650 1/20 0.41
SLC6A2 P23975 2/20 0.37
SLC6A4 P31645 2/20 0.37
SLC6A3 Q01959 2/20 0.37
ALDH1A1 P00352 2/20 0.36
NFE2L2 Q16236 1/20 0.34
KMT2A Q03164 2/20 0.34
TSHR P16473 1/20 0.34
FFAR1 O14842 1/20 0.34
MEN1 O00255 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16683051 0.89 ALDH1A1 (0.39) SLC7A5SLC6A2SLC6A4SLC6A3ALDH1A1
SCHEMBL11922887 0.88 SLC6A3 (0.41) SLC7A5SLC6A2SLC6A4SLC6A3ALDH1A1
SCHEMBL10182645 0.87 ALDH1A1 (0.41) SLC7A5ALDH1A1NFE2L2KMT2ATSHR
SCHEMBL16683054 0.87 ALDH1A1 (0.38) SLC7A5ALDH1A1NFE2L2KMT2ATSHR
SCHEMBL14461798 0.86 ALDH1A1 (0.40) SLC7A5ALDH1A1NFE2L2TSHRFFAR1
SCHEMBL11999025 0.85 SLC7A5 (0.43) SLC7A5SLC6A2SLC6A4SLC6A3ALDH1A1
SCHEMBL16081314 0.85 ALDH1A1 (0.40) SLC7A5ALDH1A1NFE2L2KMT2ATSHR
SCHEMBL17736517 0.83 ALDH1A1 (0.41) SLC7A5ALDH1A1NFE2L2KMT2ATSHR
SCHEMBL18474086 0.82 ALDH1A1 (0.38) SLC7A5ALDH1A1NFE2L2KMT2AFFAR1
SCHEMBL14118912 0.81 ALDH1A1 (0.37) SLC7A5ALDH1A1NFE2L2KMT2ATSHR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20150293446-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE COMPOSITION, RESIST FILM USING THE SAME, PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2015-10-15 US disclosed
US-20150118628-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC-RAY- OR RADIATION-SENSITIVE FILM THEREFROM, METHOD OF FORMING PATTERN, PROCESS FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2015-04-30 US disclosed