SCHEMBL16769835

SCHEMBL16769835

CCC(C)(C)C(=O)N1C(=O)CCC1=O

nearest known ligand 0.45

Predicted protein targets (top 19)

geneUniProtsupporting neighboursconfidence
RIPK1 Q13546 9/20 0.45
FKBP1A P62942 2/20 0.33
POLB P06746 1/20 0.32
CCR2 P41597 1/20 0.31
MEN1 O00255 1/20 0.31
KMT2A Q03164 1/20 0.31
LMNA P02545 1/20 0.30
CA12 O43570 1/20 0.30
CA1 P00915 1/20 0.30
CA2 P00918 1/20 0.30
CA3 P07451 1/20 0.30
CA4 P22748 1/20 0.30
CA6 P23280 1/20 0.30
CA5A P35218 1/20 0.30
CA7 P43166 1/20 0.30
CA9 Q16790 1/20 0.30
CA13 Q8N1Q1 1/20 0.30
CA14 Q9ULX7 1/20 0.30
CA5B Q9Y2D0 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16769833 0.92 RIPK1 (0.43) RIPK1FKBP1ACCR2LMNACA12
SCHEMBL22425373 0.78 MEN1 (0.47) RIPK1POLBMEN1KMT2A
SCHEMBL18416061 0.76 RIPK1 (0.40) RIPK1FKBP1APOLBMEN1KMT2A
SCHEMBL18416062 0.73 RECQL (0.43) RIPK1POLBMEN1KMT2A
SCHEMBL17589150 0.73 LMNA (0.52) RIPK1POLBMEN1KMT2ALMNA
SCHEMBL21880723 0.72 RIPK1 (0.49) RIPK1KMT2A
SCHEMBL12107375 0.71 RIPK1 (0.36) RIPK1FKBP1A
SCHEMBL9916111 0.71 RIPK1 (0.42) RIPK1FKBP1A
SCHEMBL13511563 0.69 POLB (0.37) POLBLMNA
SCHEMBL2377717 0.69 POLB (0.50) POLBLMNACA12CA1CA2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9726974-B2 Resin, photoresist composition, and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-08-08 US disclosed
US-9639002-B2 Method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2017-05-02 US disclosed
US-20160116843-A1 METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2016-04-28 US disclosed
US-20150153644-A1 RESIN, PHOTORESIST COMPOSITION, AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2015-06-04 US disclosed