SCHEMBL170595

SCHEMBL170595

C=CCS(=O)(=O)[C](S(=O)(=O)CC=C)S(=O)(=O)CC=C

nearest known ligand 0.32

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
TSHR P16473 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7853498 0.79 TSHR (0.30) TSHR
SCHEMBL27448399 0.77
SCHEMBL2659212 0.77
SCHEMBL5705224 0.75
SCHEMBL5515051 0.75 LMNA (0.32)
SCHEMBL1840425 0.75
SCHEMBL6890508 0.73 ALDH1A1 (0.35) TSHR
SCHEMBL7381942 0.73
SCHEMBL169333 0.73
SCHEMBL11402622 0.73

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 629 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1353225-B1 Radiation sensitive composition and compound FUJIFILM CORP (JP) 2014-06-04 EP claimed
US-8426101-B2 Photosensitive composition, pattern-forming method using the photosensitve composition and compound in the photosensitive composition FUJIFILM CORPORATION (JP) 2013-04-23 US claimed
EP-1406122-B1 PHOTOSENSITIVE COMPOSITION AND ACID GENERATOR FUJIFILM CORP (JP) 2013-01-09 EP claimed
US-8252508-B2 Positive photosensitive composition and method of forming resist pattern FUJIFILM CORPORATION (JP) 2012-08-28 US claimed
US-7867697-B2 Positive photosensitive composition and method of forming resist pattern FUJIFILM CORPORATION (JP) 2011-01-11 US claimed
US-20100261117-A1 POSITIVE PHOTOSENSITIVE COMPOSITION AND METHOD OF FORMING RESIST PATTERN FUJIFILM CORPORATION (JP) 2010-10-14 US claimed
US-7510822-B2 Stimulation sensitive composition and compound FUJIFILM CORPORATION (JP) 2009-03-31 US claimed
US-7192685-B2 Positive resist composition and method of forming resist pattern using the same. FUJI PHOTO FILM CO., LTD. (JP) 2007-03-20 US claimed
US-7090960-B2 Negative resist composition FUJI PHOTO FILM CO., LTD. (JP) 2006-08-15 US claimed
US-7074544-B2 Image recording material FUJI PHOTO FILM CO., LTD. (JP) 2006-07-11 US claimed
US-20050142484-A1 Image recording material FUJI PHOTO FILM CO., LTD. 2005-06-30 US claimed
US-6830867-B2 Acid generator capable of generating an acid by irradiation with actinic ray or radiation and having a structure represented by formula (I) defined in the specification and (B) a resin having a monocyclic or polycyclic alicyclic FUJI PHOTO FILM CO., LTD. (JP) 2004-12-14 US claimed
US-20030165776-A1 Negative resist composition FUJI PHOTO FILM CO., LTD. 2003-09-04 US claimed
CN-118020024-A Actinic-ray-sensitive or radiation-sensitive resin composition, and method for producing resist pattern 富士胶片株式会社 2024-05-10 CN disclosed
CN-117693716-A Pattern forming method and method for manufacturing electronic device 富士胶片株式会社 2024-03-12 CN disclosed
CN-117651910-A Actinic-ray-or radiation-sensitive resin composition, resist film, pattern forming method, and method for manufacturing electronic device 富士胶片株式会社 2024-03-05 CN disclosed
US-20030170562-A1 A polymer having a silicon atom in a side chain, which is insoluble in aqueous alkali solution and becomes soluble in aqueous alkali solution by the action of an acid, generated by acid generator on exposure to active light radiation FUJI PHOTO FILM CO., LTD. 2003-09-11 US disclosed
US-20030165776-A1 Negative resist composition FUJI PHOTO FILM CO., LTD. 2003-09-04 US disclosed
US-20030148206-A1 Positive photosensitive composition FUJI PHOTO FILM CO., LTD. 2003-08-07 US disclosed
EP-1300727-A2 Positive photosensitive composition FUJI PHOTO FILM CO., LTD. (JP) 2003-04-09 EP disclosed