SCHEMBL18220627

SCHEMBL18220627

Cc1cc(C2(c3cc(C)c(O)c(CO)c3)CCC(C(C)(C)C3CCC(c4cc(CO)c(O)c(C(C)C)c4)(c4cc(CO)c(O)c(C(C)C)c4)CC3)CC2)cc(CO)c1O

nearest known ligand 0.37

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
ACHE P22303 1/20 0.37
SHBG P04278 1/20 0.34
FDPS P14324 1/20 0.32
CYP1A2 P05177 1/20 0.32
CYP2D6 P10635 1/20 0.32
CYP2C9 P11712 1/20 0.32
CYP2C19 P33261 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14616328 0.94 FDPS (0.35) FDPSCYP2C9
SCHEMBL2190883 0.91 ACHE (0.44) ACHESHBGCYP1A2CYP2D6CYP2C9
SCHEMBL14616322 0.83 ACHE (0.34) ACHESHBG
SCHEMBL13559928 0.82 ACHE (0.37) ACHESHBG
SCHEMBL13559716 0.81 ACHE (0.36) ACHESHBG
SCHEMBL2193666 0.79 ACHE (0.40) ACHESHBGCYP1A2CYP2D6CYP2C9
SCHEMBL28308729 0.78 ACHE (0.58) ACHECYP1A2CYP2D6CYP2C9CYP2C19
SCHEMBL18220628 0.78 ACHE (0.42) ACHECYP1A2CYP2D6CYP2C9CYP2C19
SCHEMBL13518648 0.75 ACHE (0.39) ACHECYP2D6CYP2C9CYP2C19
SCHEMBL13518477 0.75 ACHE (0.44) ACHE

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9798234-B2 Resin composition, resist film using same, resist-coated mask blank, resist pattern forming method, and photo mask FUJIFILM CORPORATION (JP) 2017-10-24 US disclosed
US-9798234-B2 Resin composition, resist film using same, resist-coated mask blank, resist pattern forming method, and photo mask FUJIFILM CORPORATION (JP) 2017-10-24 US disclosed
US-20160327862-A1 RESIN COMPOSITION, RESIST FILM USING SAME, RESIST-COATED MASK BLANK, RESIST PATTERN FORMING METHOD, AND PHOTO MASK FUJIFILM CORPORATION (JP) 2016-11-10 US disclosed
US-20160327862-A1 RESIN COMPOSITION, RESIST FILM USING SAME, RESIST-COATED MASK BLANK, RESIST PATTERN FORMING METHOD, AND PHOTO MASK FUJIFILM CORPORATION (JP) 2016-11-10 US disclosed