SCHEMBL212781

SCHEMBL212781

C=C(C)C(=O)OCC(=O)OCC(=O)OC1(C)C2CC3CC(C2)CC1C3

nearest known ligand 0.41

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
CYP17A1 P05093 2/20 0.41
CYP19A1 P11511 2/20 0.41
ALDH1A1 P00352 1/20 0.36
TSHR P16473 3/20 0.33
THRB P10828 1/20 0.31
EPHX2 P34913 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL214191 0.97 CYP17A1 (0.42) CYP17A1CYP19A1ALDH1A1TSHRTHRB
SCHEMBL951656 0.88 CYP17A1 (0.40) CYP17A1CYP19A1EPHX2
SCHEMBL24592077 0.86 CYP17A1 (0.42) CYP17A1CYP19A1
SCHEMBL950092 0.85 THRB (0.44) CYP17A1CYP19A1ALDH1A1TSHRTHRB
SCHEMBL950137 0.85 ALDH1A1 (0.35) ALDH1A1TSHRTHRBEPHX2
SCHEMBL686058 0.85 ALDH1A1 (0.35) CYP17A1CYP19A1ALDH1A1TSHRTHRB
SCHEMBL17247236 0.84 CYP17A1 (0.36) CYP17A1CYP19A1ALDH1A1TSHRTHRB
SCHEMBL14370444 0.84 CYP17A1 (0.41) CYP17A1CYP19A1
SCHEMBL951658 0.84 CYP17A1 (0.38) CYP17A1CYP19A1
SCHEMBL949381 0.84 THRB (0.36) CYP17A1CYP19A1ALDH1A1TSHRTHRB

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 143 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2093213-B1 Positive resist composition and method of forming a resist pattern using the same TOKYO OHKA KOGYO CO LTD (JP) 2017-10-04 EP disclosed
EP-2093213-B1 Positive resist composition and method of forming a resist pattern using the same TOKYO OHKA KOGYO CO LTD (JP) 2017-10-04 EP disclosed
US-9097971-B2 Compound, radical polymerization initiator, method for producing compound, polymer, resist composition, and method for forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2015-08-04 US disclosed
US-9097971-B2 Compound, radical polymerization initiator, method for producing compound, polymer, resist composition, and method for forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2015-08-04 US disclosed
US-9023580-B2 Method of forming polymeric compound, resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2015-05-05 US disclosed
US-8795947-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2014-08-05 US disclosed
US-8795948-B2 Resist composition, method of forming resist pattern and polymeric compound TOKYO OHKA KOGYO CO., LTD. (JP) 2014-08-05 US disclosed
US-8795948-B2 Resist composition, method of forming resist pattern and polymeric compound TOKYO OHKA KOGYO CO., LTD. (JP) 2014-08-05 US disclosed
US-8795947-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2014-08-05 US disclosed
US-8735045-B2 Positive resist composition, method of forming resist pattern, and polymeric compound TOKYO OHKA KOGYO CO., LTD. (JP) 2014-05-27 US disclosed
US-20100015552-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, COMPOUND AND ACID GENERATOR TOKYO OHKA KOGYO CO., LTD. (JP) 2010-01-21 US disclosed
US-20100015552-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, COMPOUND AND ACID GENERATOR TOKYO OHKA KOGYO CO., LTD. (JP) 2010-01-21 US disclosed
US-20090269694-A1 POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2009-10-29 US disclosed
US-20090269694-A1 POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2009-10-29 US disclosed
US-20090269694-A1 POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2009-10-29 US disclosed
US-20090214982-A1 POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2009-08-27 US disclosed
US-20090214982-A1 POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2009-08-27 US disclosed
US-20090214982-A1 POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2009-08-27 US disclosed
EP-2093213-A1 Positive resist composition, method of forming resist pattern, and polymeric compound TOKYO OHKA KOGYO CO., LTD. (JP) 2009-08-26 EP disclosed
EP-2093213-A1 Positive resist composition, method of forming resist pattern, and polymeric compound TOKYO OHKA KOGYO CO., LTD. (JP) 2009-08-26 EP disclosed