SCHEMBL2199254

SCHEMBL2199254

Clc1ccc(-c2ncnc(C(Cl)(Cl)Cl)n2)cc1

nearest known ligand 0.45

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
HRH4 Q9H3N8 1/20 0.45
NPC1 O15118 4/20 0.41
RAB9A P51151 4/20 0.41
MAPT P10636 3/20 0.41
MEN1 O00255 3/20 0.41
KMT2A Q03164 3/20 0.41
RXFP1 Q9HBX9 1/20 0.38
MAP4K4 O95819 1/20 0.37
SMN1; SMN2 Q16637 3/20 0.36
RPA1 P27694 1/20 0.35
ADORA3 P0DMS8 1/20 0.35
NOTUM Q6P988 2/20 0.34
NR1H4 Q96RI1 1/20 0.34
NR1H2 P55055 1/20 0.34
NR1H3 Q13133 1/20 0.34
KMO O15229 1/20 0.33
DHFR P00374 1/20 0.33
CASP3 P42574 1/20 0.33
SENP8 Q96LD8 1/20 0.33
SENP7 Q9BQF6 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL27689580 0.84 NPC1 (0.39) HRH4NPC1RAB9AMAPTMEN1
SCHEMBL19625444 0.84 HRH4 (0.48) HRH4NPC1RAB9AMAPTMEN1
SCHEMBL2367747 0.83 NPC1 (0.38) NPC1RAB9AMAPTMEN1KMT2A
SCHEMBL14536813 0.81 HRH4 (0.31) HRH4
SCHEMBL80044 0.80 NPC1 (0.52) NPC1RAB9AMAPTMEN1KMT2A
SCHEMBL644691 0.80 CLK4 (0.47) NPC1RAB9AMAPTMEN1KMT2A
SCHEMBL5574497 0.80 CYP19A1 (0.42) NPC1RAB9AMAPTMAP4K4SMN1; SMN2
SCHEMBL125517 0.79 NPC1 (0.50) NPC1RAB9AMAPTMEN1KMT2A
SCHEMBL10803923 0.77 KMT2A (0.41) NPC1RAB9AMAPTMEN1KMT2A
SCHEMBL4413811 0.76 KDM4E (0.39) NPC1RAB9AMAPTMEN1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 54 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1301829-A4 RADIATION SENSITIVE COMPOSITIONS CONTAINING IMAGE QUALITY AND PROFILE ENHANCEMENT ADDITIVES FUJIFILM ELECTRONIC MATERIALS (US) 2006-06-28 EP claimed
EP-1303789-A4 T-BUTYL CINNAMATE POLYMERS AND THEIR USE IN PHOTORESIST COMPOSITIONS ARCH SPEC CHEM INC (US) 2005-09-28 EP claimed
EP-1303789-A1 T-BUTYL CINNAMATE POLYMERS AND THEIR USE IN PHOTORESIST COMPOSITIONS ARCH SPECIALTY CHEMICALS, INC. (US) 2003-04-23 EP claimed
EP-1301829-A1 RADIATION SENSITIVE COMPOSITIONS CONTAINING IMAGE QUALITY AND PROFILE ENHANCEMENT ADDITIVES ARCH SPECIALTY CHEMICALS, INC. (US) 2003-04-16 EP claimed
US-6514664-B1 Radiation sensitive compositions containing image quality and profile enhancement additives ARCH SPECIALTY CHEMICALS, INC. 2003-02-04 US claimed
WO-2002008834-A1 RADIATION SENSITIVE COMPOSITIONS CONTAINING IMAGE QUALITY AND PROFILE ENHANCEMENT ADDITIVES ARCH SPECIALTY CHEMICALS, INC. (US) 2002-01-31 WO claimed
WO-2002006895-A1 T-BUTYL CINNAMATE POLYMERS AND THEIR USE IN PHOTORESIST COMPOSITIONS ARCH SPECIALTY CHEMICALS, INC (US) 2002-01-24 WO claimed
US-6312870-B1 t-butyl cinnamate polymers and their use in photoresist compositions ARCH SPECIALTY CHEMICALS, INC. 2001-11-06 US claimed
US-5624787-A NITROGENOUS COMPOUND AND SULFONIUM COMPOUND FOR POSITIVE PHOTORESISTS SHIN-ETSU CHEMICAL CO., LTD. (JP) 1997-04-29 US claimed
US-7977027-B2 Base resin is a polyvinylphenol derivative having an alkoxyisobutoxy as a reactive group which is decomposable under the action of an acid to increase solubility in alkali; a sulfonium phtoacid generator, tris(2-(methoxymethoxy)ethyl)amine oxide, a solvent; photoresist; high resolution SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-07-12 US disclosed
US-7629108-B2 Nitrogen-containing organic compound, resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-12-08 US disclosed
US-7468236-B2 Amine compound, chemically amplified resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-12-23 US disclosed
US-7378548-B2 Tertiary amine compounds having an ester structure and processes for preparing the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-05-27 US disclosed
US-20080102405-A1 Nitrogen-containing organic compound, resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2008-05-01 US disclosed
US-5856561-A Bisphenol carboxylic acid tertiary ester derivatives and chemically amplified positive resist compositions SHIN-ETSU CHEMICAL CO., LTD. (JP) 1999-01-05 US disclosed
US-5849461-A Chemically amplified positive resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 1998-12-15 US disclosed
US-5824824-A AROMATIC SULFONATE ANIONS AND DISSOLUTION CONTRAST IN EXPOSED AND NONEXPOSED AREAS, POSITIVE RESISTS SHIN-ETSU CHEMICAL CO., LTD. (JP) 1998-10-20 US disclosed
US-5750309-A POLYHYDROXYSTYRENE, PHOTOACID GENERATOR, SOLVENT, DISSOLUTION INHIBITOR; FOR FINE PATTERNING SHIN-ETSU CHEMICAL CO., LTD. (JP) 1998-05-12 US disclosed
US-5679496-A CONTAINING SULFONIUM SALT HAVING TERT-BUTOXYCARBONYLMETHOXY GROUP(S) AS ACID LABILE GROUPS; SENSITIVITY, RESOLUTION, ETCH AND HEAT RESISTANCE SHIN-ETSU CHEMICAL CO., LTD. (JP) 1997-10-21 US disclosed
US-5624787-A NITROGENOUS COMPOUND AND SULFONIUM COMPOUND FOR POSITIVE PHOTORESISTS SHIN-ETSU CHEMICAL CO., LTD. (JP) 1997-04-29 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20080102405-A1 Nitrogen-containing organic compound, resist composition and patterning process MDM4, MUS81, NOP2 HRH4 2199/4885NPC1 3325/4885RAB9A 3852/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.