SCHEMBL2232076

SCHEMBL2232076

[C]1[CH]CCCCCCCCCC1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2230626 1.00
SCHEMBL1673036 1.00
SCHEMBL1673263 1.00
SCHEMBL2231137 1.00
SCHEMBL1673265 1.00
SCHEMBL1672487 1.00
SCHEMBL180754 0.97
SCHEMBL312936 0.86
SCHEMBL17385702 0.69
SCHEMBL19180789 0.69

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 69 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12044094-B2 Plug, downhole tool, and well treatment method KUREHA CORPORATION (JP) 2024-07-23 US disclosed
US-20240117101-A1 COMPOSITION FOR FILM FORMATION, RESIST COMPOSITION, RADIATION-SENSITIVE COMPOSITION, METHOD FOR PRODUCING AMORPHOUS FILM, RESIST PATTERN FORMATION METHOD, COMPOSITION FOR UNDERLAYER FILM FORMATION FOR LITHOGRAPHY, METHOD FOR PRODUCING UNDERLAYER FILM FOR LITHOGRAPHY, CIRCUIT PATTERN FORMATION METHOD, COMPOSITION FOR OPTICAL MEMBER FORMATION, RESIN FOR UNDERLAYER FILM FORMATION, RESIST RESIN, RADIATION-SENSITIVE RESIN, AND RESIN FOR UNDERLAYER FILM FORMATION FOR LITHOGRAPHY MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2024-04-11 US disclosed
US-20240117102-A1 POLYMER, COMPOSITION, METHOD FOR PRODUCING POLYMER, COMPOSITION FOR FILM FORMATION, RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, RADIATION-SENSITIVE COMPOSITION, COMPOSITION FOR UNDERLAYER FILM FORMATION FOR LITHOGRAPHY, METHOD FOR PRODUCING UNDERLAYER FILM FOR LITHOGRAPHY, CIRCUIT PATTERN FORMATION METHOD, AND COMPOSITION FOR OPTICAL MEMBER FORMATION MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2024-04-11 US disclosed
WO-2024043084-A1 RESIN COMPOSITION, PREPREG, FILM WITH RESIN, METAL FOIL WITH RESIN, METAL-CLAD LAMINATE, AND WIRING BOARD パナソニックIPマネジメント株式会社 2024-02-29 WO disclosed
WO-2024043083-A1 RESIN COMPOSITION, PREPREG, FILM WITH RESIN, METAL FOIL WITH RESIN, METAL-CLAD LAMINATED PLATE, AND WIRING BOARD パナソニックIPマネジメント株式会社 2024-02-29 WO disclosed
US-20230374880-A1 PLUG, DOWNHOLE TOOL, AND WELL TREATMENT METHOD KUREHA CORPORATION (JP) 2023-11-23 US disclosed
US-20230314942-A1 POLYCYCLIC POLYPHENOLIC RESIN, COMPOSITION, METHOD FOR PRODUCING POLYCYCLIC POLYPHENOLIC RESIN, COMPOSITION FOR FILM FORMATION, RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, RADIATION-SENSITIVE COMPOSITION, COMPOSITION FOR UNDERLAYER FILM FORMATION FOR LITHOGRAPHY, METHOD FOR PRODUCING UNDERLAYER FILM FOR LITHOGRAPHY, CIRCUIT PATTERN FORMATION METHOD, AND COMPOSITION FOR OPTICAL MEMBER FORMATION MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2023-10-05 US disclosed
US-20230296982-A1 POLYMER, COMPOSITION, METHOD FOR PRODUCING POLYMER, COMPOSITION, COMPOSITION FOR FILM FORMATION, RESIST COMPOSITION, RADIATION-SENSITIVE COMPOSITION, COMPOSITION FOR UNDERLAYER FILM FORMATION FOR LITHOGRAPHY, RESIST PATTERN FORMATION METHOD, METHOD FOR PRODUCING UNDERLAYER FILM FOR LITHOGRAPHY, CIRCUIT PATTERN FORMATION METHOD, AND COMPOSITION FOR OPTICAL MEMBER FORMATION MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2023-09-21 US disclosed
EP-4227355-A1 PLUG, DOWNHOLE TOOL, AND WELL TREATING METHOD Kureha Corporation (JP) 2023-08-16 EP disclosed
US-11702504-B2 Resin composition for printed wiring board, prepreg, laminate, metal foil-clad laminate, printed wiring board, and multilayer printed wiring board MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2023-07-18 US disclosed
EP-2479320-A1 FIBER AND FIBER STRUCTURE Teijin Limited (JP) 2012-07-25 EP disclosed
US-20120184166-A1 FIBER AND FIBER STRUCTURE TEIJIN LIMITED (JP) 2012-07-19 US disclosed
EP-2374833-A1 METHOD FOR USING CYCLIC CARBODIMIDE Teijin Limited (JP) 2011-10-12 EP disclosed
US-20110237755-A1 METHOD OF USING A CYCLIC CARBODIIMIDE TEIJIN LIMITED (JP) 2011-09-29 US disclosed
US-20110224385-A1 RESIN COMPOSITION COMPRISING A CYCLIC CARBODIIMIDE TEIJIN LIMITED (JP) 2011-09-15 US disclosed
EP-2360208-A1 RESIN COMPOSITION CONTAINING CYCLIC CARBODIMIDE Teijin Limited (JP) 2011-08-24 EP disclosed
EP-0915865-B1 COVALENTLY IMMOBILISED FLUOROIONOPHORES FOR OPTICAL ION SENSORS NOVARTIS AG (CH) 2002-02-20 EP disclosed
US-6294390-B1 COMPOUND CONSISTING OF IONOPHORE, FLUOROPHORE, AND A FUNCTIONAL GROUP BOUND TOGETHER THROUGH A TRIVALENT ORGANIC RADICAL; SENSORS HAVING LONG USABLE LIFE AND A HIGH DEGREE OF SENSITIVITY NOVARTIS AG (CH) 2001-09-25 US disclosed
US-4694102-A OXIDATION INHIBITORS MITSUBISHI YUKA FINE CHEMICALS CO., LTD. (JP) 1987-09-15 US disclosed
US-4633008-A FOR POLYMERS AND OTHER ORGANIC MATERIALS MITSUBISHI YUKA FINE CHEMICALS CO., LTD. (JP) 1986-12-30 US disclosed