SCHEMBL2387774

SCHEMBL2387774

O=S(=O)([O-])C(F)(F)C(F)(F)C(F)(F)C(F)(F)F.OCCc1ccc(-[s+]2c3ccccc3c3ccccc32)cc1

nearest known ligand 0.36

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
CA2 P00918 14/20 0.36
CA1 P00915 13/20 0.36
CA12 O43570 1/20 0.34
CA4 P22748 1/20 0.34
CA6 P23280 1/20 0.34
CA5A P35218 1/20 0.34
CA7 P43166 1/20 0.34
CA9 Q16790 1/20 0.34
CA14 Q9ULX7 1/20 0.34
CA5B Q9Y2D0 1/20 0.34
MMP1 P03956 2/20 0.31
MMP2 P08253 2/20 0.31
MMP9 P14780 2/20 0.31
MMP8 P22894 2/20 0.31
MMP13 P45452 2/20 0.31
TDP1 Q9NUW8 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5691997 0.84 CA2 (0.33) CA2CA1MMP1MMP2MMP9
SCHEMBL5691705 0.83 CA2 (0.35) CA2CA1MMP1MMP2MMP9
SCHEMBL682975 0.78 TDP1 (0.48) CA2CA1CA12CA4CA6
Iodide SCHEMBL546036 0.77 TDP1 (0.47) CA2CA1CA12CA4CA6
SCHEMBL3289780 0.77 GPR3 (0.31)
Acetic Acid SCHEMBL3775709 0.75 TSHR (0.39) CA2CA1CA12CA4CA6
SCHEMBL10167772 0.74 TDP1 (0.44) CA2CA1CA12CA4CA6
SCHEMBL5690740 0.73 CA2 (0.35) CA2CA1MMP1MMP2MMP9
SCHEMBL29869290 0.72
SCHEMBL6708360 0.71 CA2 (0.35) CA2CA1MMP1MMP2MMP9

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8084183-B2 Resist composition for electron beam, X-ray, or EUV, and pattern-forming method using the same FUJIFILM CORPORATION (JP) 2011-12-27 US disclosed
US-8021819-B2 Sulfonium compound, photosensitive composition containing the compound and pattern-forming method using the photosensitive composition FUJIFILM CORPORATION (JP) 2011-09-20 US disclosed
EP-1816519-B1 Novel sulfonium compound, photosensitive composition containing the compound and pattern-forming method using the photosensitive composition FUJIFILM CORP (JP) 2010-11-03 EP disclosed
US-20090047598-A1 RESIST COMPOSITION FOR ELECTRON BEAM, X-RAY, OR EUV, AND PATTERN-FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2009-02-19 US disclosed
EP-2020616-A2 Resist composition for electron beam, x-ray, or euv, and pattern-forming method using the same FUJIFILM Corporation (JP) 2009-02-04 EP disclosed
US-20070184384-A1 Novel sulfonium compound, photosensitive composition containing the compound and pattern-forming method using the photosensitive composition FUJIFILM CORPORATION (JP) 2007-08-09 US disclosed
EP-1816519-A1 Novel sulfonium compound, photosensitive composition containing the compound and pattern-forming method using the photosensitive composition FUJIFILM Corporation (JP) 2007-08-08 EP disclosed