SCHEMBL2468239

SCHEMBL2468239

C=CC(F)(F)S(=O)(=O)O

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 30 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20030027061-A1 Photoacid generators and photoresists comprising same SHIPLEY COMPANY, L.L.C. 2003-02-06 US claimed
WO-2002042845-A2 PHOTOACID GENERATORS AND PHOTORESISTS COMPRISING SAME SHIPLEY COMPANY, L.L.C. (US) 2002-05-30 WO claimed
US-10670965-B2 Polymers and photoresist compositions ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2020-06-02 US disclosed
US-9983477-B2 Polymers and photoresist compositions ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2018-05-29 US disclosed
US-9720321-B2 Lactone photoacid generators and resins and photoresists comprising same ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2017-08-01 US disclosed
EP-2267532-B1 Photoacid generators and photoresists comprising same ROHM & HAAS ELECT MAT (US) 2015-08-19 EP disclosed
US-8349533-B2 Resist lower-layer composition containing thermal acid generator, resist lower layer film-formed substrate, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-01-08 US disclosed
US-8338077-B2 Photoacid generators and photoresists comprising same ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2012-12-25 US disclosed
US-20120214100-A1 RESIST COMPOSITION AND PATTERNING PROCESS USING THE SAME SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-08-23 US disclosed
US-20120129104-A1 LACTONE PHOTOACID GENERATORS AND RESINS AND PHOTORESISTS COMPRISING SAME ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2012-05-24 US disclosed
EP-2452941-A1 Lactone photoacid generators and resins and photoresists comprising same Rohm and Haas Electronic Materials LLC (US) 2012-05-16 EP disclosed
US-20060141383-A1 Sulfonium salts, radiation- sensitive acid generators, and positive radiator-sensitive resin compositions JSR CORPORATION (JP) 2006-06-29 US disclosed
EP-1586570-A1 SULFONIUM SALTS, RADIATION-SENSITIVE ACID GENERATORS, AND POSITIVE RADIATION-SENSITIVE RESIN COMPOSITIONS JSR Corporation (JP) 2005-10-19 EP disclosed
US-6849374-B2 Photoacid generators and photoresists comprising same SHIPLEY COMPANY, L.L.C. (US) 2005-02-01 US disclosed
US-6849374-B2 Photoacid generators and photoresists comprising same SHIPLEY COMPANY, L.L.C. (US) 2005-02-01 US disclosed
WO-2002042845-A3 PHOTOACID GENERATORS AND PHOTORESISTS COMPRISING SAME SHIPLEY CO LLC (US) 2004-01-08 WO disclosed
US-20030027061-A1 Photoacid generators and photoresists comprising same SHIPLEY COMPANY, L.L.C. 2003-02-06 US disclosed
US-20030027061-A1 Photoacid generators and photoresists comprising same SHIPLEY COMPANY, L.L.C. 2003-02-06 US disclosed
WO-2002042845-A2 PHOTOACID GENERATORS AND PHOTORESISTS COMPRISING SAME SHIPLEY COMPANY, L.L.C. (US) 2002-05-30 WO disclosed
WO-2002042845-A2 PHOTOACID GENERATORS AND PHOTORESISTS COMPRISING SAME SHIPLEY COMPANY, L.L.C. (US) 2002-05-30 WO disclosed