SCHEMBL25564019

SCHEMBL25564019

CCC(CC)(OC(C)=O)c1cccc(F)c1

nearest known ligand 0.46

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
KCNN4 O15554 4/20 0.46
POLB P06746 1/20 0.40
RIPK1 Q13546 1/20 0.40
MEN1 O00255 2/20 0.39
KMT2A Q03164 2/20 0.39
CETP P11597 1/20 0.38
MAOB P27338 2/20 0.38
KIF11 P52732 1/20 0.37
CES2 O00748 1/20 0.37
CES1 P23141 1/20 0.37
MAPT P10636 1/20 0.37
GAA P10253 1/20 0.36
MTOR P42345 1/20 0.36
LMNA P02545 1/20 0.36
HDAC3 O15379 1/20 0.36
HDAC1 Q13547 1/20 0.36
HDAC2 Q92769 1/20 0.36
HDAC6 Q9UBN7 1/20 0.36
EDNRB P24530 1/20 0.36
EDNRA P25101 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL25563997 0.84 KCNN4 (0.46) KCNN4POLBRIPK1MEN1KMT2A
SCHEMBL25564040 0.84 ALDH1A1 (0.48) POLBMEN1KMT2AMAOBCES2
SCHEMBL25564011 0.83 CYP4F2 (0.37) RIPK1CES2CES1GAA
SCHEMBL5814498 0.82 KCNN4 (0.42) KCNN4POLBRIPK1MEN1KMT2A
SCHEMBL25564002 0.80 KCNN4 (0.40) KCNN4RIPK1MEN1KMT2AMAOB
SCHEMBL10234508 0.80 CYP2C19 (0.46) KCNN4KMT2AKIF11CES1MAPT
SCHEMBL25564072 0.80 CETP (0.44) CETPKIF11MAPTGAA
SCHEMBL25564013 0.79 KCNN4 (0.40) KCNN4RIPK1MAOBCES2CES1
SCHEMBL25563995 0.79 KCNN4 (0.50) KCNN4RIPK1CETPMAOBCES2
SCHEMBL11767902 0.77 KCNN4 (0.38) KCNN4KMT2ACETPMAOBKIF11

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230367213-A1 MASK BLANK, RESIST PATTERN FORMING PROCESS AND CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-11-16 US disclosed
US-20230194986-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-06-22 US disclosed
US-20230161254-A1 CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-05-25 US disclosed
US-20230161254-A1 CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-05-25 US disclosed