SCHEMBL25564013

SCHEMBL25564013

CCC(CC)(OC(C)=O)c1ccc(F)c(F)c1

nearest known ligand 0.40

Predicted protein targets (top 18)

geneUniProtsupporting neighboursconfidence
KCNN4 O15554 1/20 0.40
RIPK1 Q13546 2/20 0.38
HPGD P15428 1/20 0.37
TSHR P16473 1/20 0.37
CYP4F2 P78329 1/20 0.36
CYP4A11 Q02928 1/20 0.36
MAOA P21397 1/20 0.36
MAOB P27338 1/20 0.36
TRPA1 O75762 2/20 0.36
CES2 O00748 1/20 0.35
CES1 P23141 1/20 0.35
HDAC3 O15379 1/20 0.35
HDAC1 Q13547 1/20 0.35
HDAC2 Q92769 1/20 0.35
HDAC6 Q9UBN7 1/20 0.35
PDE2A O00408 1/20 0.33
RAB9A P51151 1/20 0.33
CHRM3 P20309 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL25564007 0.84 RIPK1 (0.41) KCNN4RIPK1HPGDTSHRCYP4F2
SCHEMBL25564002 0.81 KCNN4 (0.40) KCNN4RIPK1HPGDMAOBHDAC3
SCHEMBL25564019 0.79 KCNN4 (0.46) KCNN4RIPK1MAOBCES2CES1
SCHEMBL25564047 0.78 AR (0.40) HPGDMAOBCES2
SCHEMBL25564011 0.78 CYP4F2 (0.37) RIPK1CYP4F2CYP4A11CES2CES1
SCHEMBL25564041 0.78 CES2 (0.42) HPGDMAOBCES2CES1
SCHEMBL25563992 0.78 KCNN4 (0.42) KCNN4RIPK1HPGDCYP4F2CYP4A11
SCHEMBL25564040 0.76 ALDH1A1 (0.48) MAOBCES2RAB9A
SCHEMBL15737637 0.76 KCNN4 (0.33) KCNN4RIPK1HPGDTSHRTRPA1
SCHEMBL25564069 0.76 CYP2C19 (0.38) HPGDHDAC3HDAC1HDAC2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230367213-A1 MASK BLANK, RESIST PATTERN FORMING PROCESS AND CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-11-16 US disclosed
US-20230194986-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-06-22 US disclosed
US-20230161254-A1 CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-05-25 US disclosed