SCHEMBL26055596

SCHEMBL26055596

Cc1cc([SH](c2ccccc2)c2ccccc2)cc(C)c1OCC(=O)OC1C2CC3CC4C(=O)OC1CC34C2

nearest known ligand 0.31

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
NPSR1 Q6W5P4 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL25794906 0.79 NPSR1 (0.33) NPSR1
SCHEMBL25629409 0.78 MMP1 (0.31)
SCHEMBL25629389 0.74 KMT2A (0.30) NPSR1
SCHEMBL25629393 0.74 KMT2A (0.30) NPSR1
SCHEMBL25852024 0.71 CYP19A1 (0.40) NPSR1
SCHEMBL25897253 0.70 KMT2A (0.31)
SCHEMBL25877279 0.70 ALDH1A1 (0.31)
SCHEMBL25657994 0.70 MAPK1 (0.45)
SCHEMBL25468324 0.69 CYP17A1 (0.43) NPSR1
SCHEMBL25657999 0.67 MMP1 (0.49)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 10 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2024043121-A1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, AND COMPOUND AND INTERMEDIATE THEREFOR 東京応化工業株式会社 2024-02-29 WO disclosed
WO-2024043098-A1 RESIST COMPOSITION, RESIST PATTERN FORMING METHOD, COMPOUND, AND INTERMEDIATE THEREOF 東京応化工業株式会社 2024-02-29 WO disclosed
WO-2023223897-A1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, AND COMPOUND 東京応化工業株式会社 2023-11-23 WO disclosed
WO-2023195407-A1 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN 東京応化工業株式会社 2023-10-12 WO disclosed
WO-2023189961-A1 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN 東京応化工業株式会社 2023-10-05 WO disclosed
WO-2023171670-A1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, COMPOUND, AND POLYMER COMPOUND 東京応化工業株式会社 2023-09-14 WO disclosed
WO-2023162907-A1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, COMPOUND, AND ACID GENERATION AGENT 東京応化工業株式会社 2023-08-31 WO disclosed
WO-2023163008-A1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, COMPOUND, AND POLYMER COMPOUND 東京応化工業株式会社 2023-08-31 WO disclosed
WO-2023112893-A1 RESIST COMPOSITION AND RESIST PATTERN FORMATION METHOD 東京応化工業株式会社 2023-06-22 WO disclosed
WO-2023112746-A1 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN 東京応化工業株式会社 2023-06-22 WO disclosed