SCHEMBL2634463

SCHEMBL2634463

CC(C)c1cc(C(C)C)c(S(=O)(=O)OS(c2ccc(C(C)(C)C)cc2)(c2ccc(C(C)(C)C)cc2)c2ccc(C(C)(C)C)cc2)c(C(C)C)c1

nearest known ligand 0.43

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
FABP4 P15090 2/20 0.43
FABP3 P05413 1/20 0.43
FABP5 Q01469 1/20 0.43
NR1I2 O75469 5/20 0.40
ENPP3 O14638 2/20 0.38
ENPP1 P22413 2/20 0.38
ALDH1A1 P00352 2/20 0.38
GRIA4 P48058 2/20 0.37
GAA P10253 1/20 0.36
HSD11B1 P28845 2/20 0.35
HSD17B3 P37058 1/20 0.35
BCHE P06276 1/20 0.35
ACHE P22303 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2691695 0.95 FABP3 (0.39) FABP4FABP3FABP5NR1I2ENPP3
SCHEMBL17627840 0.85 ENPP1 (0.46) NR1I2ENPP3ENPP1ALDH1A1GAA
SCHEMBL5549116 0.85 FABP4 (0.46) FABP4FABP3FABP5ENPP3ENPP1
SCHEMBL3778774 0.84 ENPP3 (0.34) FABP4FABP3FABP5NR1I2ENPP3
SCHEMBL383992 0.83 FABP4 (0.47) FABP4FABP3FABP5ENPP3ENPP1
SCHEMBL5549720 0.80 ENPP3 (0.41) FABP4FABP3FABP5ENPP3ENPP1
SCHEMBL5549809 0.80 FABP3 (0.42) FABP4FABP3FABP5ENPP3ENPP1
SCHEMBL2634793 0.77 FABP4 (0.42) FABP4FABP3FABP5NR1I2ENPP3
SCHEMBL2946584 0.77 FABP4 (0.62) FABP4FABP3FABP5ENPP3ENPP1
SCHEMBL17627839 0.74 ENPP3 (0.52) FABP4FABP3FABP5ENPP3ENPP1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 80 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6200480-B1 CONTACTING IMPURE SOLUTION OF PHOTOACID GENERATING COMPOUND CONTAINING TRACE AMOUNTS OF ACIDIC IMPURITIES WITH ANIONIC ION EXCHANGE RESIN CONTAINING PENDENT POLYAMINE FUNCTIONAL GROUPS FOR SUFFICIENT AMOUNT OF TIME TO REMOVE SAID IMPURITIES ARCH SPECIALTY CHEMICALS, INC. 2001-03-13 US claimed
EP-1054715-A1 METHOD OF PURIFYING PHOTOACID GENERATORS FOR USE IN PHOTORESIST COMPOSITIONS Olin Microelectronic Chemicals, Inc. (US) 2000-11-29 EP claimed
WO-1999036151-A1 METHOD OF PURIFYING PHOTOACID GENERATORS FOR USE IN PHOTORESIST COMPOSITIONS OLIN MICROELECTRONIC CHEMICALS, INC. (US) 1999-07-22 WO claimed
US-20250216783-A1 ANTI-SPACER MASKING PROCESS USING SECOND SWITCHABLE POLYMER TOKYO ELECTRON LTD (JP) 2025-07-03 US disclosed
US-20250216763-A1 ANTI-SPACER MASKING PROCESS USING RESIST LAYER WITH SOLUBILITY SHIFTING AGENT TOKYO ELECTRON LTD (JP) 2025-07-03 US disclosed
US-20250216782-A1 MASKING PROCESS USING SWITCHABLE POLYMER TOKYO ELECTRON LTD (JP) 2025-07-03 US disclosed
US-20250188311-A1 POLY-O-HYDROXYAMIDES COMPRISING NOVEL INDANE BIS-O-AMINOPHENOLS, PHOTOSENSITIVE COMPOSITIONS, DIELECTRIC FILMS, AND BUFFER COATINGS CONTAINING THE SAME FUJIFILM ELECTRONIC MAT USA INC (US) 2025-06-12 US disclosed
US-20250189892-A1 POLY-O-HYDROXYAMIDES COMPRISING NOVEL INDANE BIS-O-AMINOPHENOLS, PHOTOSENSITIVE COMPOSITIONS, DIELECTRIC FILMS, AND BUFFER COATINGS CONTAINING THE SAME FUJIFILM ELECTRONIC MAT USA INC (US) 2025-06-12 US disclosed
WO-2025106697-A1 BIO-BASED COMPOSITIONS FOR PHOTORESISTS AND PATTERNING HUSTAD PHILLIP DENE (US) 2025-05-22 WO disclosed
US-20250068079-A1 BIO-BASED SOLVENTS FOR NEGATIVE TONE DEVELOPMENT HUSTAD PHILLIP DENE (US) 2025-02-27 US disclosed
WO-2024107979-A1 BIO-BASED SOLVENTS FOR NEGATIVE TONE DEVELOPMENT HUSTAD PHILLIP DENE (US) 2024-05-23 WO disclosed
US-20030065101-A1 Silicon-containing acetal protected polymers and photoresists compositions thereof ARCH SPECIALITY CHEMICALS, INC. 2003-04-03 US disclosed
US-20030064321-A1 Free-acid containing polymers and their use in photoresists ARCH SPECIALTY CHEMICALS, INC. 2003-04-03 US disclosed
WO-2003021357-A1 FREE-ACID CONTAINING POLYMERS AND THEIR USE IN PHOTORESISTS ARCH SPECIALTY CHEMICALS, INC. (US) 2003-03-13 WO disclosed
US-20020197558-A1 Photoacid generators for use in photoresist compositions ARCH SPECIALTY CHEMICALS, INC. 2002-12-26 US disclosed
WO-2002082184-A1 SILICON-CONTAINING ACETAL PROTECTED POLYMERS AND PHOTORESISTS COMPOSITIONS THEREOF ARCH SPECIALTY CHEMICALS, INC. (US) 2002-10-17 WO disclosed
WO-2002082185-A1 PERFLUOROALKYLSULFONIC ACID COMPOUNDS FOR PHOTORESISTS ARCH SPECIALTY CHEMICALS, INC. (US) 2002-10-17 WO disclosed
US-6200480-B1 CONTACTING IMPURE SOLUTION OF PHOTOACID GENERATING COMPOUND CONTAINING TRACE AMOUNTS OF ACIDIC IMPURITIES WITH ANIONIC ION EXCHANGE RESIN CONTAINING PENDENT POLYAMINE FUNCTIONAL GROUPS FOR SUFFICIENT AMOUNT OF TIME TO REMOVE SAID IMPURITIES ARCH SPECIALTY CHEMICALS, INC. 2001-03-13 US disclosed
EP-1054715-A1 METHOD OF PURIFYING PHOTOACID GENERATORS FOR USE IN PHOTORESIST COMPOSITIONS Olin Microelectronic Chemicals, Inc. (US) 2000-11-29 EP disclosed
WO-1999036151-A1 METHOD OF PURIFYING PHOTOACID GENERATORS FOR USE IN PHOTORESIST COMPOSITIONS OLIN MICROELECTRONIC CHEMICALS, INC. (US) 1999-07-22 WO disclosed