SCHEMBL2757765

SCHEMBL2757765

O=C(CO)C(O)C1COC2(CCCCC2)O1

nearest known ligand 0.34

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
PABPC1 P11940 1/20 0.34
CTDSP1 Q9GZU7 1/20 0.34
GAA P10253 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9331683 0.79 PABPC1 (0.32) PABPC1CTDSP1GAA
SCHEMBL12116752 0.79 CA2 (0.32)
SCHEMBL19714171 0.76 PABPC1 (0.38) PABPC1CTDSP1GAA
SCHEMBL15756122 0.76 PABPC1 (0.38) PABPC1CTDSP1GAA
SCHEMBL19714170 0.76 PABPC1 (0.38) PABPC1CTDSP1GAA
SCHEMBL16807931 0.76 PABPC1 (0.38) PABPC1CTDSP1GAA
SCHEMBL2757785 0.76 PABPC1 (0.38) PABPC1CTDSP1GAA
SCHEMBL5595617 0.76 PABPC1 (0.38) PABPC1CTDSP1GAA
SCHEMBL2757796 0.74 PABPC1 (0.39) PABPC1CTDSP1GAA
SCHEMBL1487324 0.73 PABPC1 (0.39) PABPC1CTDSP1GAA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8541161-B2 Actinic ray-sensitive or radiation-sensitive resin composition, resist film using the same and pattern forming method FUJIFILM CORPORATION (JP) 2013-09-24 US disclosed
US-8541161-B2 Actinic ray-sensitive or radiation-sensitive resin composition, resist film using the same and pattern forming method FUJIFILM CORPORATION (JP) 2013-09-24 US disclosed
US-20120003586-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM USING THE SAME AND PATTERN FORMING METHOD FUJIFILM CORPORATION (JP) 2012-01-05 US disclosed
US-20120003586-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM USING THE SAME AND PATTERN FORMING METHOD FUJIFILM CORPORATION (JP) 2012-01-05 US disclosed
US-20110269071-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND RESIST FILM AND PATTERN FORMING METHOD USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2011-11-03 US disclosed
US-20110269071-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND RESIST FILM AND PATTERN FORMING METHOD USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2011-11-03 US disclosed
US-7235341-B2 Positive resist composition FUJIFILM CORPORATION (JP) 2007-06-26 US disclosed
US-7235341-B2 Positive resist composition FUJIFILM CORPORATION (JP) 2007-06-26 US disclosed