SCHEMBL2866577

SCHEMBL2866577

CCc1cc(CC)c(CC)c(S(=O)(=O)O)c1CC

nearest known ligand 0.42

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
FABP3 P05413 1/20 0.42
FABP4 P15090 1/20 0.42
FABP5 Q01469 1/20 0.42
SMN1; SMN2 Q16637 1/20 0.37
SLC9A1 P19634 1/20 0.32
LMNA P02545 1/20 0.32
HPGD P15428 1/20 0.32
HIF1A Q16665 1/20 0.32
HSD17B10 Q99714 1/20 0.32
GABRA1 P14867 1/20 0.31
GABRB2 P47870 1/20 0.31
ALOX15 P16050 1/20 0.30
ALOX12 P18054 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5017182 0.88 FABP3 (0.41) FABP3FABP4FABP5SMN1; SMN2SLC9A1
SCHEMBL2865462 0.82 FABP3 (0.37) FABP3FABP4FABP5SMN1; SMN2LMNA
SCHEMBL153927 0.79 HSD17B10 (0.35) FABP3FABP4FABP5LMNAHPGD
SCHEMBL2519857 0.78 CYP2D6 (0.48) HIF1AHSD17B10ALOX15
Ammonia Solution, Strong SCHEMBL23749119 0.77 CYP2D6 (0.47) SLC9A1HIF1AHSD17B10ALOX15
SCHEMBL10301260 0.77 FABP4 (0.36) FABP3FABP4FABP5
SCHEMBL28267313 0.76 FABP3 (0.33) FABP3FABP4FABP5
Formaldehyde SCHEMBL10789305 0.76 CYP2D6 (0.46) SLC9A1HIF1AHSD17B10ALOX15
SCHEMBL2863381 0.76 HSD17B10 (0.36) FABP3FABP4FABP5SMN1; SMN2LMNA
Ammonia Solution, Strong SCHEMBL27519326 0.76 FABP3 (0.35) FABP3FABP4FABP5

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 17 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-103503121-B Material for forming passivation film for semiconductor substrate, passivation film for semiconductor substrate and method for manufacturing same, and solar cell element and method for manufacturing same 日立化成株式会社 2017-04-12 CN disclosed
US-9406834-B2 Material for forming passivation film for semiconductor substrate, passivation film for semiconductor substrate and method of producing the same, and photovoltaic cell element and method of producing the same HITACHI CHEMICAL COMPANY, LTD. (JP) 2016-08-02 US disclosed
US-20140242741-A1 MATERIAL FOR FORMING PASSIVATION FILM FOR SEMICONDUCTOR SUBSTRATE, PASSIVATION FILM FOR SEMICONDUCTOR SUBSTRATE AND METHOD OF PRODUCING THE SAME, AND PHOTOVOLTAIC CELL ELEMENT AND METHOD OF PRODUCING THE SAME HITACHI CHEMICAL COMPANY, LTD. (JP) 2014-08-28 US disclosed
US-8748877-B2 Material for forming passivation film for semiconductor substrate, passivation film for semiconductor substrate and method of producing the same, and photovoltaic cell element and method of producing the same HITACHI CHEMICAL COMPANY, LTD. (JP) 2014-06-10 US disclosed
CN-103503121-A Material for forming passivation film for semiconductor substrate, passivation film for semiconductor substrate and method for manufacturing same, and solar cell element and method for manufacturing same HITACHI CHEMICAL CO LTD 2014-01-08 CN disclosed
US-20120313199-A1 MATERIAL FOR FORMING PASSIVATION FILM FOR SEMICONDUCTOR SUBSTRATE, PASSIVATION FILM FOR SEMICONDUCTOR SUBSTRATE AND METHOD OF PRODUCING THE SAME, AND PHOTOVOLTAIC CELL ELEMENT AND METHOD OF PRODUCING THE SAME HITACHI CHEMICAL COMPANY, LTD. 2012-12-13 US disclosed
US-7754844-B2 Polyarylene ether compound containing sulfonic acid group, composition containing same, and method for manufacturing those TOYO BOSEKI KABUSHIKI KAISHA (JP) 2010-07-13 US disclosed
EP-1561768-B1 POLYARYLENE ETHER COMPOUND CONTAINING SULFONIC ACID GROUP, COMPOSITION CONTAINING SAME, AND METHOD FOR MANUFACTURING THOSE TOYO BOSEKI (JP) 2009-09-30 EP disclosed
US-20080070086-A1 Phase-Separated Polymer Electrolyte Membrane, Electrode - Phase-Separated Polymer Electrolyte Membrane Joint Using Same, Method for Manufacture Thereof, and Fuel Cell Using Same HITACHI CHEMICAL COMPANY, LTD. (JP) 2008-03-20 US disclosed
EP-1845573-A1 PHASE SEPARATION TYPE POLYMER ELECTROLYTE FILM, ELECTRODE/PHASE SEPARATION TYPE POLYMER ELECTROLYTE FILM ASSEMBLY EMPLOYING THE SAME, PROCESSES FOR PRODUCING THE SAME, AND FUEL CELL EMPLOYING THE SAME Hitachi Chemical Co., Ltd. (JP) 2007-10-17 EP disclosed
CN-1292015-C Polyarylene ether compound containing sulfonic acid group, composition containing same, and method for manufacturing those TOYO BOSEKI (JP) 2006-12-27 CN disclosed
US-20060166048-A1 Polyarylene ether compound containing sulfonic acid group, composition containing same, and method for manufacturing those TOYO BOSEKI KABUSHIKI KAISHA (JP) 2006-07-27 US disclosed
CN-1703443-A Polyarylene ether compound containing sulfonic acid group, composition containing the same, and method for producing the same TOYO BOSEKI (JP) 2005-11-30 CN disclosed
EP-1561768-A1 POLYARYLENE ETHER COMPOUND CONTAINING SULFONIC ACID GROUP, COMPOSITION CONTAINING SAME, AND METHOD FOR MANUFACTURING THOSE Toyo Boseki Kabushiki Kaisha (JP) 2005-08-10 EP disclosed
US-5596128-A SULFONATION WITHOUT A CATALYST IN THE PRESENCE OF SOLVENT KONISHI CHEMICAL IND. CO., LTD. (JP) 1997-01-21 US disclosed
EP-0505582-B1 SULFONATING AGENT AND PROCESS KONISHI CHEM IND (JP) 1996-07-31 EP disclosed
EP-0505582-A1 SULFONATING AGENT AND PROCESS KONISHI CHEMICAL IND. CO., LTD. (JP) 1992-09-30 EP disclosed