SCHEMBL2943010

SCHEMBL2943010

CC(C)(O)CCCCCCC(C)(C)O

nearest known ligand 0.64

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 1/20 0.64
FFAR1 O14842 1/20 0.39
CPT2 P23786 1/20 0.39
TDP1 Q9NUW8 1/20 0.39
FDPS P14324 8/20 0.35
GGPS1 O95749 5/20 0.35
ACLY P53396 1/20 0.33
ACACB O00763 1/20 0.32
ACACA Q13085 1/20 0.32
SMPD1 P17405 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3040312 1.00 ALDH1A1 (0.64) ALDH1A1FFAR1CPT2TDP1FDPS
SCHEMBL2945318 1.00 ALDH1A1 (0.64) ALDH1A1FFAR1CPT2TDP1FDPS
SCHEMBL5915749 1.00 ALDH1A1 (0.64) ALDH1A1FFAR1CPT2TDP1FDPS
SCHEMBL1269985 0.96 ALDH1A1 (0.69) ALDH1A1FFAR1CPT2TDP1FDPS
SCHEMBL8898379 0.90 ALDH1A1 (0.53) ALDH1A1FFAR1CPT2TDP1FDPS
SCHEMBL17523914 0.90 ALDH1A1 (0.53) ALDH1A1FFAR1CPT2TDP1FDPS
SCHEMBL2818804 0.88 ALDH1A1 (0.69) ALDH1A1
SCHEMBL23877897 0.87 ALDH1A1 (0.50) ALDH1A1FFAR1CPT2TDP1FDPS
SCHEMBL2188894 0.87 FDPS (0.50) ALDH1A1FDPSGGPS1SMPD1
SCHEMBL21410066 0.87 ALDH1A1 (0.50) ALDH1A1FFAR1CPT2TDP1FDPS

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7736834-B2 Photosensitive resin composition, photosensitive element employing it, resist pattern forming method, process for manufacturing printed circuit board and method for removing photocured product HITACHI CHEMICAL COMPANY, LTD. (JP) 2010-06-15 US disclosed
CN-1842742-B Photosensitive resin composition, photosensitive element using same, method for forming resist pattern, method for producing printed wiring board, and method for removing photocured product HITACHI CHEMICAL CO LTD 2010-05-12 CN disclosed
US-20070111136-A1 Photosensitive resin composition, photosensitive element employing it, resist pattern forming method, process for manufacturing printed circuit board and method for removing photocured product HITACHI CHEMICAL COMPANY, LTD. (JP) 2007-05-17 US disclosed
CN-1842742-A Photosensitive resin composition, photosensitive element using same, method for forming resist pattern, method for producing printed wiring board, and method for removing photocured product HITACHI CHEMICAL CO LTD (JP) 2006-10-04 CN disclosed
US-20060068324-A1 Positive photosensitive resin and novel dithiol compound MARUZEN PETROCHEMICAL CO., LTD. (JP) 2006-03-30 US disclosed
US-6355702-B1 HEAT DECOMPOSITION OF ACRYLIC RESIN; CURING; CROSSLINKED NETWORK CORNELL RESEARCH FOUNDATION, INC. 2002-03-12 US disclosed