SCHEMBL2966472

SCHEMBL2966472

O=C1CCC(=O)N1OS(=O)(=O)CCl

nearest known ligand 0.46

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
PARL Q9H300 4/20 0.46
CA12 O43570 1/20 0.34
CA1 P00915 1/20 0.34
CA2 P00918 1/20 0.34
CA9 Q16790 1/20 0.34
HPGD P15428 1/20 0.30
SMN1; SMN2 Q16637 1/20 0.30
ALOX12 P18054 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL66132 0.83 PARL (0.43) PARLCA12CA1CA2CA9
SCHEMBL64833 0.80 PARL (0.47) PARLCA12CA1CA2CA9
SCHEMBL12907387 0.78 PARL (0.46) PARLCA12CA1CA2CA9
SCHEMBL65689 0.75 PARL (0.43) PARL
SCHEMBL28411329 0.74 PARL (0.54) PARLCA12CA1CA2CA9
SCHEMBL5213568 0.74 PARL (0.42) PARL
SCHEMBL2677308 0.72 PARL (0.41) PARLHPGDSMN1; SMN2ALOX12
SCHEMBL64006 0.71 PRKCA (0.40) PARLSMN1; SMN2
SCHEMBL8643347 0.71 PARL (0.40) PARLCA12CA1CA2CA9
SCHEMBL15019558 0.71 PARL (0.40) PARL

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 13 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6569596-B1 Photoresists comprising N-(ethylsulfonyloxy)succinimide, novolaks, curing agents and an acid generators such as alpha -(hexylsulfonyloxyimino)-4-methoxybenzyl cyanide; integrated circuits; semiconductors SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2003-05-27 US claimed
US-7759045-B2 Chemically amplified positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-07-20 US disclosed
US-20090004601-A1 Chemically amplified positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-01-01 US disclosed
CN-101334588-A Chemically amplified positive resist composition SUMITOMO CHEMICAL CO (JP) 2008-12-31 CN disclosed
US-6893794-B2 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2005-05-17 US disclosed
US-20040018445-A1 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2004-01-29 US disclosed
US-6569596-B1 Photoresists comprising N-(ethylsulfonyloxy)succinimide, novolaks, curing agents and an acid generators such as alpha -(hexylsulfonyloxyimino)-4-methoxybenzyl cyanide; integrated circuits; semiconductors SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2003-05-27 US disclosed
US-20030068573-A1 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2003-04-10 US disclosed
US-6156476-A Positive photoresist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2000-12-05 US disclosed
EP-0607899-B1 Positive photoresist composition SUMITOMO CHEMICAL CO (JP) 2000-06-14 EP disclosed
US-6068962-A NOVOLAK RESIN AS AN ALKALI-SOLUBLE COMPONENT; QUINONEDIAZIDE; ACID GENERATOR; ANTHRACENE DERIVATIVE SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2000-05-30 US disclosed
EP-0831371-A2 Positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 1998-03-25 EP disclosed
EP-0607899-A2 Positive photoresist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 1994-07-27 EP disclosed