SCHEMBL305299

SCHEMBL305299

C=C(C)C(=O)OC1C(=O)OCC1(C)C

nearest known ligand 0.71

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
CTSV O60911 1/20 0.36
CTSL P07711 1/20 0.36
CTSS P25774 1/20 0.36
CTSK P43235 1/20 0.36
AR P10275 3/20 0.34
ALDH1A1 P00352 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14666481 0.85 AR (0.34) CTSVCTSLCTSSCTSKAR
SCHEMBL10234882 0.85 CTSV (0.32) CTSVCTSLCTSSCTSKAR
SCHEMBL12652330 0.85 CTSV (0.32) CTSVCTSLCTSSCTSK
SCHEMBL685109 0.84 ALDH1A1 (0.37) CTSVCTSLCTSSCTSKAR
SCHEMBL8241182 0.83 CTSV (0.38) CTSVCTSLCTSSCTSKAR
SCHEMBL5063468 0.83 CTSV (0.38) CTSVCTSLCTSSCTSKAR
SCHEMBL5685473 0.83 CTSV (0.38) CTSVCTSLCTSSCTSKAR
SCHEMBL1697098 0.82 ALDH1A1 (0.35) CTSVCTSLCTSSCTSKALDH1A1
SCHEMBL12651228 0.82 CTSV (0.33) CTSVCTSLCTSSCTSKALDH1A1
SCHEMBL7558920 0.81 CTSV (0.41) CTSVCTSLCTSSCTSKAR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 390 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1433857-B1 PROCESS FOR PRODUCING MONOMER MITSUBISHI RAYON CO (JP) 2009-06-03 EP claimed
US-7125692-B2 Process for producing monomer MITSUBISHI RAYON CO., LTD. (JP) 2006-10-24 US claimed
US-20230400765-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN, AND ONIUM SALT COMPOUND JSR CORPORATION (JP) 2023-12-14 US disclosed
US-20230400765-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN, AND ONIUM SALT COMPOUND JSR CORPORATION (JP) 2023-12-14 US disclosed
WO-2023095561-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND PATTERN FORMATION METHOD JSR株式会社 2023-06-01 WO disclosed
US-20230106095-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING PATTERN JSR CORPORATION (JP) 2023-04-06 US disclosed
WO-2022186048-A1 RADIATION-SENSITIVE RESIN COMPOSITION, PATTERN FORMATION METHOD, POLYMER, AND COMPOUND JSR株式会社 2022-09-09 WO disclosed
WO-2021241246-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING PATTERN JSR株式会社 2021-12-02 WO disclosed
WO-2021140909-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING RESIST PATTERN JSR株式会社 2021-07-15 WO disclosed
EP-3253735-B1 LATENT ACIDS AND THEIR USE BASF SE (DE) 2021-03-31 EP disclosed
US-20200089116-A1 Fluorine-Containing Monomer, Fluorine-Containing Polymer, Pattern Forming Composition Using Same, and Pattern Forming Method of Same CENTRAL GLASS COMPANY, LIMITED (JP) 2020-03-19 US disclosed
US-20020009668-A1 Radiation-sensitive resin composition JSR CORPORATION (JP) 2002-01-24 US disclosed
EP-1164434-A2 Radiation-sensitive resin composition JSR Corporation (JP) 2001-12-19 EP disclosed
US-20010023050-A1 Radiation-sensitive resin composition JSR CORPORATION (JP) 2001-09-20 US disclosed
EP-1122605-A2 Radiation-sensitive resin composition JSR Corporation (JP) 2001-08-08 EP disclosed
US-6258895-B1 Polymers having spiro orthoester groups, process of manufacturing and using THE PROCTER & GAMBLE COMPANY 2001-07-10 US disclosed
US-6177228-B1 COMPRISING A RADIATION-SENSITIVE ACID GENERATOR AND A POLYMER COMPRISING THE REACTION PRODUCT OF A MONOMER SELECTED FROM METHACRYLATE OR ACRYLATE HAVING A PHOTOACID CLEAVABLE ESTER SUBSTITUENT AND AN UNSATURATED ESTER MONOMER INTERNATIONAL BUSINESS MACHINES CORPORATION 2001-01-23 US disclosed
US-6165678-A Lithographic photoresist composition and process for its use in the manufacture of integrated circuits INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2000-12-26 US disclosed
EP-0575667-B1 Process for the manufacture of polymers having spiro orthoester groups, the polymers obtained and their use PROCTER & GAMBLE (US) 2000-03-08 EP disclosed
EP-0575667-A1 Process for the manufacture of polymers having spiro orthoester groups, the polymers obtained and their use THE PROCTER & GAMBLE COMPANY (US) 1993-12-29 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20230400765-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN, AND ONIUM SALT COMPOUND RFT1, RER1, AFF1 CTSV 3772/4885CTSL 4476/4885CTSS 3526/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.