Acrylic Acid

Acrylic Acid

SCHEMBL315979

C=CC(=O)O.C=CC(=O)O.C=CC(=O)O.C=CC(=O)O.CC(CO)C(CO)(CO)CO

nearest known ligand 0.42

Full drug profile on Sugi Atlas →

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
LMNA P02545 1/20 0.42
ALOX15 P16050 1/20 0.33
HSD17B10 Q99714 1/20 0.33
TSHR P16473 3/20 0.32
ALDH1A1 P00352 2/20 0.31
TP53 P04637 1/20 0.31
CYP3A4 P08684 1/20 0.31
MAPK1 P28482 1/20 0.31
SMN1; SMN2 Q16637 1/20 0.31
HIF1A Q16665 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Acrylic Acid SCHEMBL29501168 1.00 LMNA (0.42) LMNAALOX15HSD17B10TSHRALDH1A1
Acrylic Acid SCHEMBL3093957 1.00 LMNA (0.42) LMNAALOX15HSD17B10TSHRALDH1A1
Acrylic Acid SCHEMBL8498515 0.89 ALDH1A1 (0.33) LMNAALDH1A1TP53CYP3A4MAPK1
Acrylic Acid SCHEMBL29735550 0.86 LMNA (0.40) LMNAALOX15HSD17B10TSHRALDH1A1
Acrylic Acid SCHEMBL29364248 0.84 LMNA (0.39) LMNAALOX15HSD17B10TSHRALDH1A1
Acrylic Acid SCHEMBL29477363 0.83 LMNA (0.46) LMNAALOX15HSD17B10TSHRALDH1A1
Acrylic Acid SCHEMBL29285058 0.83 LMNA (0.46) LMNAALOX15HSD17B10TSHRALDH1A1
Acrylic Acid SCHEMBL30404328 0.82 LMNA (0.37) LMNAALOX15HSD17B10TSHRALDH1A1
Acrylic Acid SCHEMBL9173428 0.81 ALDH1A1 (0.31) ALDH1A1
Methacrylic Acid SCHEMBL35549 0.79 TGFBR1 (0.37) TSHRALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 45 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-117779030-B Silicon crystal tank liquid and environment-friendly metal surface treatment process 开平和盟环保科技有限公司 2024-05-17 CN claimed
CN-111145935-B Silver electrode slurry and preparation method and application thereof 中国人民解放军国防科技大学 2022-07-15 CN claimed
EP-0283990-B1 A heat-resistant photosensitive resin composition TOKYO OHKA KOGYO CO LTD (JP) 1994-01-26 EP claimed
US-20260104641-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING PROCESS METHOD FOR FORMING CURED FILM, INTERLAYER INSULATING FILM, SURFACE PROTECTIVE FILM, AND ELECTRONIC COMPONENT SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-04-16 US disclosed
EP-4660704-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING PROCESS, METHOD FOR FORMING CURED FILM, INTERLAYER INSULATING FILM, SURFACE PROTECTIVE FILM, AND ELECTRONIC COMPONENT Shin-Etsu Chemical Co., Ltd. (JP) 2025-12-10 EP disclosed
US-20250355350-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING PROCESS, METHOD FOR FORMING CURED COATING, INTERLAYER INSULATING FILM, SURFACE PROTECTING FILM, AND ELECTRONIC COMPONENT SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-11-20 US disclosed
EP-4650874-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING PROCESS, METHOD FOR FORMING CURED COATING, INTERLAYER INSULATING FILM, SURFACE PROTECTING FILM, AND ELECTRONIC COMPONENT SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-11-19 EP disclosed
EP-4636011-A1 POLYMER, NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING PROCESS, METHOD FOR FORMING CURED FILM, INTERLAYER INSULATING FILM, SURFACE PROTECTIVE FILM, AND ELECTRONIC COMPONENT SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-10-22 EP disclosed
EP-4636485-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING PROCESS, METHOD FOR FORMING CURED FILM, INTERLAYER INSULATING FILM, SURFACE PROTECTIVE FILM, AND ELECTRONIC COMPONENT Shin-Etsu Chemical Co., Ltd. (JP) 2025-10-22 EP disclosed
US-12393130-B2 Electrophotographic photosensitive member, process cartridge, and electrophotographic apparatus CANON KABUSHIKI KAISHA (JP) 2025-08-19 US disclosed
EP-3936576-B1 BLACK ALUMINUM PIGMENT AND METHOD OF PRODUCING SAME TOYO ALUMINIUM KK (JP) 2025-05-28 EP disclosed
CN-114174351-A Resin composition 日产化学株式会社 2022-03-11 CN disclosed
US-10816900-B2 Tetracarboxylic acid diester compound, polymer of polyimide precursor and method for producing same, negative photosensitive resin composition, patterning process, and method for forming cured film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2020-10-27 US disclosed
US-10203601-B2 Tetracarboxylic acid diester compound, polymer of polyimide precursor and method for producing same, negative photosensitive resin composition, patterning process, and method for forming cured film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2019-02-12 US disclosed
US-20190018320-A1 TETRACARBOXYLIC ACID DIESTER COMPOUND, POLYMER OF POLYIMIDE PRECURSOR AND METHOD FOR PRODUCING SAME, NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING PROCESS, AND METHOD FOR FORMING CURED FILM SHIN-ETSU CHEMICAL CO., LTD. (JP) 2019-01-17 US disclosed
US-20180120702-A1 TETRACARBOXYLIC ACID DIESTER COMPOUND, POLYMER OF POLYIMIDE PRECURSOR AND METHOD FOR PRODUCING SAME, NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING PROCESS, AND METHOD FOR FORMING CURED FILM SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-05-03 US disclosed
EP-1901331-B1 Plasma display panel SAMSUNG SDI CO LTD (KR) 2012-10-03 EP disclosed
US-8093814-B2 Electrode-forming composition and plasma display panel manufactured using the same SAMSUNG SDI CO., LTD. (KR) 2012-01-10 US disclosed
US-20080067938-A1 ELECTRODE-FORMING COMPOSITION AND PLASMA DISPLAY PANEL MANUFACTURED USING THE SAME SAMSUNG SDI CO., LTD. (KR) 2008-03-20 US disclosed
EP-1901331-A2 Electrode-Forming Composition and Plasma Display Panel Manufactured Using the Same Samsung SDI Co., Ltd. (KR) 2008-03-19 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (5 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20260104641-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING PROCESS METHOD FOR FORMING CURED FILM, INTERLAYER INSULATING FILM, SURFACE PROTECTIVE FILM, AND ELECTRONIC COMPONENT ARCN1, PRDM9, LBR LMNA 1788/4885ALOX15 2767/4885HSD17B10 4284/4885
US-20190018320-A1 TETRACARBOXYLIC ACID DIESTER COMPOUND, POLYMER OF POLYIMIDE PRECURSOR AND METHOD FOR PRODUCING SAME, NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING PROCESS, AND METHOD FOR FORMING CURED FILM TET1, KDM2B, ARCN1 LMNA 1385/4885ALOX15 1940/4885HSD17B10 4077/4885
US-10816900-B2 Tetracarboxylic acid diester compound, polymer of polyimide precursor and method for producing same, negative photosensitive resin composition, patterning process, and method for forming cured film TET1, KDM2B, ARCN1 LMNA 1385/4885ALOX15 1940/4885HSD17B10 4077/4885
US-20180120702-A1 TETRACARBOXYLIC ACID DIESTER COMPOUND, POLYMER OF POLYIMIDE PRECURSOR AND METHOD FOR PRODUCING SAME, NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING PROCESS, AND METHOD FOR FORMING CURED FILM TET1, KDM1A, KDM2B LMNA 1696/4885ALOX15 1533/4885HSD17B10 3719/4885
US-10203601-B2 Tetracarboxylic acid diester compound, polymer of polyimide precursor and method for producing same, negative photosensitive resin composition, patterning process, and method for forming cured film TET1, KDM1A, KDM2B LMNA 1696/4885ALOX15 1533/4885HSD17B10 3719/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.