SCHEMBL329329

SCHEMBL329329

c1ccc(O[Si](C[Si](Oc2ccccc2)(Oc2ccccc2)Oc2ccccc2)(Oc2ccccc2)Oc2ccccc2)cc1

nearest known ligand 0.43

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
LTA4H P09960 3/20 0.43
TSHR P16473 1/20 0.43
KCNA3 P22001 1/20 0.42
CA5A P35218 1/20 0.40
CA5B Q9Y2D0 1/20 0.40
CA4 P22748 1/20 0.39
KCNH2 Q12809 1/20 0.38
ALDH1A1 P00352 2/20 0.37
TAAR1 Q96RJ0 1/20 0.37
RECQL P46063 1/20 0.37
ALOX15 P16050 1/20 0.36
BCAT2 O15382 1/20 0.35
HAO1 Q9UJM8 1/20 0.35
NPC1 O15118 1/20 0.34
RAB9A P51151 1/20 0.34
SMN1; SMN2 Q16637 1/20 0.34
HTT P42858 1/20 0.34
LOXL2 Q9Y4K0 1/20 0.34
HDAC3 O15379 1/20 0.33
HDAC4 P56524 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL329176 0.83 LTA4H (0.43) LTA4HTSHRKCNA3CA5ACA5B
SCHEMBL431273 0.79 CA4 (0.42) LTA4HTSHRKCNA3CA5ACA5B
SCHEMBL706489 0.79 KCNA3 (0.44) LTA4HTSHRKCNA3CA5ACA5B
SCHEMBL6696698 0.79 TAAR1 (0.44) LTA4HTSHRKCNA3CA5ACA5B
SCHEMBL329378 0.79 KCNA3 (0.44) LTA4HTSHRKCNA3CA5ACA5B
SCHEMBL3915000 0.79 LTA4H (0.39) LTA4HTSHRKCNA3CA5ACA5B
SCHEMBL3916371 0.79 LTA4H (0.39) LTA4HTSHRKCNA3CA5ACA5B
SCHEMBL9323575 0.79 HDAC3 (0.40) LTA4HTSHRKCNA3CA5ACA5B
SCHEMBL19205509 0.77 LTA4H (0.38) LTA4HTSHRKCNA3CA5ACA5B
SCHEMBL3338614 0.77 TSHR (0.39) LTA4HTSHRKCNA3CA5ACA5B

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 77 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11781037-B2 High-durability antifogging coating film and coating composition ASAHI KASEI KABUSHIKI KAISHA (JP) 2023-10-10 US disclosed
CN-111684030-B High-durability antifogging coating film and coating composition 旭化成株式会社 2022-11-01 CN disclosed
CN-108699392-B High-durability antifogging coating film and coating composition 旭化成株式会社 2021-11-23 CN disclosed
US-11041076-B2 Highly durable antifogging coating film and coating composition ASAHI KASEI KABUSHIKI KAISHA (JP) 2021-06-22 US disclosed
US-20210079256-A1 HIGH-DURABILITY ANTIFOGGING COATING FILM AND COATING COMPOSITION ASAHI KASEI KABUSHIKI KAISHA (JP) 2021-03-18 US disclosed
EP-3431561-B1 HIGHLY DURABLE ANTIFOGGING COATING FILM AND COATING COMPOSITION ASAHI CHEMICAL IND (JP) 2020-12-30 EP disclosed
EP-3757181-A1 HIGH-DURABILITY ANTIFOGGING COATING FILM AND COATING COMPOSITION Asahi Kasei Kabushiki Kaisha (JP) 2020-12-30 EP disclosed
CN-111684030-A High-durability antifogging coating film and coating composition 旭化成株式会社 2020-09-18 CN disclosed
US-10474032-B2 Coating compositions ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2019-11-12 US disclosed
WO-2019163918-A1 HIGH-DURABILITY ANTIFOGGING COATING FILM AND COATING COMPOSITION 旭化成株式会社 2019-08-29 WO disclosed
EP-1561841-A2 Cleaning CVD Chambers following deposition of porogen-containing materials AIR PRODUCTS AND CHEMICALS, INC. (US) 2005-08-10 EP disclosed
CN-1651159-A Cleaning CVD chambers following deposition of porogen-containing materials AIR PROD & CHEM (US) 2005-08-10 CN disclosed
US-20050161060-A1 Cleaning CVD chambers following deposition of porogen-containing materials AIR PRODUCTS AND CHEMICALS, INC. 2005-07-28 US disclosed
US-20050089642-A1 Dielectric materials preparation ROHM AND HAAS ELECTRONIC MATERIALS, L.L.C. (US) 2005-04-28 US disclosed
US-6787191-B2 Coating composition for the production of insulating thin films ASAHI KASEI KABUSHIKI KAISHA (JP) 2004-09-07 US disclosed
US-20040109950-A1 Dielectric materials SHIPLEY COMPANY, L.L.C. 2004-06-10 US disclosed
US-20040077757-A1 Coating composition for use in producing an insulating thin film ASAHI KASEI KABUSHIKI KAISHA (JP) 2004-04-22 US disclosed
US-20040048960-A1 Compositions for preparing low dielectric materials AIR PRODUCTS AND CHEMICALS, INC. 2004-03-11 US disclosed
EP-1376671-A1 Compositions for preparing materials with a low dielectric constant AIR PRODUCTS AND CHEMICALS, INC. (US) 2004-01-02 EP disclosed
US-20030099844-A1 Coating composition for the production of insulating thin films ASAHI KASEI KABUSHIKI KAISHA (JP) 2003-05-29 US disclosed