SCHEMBL3341213

SCHEMBL3341213

[O-][S+](c1cc(Cl)c(O)cc1O)c1cc(Cl)c(O)cc1O

nearest known ligand 0.46

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
TSHR P16473 5/20 0.46
HSD17B10 Q99714 5/20 0.46
HPGD P15428 3/20 0.46
HSP90AA1 P07900 10/20 0.37
CYP3A4 P08684 2/20 0.36
ALDH1A1 P00352 2/20 0.36
TDP1 Q9NUW8 1/20 0.36
CA1 P00915 1/20 0.33
CA2 P00918 1/20 0.33
ADRA1A P35348 1/20 0.31
HSP90AB1 P08238 1/20 0.31
ESR2 Q92731 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30678712 1.00 TSHR (0.46) TSHRHSD17B10HPGDHSP90AA1CYP3A4
SCHEMBL29001612 0.80 ALDH1A1 (0.31) TSHRHSD17B10HPGDALDH1A1TDP1
SCHEMBL30402191 0.80 ALDH1A1 (0.31) TSHRHSD17B10HPGDALDH1A1TDP1
SCHEMBL10538198 0.77 HSD17B10 (0.48) TSHRHSD17B10HPGDHSP90AA1CYP3A4
SCHEMBL69259 0.73 HSD17B10 (0.80) TSHRHSD17B10HPGDHSP90AA1CYP3A4
SCHEMBL5372785 0.71 HSD17B10 (0.40) TSHRHSD17B10HPGDHSP90AA1CYP3A4
SCHEMBL29904874 0.71 HSD17B10 (0.40) TSHRHSD17B10HPGDHSP90AA1CYP3A4
SCHEMBL592892 0.70 HSD17B10 (0.75) TSHRHSD17B10HPGDHSP90AA1CYP3A4
SCHEMBL12786119 0.70 HSD17B10 (0.50) TSHRHSD17B10HPGDHSP90AA1CYP3A4
SCHEMBL10539835 0.70 HSD17B10 (0.50) TSHRHSD17B10HPGDHSP90AA1CYP3A4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 49 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20240213072-A1 LAMINATE, RELEASE AGENT COMPOSITION, AND METHOD FOR MANUFACTURING PROCESSED SEMICONDUCTOR SUBSTRATE NISSAN CHEMICAL CORPORATION (JP) 2024-06-27 US disclosed
EP-4310157-A1 LAMINATE, RELEASE AGENT COMPOSITION, AND METHOD FOR MANUFACTURING MACHINED SEMICONDUCTOR SUBSTRATE Nissan Chemical Corporation (JP) 2024-01-24 EP disclosed
EP-4309893-A1 LAMINATE, RELEASE AGENT COMPOSITION, AND METHOD FOR PRODUCING PROCESSED SEMICONDUCTOR SUBSTRATE Nissan Chemical Corporation (JP) 2024-01-24 EP disclosed
WO-2022210262-A1 LAMINATE, RELEASE AGENT COMPOSITION, AND METHOD FOR PRODUCING PROCESSED SEMICONDUCTOR SUBSTRATE 日産化学株式会社 2022-10-06 WO disclosed
US-10607876-B2 Method for processing mold material and method for manufacturing structural body TOKYO OHKA KOGYO CO., LTD. (JP) 2020-03-31 US disclosed
US-10112377-B2 Supporting member separation method and supporting member separation apparatus TOKYO OHKA KOGYO CO., LTD. (JP) 2018-10-30 US disclosed
EP-2133366-B1 FINE FIBROUS CELLULOSE MATERIAL AND METHOD FOR PRODUCING THE SAME AIST (JP) 2018-02-21 EP disclosed
US-9837298-B2 Method for manufacturing laminate, method for manufacturing sealed substrate laminate, sealed substrate laminate, and sealed substrate TOKYO OHKA KOGYO CO., LTD. (JP) 2017-12-05 US disclosed
EP-2757136-B1 METHOD USING AN ADHESIVE COMPOSITION FOR BONDING WAFER AND SUPPORTING BODY FOR SAID WAFER TOKYO OHKA KOGYO CO LTD (JP) 2017-11-01 EP disclosed
US-9682532-B2 Laminated body and method for separating laminated body TOKYO OHKA KOGYO CO., LTD. (JP) 2017-06-20 US disclosed
US-20010044080-A1 Method for forming a finely patterned photoresist layer TOKYO OHKA KOGYO CO., LTD. (JP) 2001-11-22 US disclosed
US-6284428-B1 FOR FORMING OF ANTIREFLECTION UNDERCOATING LAYER TO INTERVENE BETWEEN SURFACE OF SUBSTRATE AND PHOTORESIST LAYER TO BE PATTERNED IN MANUFACTURING PROCESS OF SEMICONDUCTOR DEVICES TOKYO OHKA KOGYO CO., LTD, (JP) 2001-09-04 US disclosed
US-20010018163-A1 Undercoating composition for photolithographic resist TOKYO OHKA KOGYO CO., LTD. (JP) 2001-08-30 US disclosed
US-6268108-B1 MIXTURE OF COMPOUND FORMING ACID UPON EXPOSURE OF ACTINIC RADIATION, COMPOUND CAPABLE OF CROSSLINKING, DYE AND SOLVENT TOKYO OHKA KOGYO CO., LTD. (JP) 2001-07-31 US disclosed
US-6083665-A Photoresist laminate and method for patterning using the same TOKYO OHKA KOGYO CO., LTD. (JP) 2000-07-04 US disclosed
US-6071673-A Method for the formation of resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2000-06-06 US disclosed
US-5948847-A ACRYLATED ESTER CROSSLINKED WITH NITROGEN CONTAINING ORGANIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 1999-09-07 US disclosed
US-5925495-A Photoresist laminate and method for patterning using the same TOKYO OHKA KOGYO CO., LTD. (JP) 1999-07-20 US disclosed
US-5908738-A Undercoating composition for photolithography TOKYO OHKA KOGYO CO., LTD. (JP) 1999-06-01 US disclosed
US-5756255-A Undercoating composition for photolithography TOKYO OHKA KOGYO CO., LTD. (JP) 1998-05-26 US disclosed