SCHEMBL3433162

SCHEMBL3433162

Cc1cc(=O)oc2c(C)c(O)ccc12.O=C(O)CNCC(=O)O

nearest known ligand 0.74

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
MAOB P27338 8/20 0.74
KDM4E B2RXH2 4/20 0.57
GAA P10253 3/20 0.57
ALDH1A1 P00352 2/20 0.57
LMNA P02545 2/20 0.57
MAPK1 P28482 2/20 0.57
MGAM O43451 1/20 0.57
TP53 P04637 1/20 0.57
CYP3A4 P08684 1/20 0.57
MAPT P10636 1/20 0.57
SI P14410 1/20 0.57
ALOX15 P16050 1/20 0.57
MCL1 Q07820 1/20 0.57
MGAM2 Q2M2H8 1/20 0.57
ERN1 O75460 1/20 0.57
MAOA P21397 7/20 0.55
GLA P06280 2/20 0.55
HPGD P15428 2/20 0.55
HSD17B10 Q99714 2/20 0.55
GFER P55789 1/20 0.55

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4187220 0.86 MAOB (1.00) MAOBKDM4EGAAALDH1A1LMNA
SCHEMBL4924395 0.76 MAOB (0.52) MAOBKDM4EGAAALDH1A1LMNA
SCHEMBL5345045 0.75 MAOB (0.77) MAOBKDM4EGAAALDH1A1LMNA
SCHEMBL6109279 0.75 KDM4E (0.77) MAOBKDM4EGAAALDH1A1LMNA
SCHEMBL31454902 0.75 MAOB (0.67) MAOBKDM4EGAAALDH1A1LMNA
4-Methyldaphnetin SCHEMBL1065373 0.74 MCL1 (1.00) MAOBKDM4EGAAALDH1A1LMNA
4-Methyldaphnetin SCHEMBL29671915 0.74 MCL1 (1.00) MAOBKDM4EGAAALDH1A1LMNA
SCHEMBL27603485 0.73 MAOB (0.64) MAOBKDM4EGAAALDH1A1LMNA
SCHEMBL14398970 0.73 ERN1 (1.00) MAOBKDM4EGAAALDH1A1LMNA
SCHEMBL109411 0.73 ALDH1A1 (0.72) MAOBKDM4EGAAALDH1A1LMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 18 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8278219-B2 Method for purifying chemical added with chelating agent NOMURA MICRO SCIENCE CO., LTD. (JP) 2012-10-02 US disclosed
US-20100078589-A1 METHOD FOR PURIFYING CHEMICAL ADDED WITH CHELATING AGENT NOMURA MICRO SCIENCE CO., LTD. 2010-04-01 US disclosed
EP-2100666-A1 METHOD FOR PURIFYING CHEMICAL ADDED WITH CHELATING AGENT Nomura Micro Science Co., Ltd. (JP) 2009-09-16 EP disclosed
US-7201871-B2 Specimen having capability of separating solid component ARKRAY INC. (JP) 2007-04-10 US disclosed
US-7189576-B2 Method for measuring substance and testing piece ARKRAY INC. (JP) 2007-03-13 US disclosed
US-7153696-B2 Method for measuring substance and testing piece ARKRAY INC. (JP) 2006-12-26 US disclosed
US-7098038-B2 Method for measuring substance and testing piece ARKRAY INC. (JP) 2006-08-29 US disclosed
EP-0860695-B1 Method for measuring an analyte and corresponding device ARKRAY INC (JP) 2006-01-04 EP disclosed
US-6777243-B2 MEASURING DETECTABLE SUBSTANCE BY USING AQUEOUS REACTION SYSTEM INCLUDING FORMATION REACTION OF DETECTABLE SUBSTANCE BASED ON CHEMICAL REACTION OF ANALYTE CONTAINED IN SAMPLE; REACTING IN PRESENCE OF LAYERED INORGANIC COMPOUND ARKRAY INC. (JP) 2004-08-17 US disclosed
US-20030203503-A1 Method for measuring substance and testing piece FUKUOKA TAKAO (JP) 2003-10-30 US disclosed
US-20030180183-A1 Method for measuring substance and testing piece FUKUOKA TAKAO (JP) 2003-09-25 US disclosed
US-20030175985-A1 Method for measuring substance and testing piece FUKUOKA TAKAO (JP) 2003-09-18 US disclosed
US-20030175984-A1 Method for measuring substance and testing piece FUKUOKA TAKAO (JP) 2003-09-18 US disclosed
US-20030166295-A1 Method for measuring substance and testing piece FUKUOKA TAKAO (JP) 2003-09-04 US disclosed
US-20030044316-A1 Specimen having capability of separating solid component ARKRAY INC. (JP) 2003-03-06 US disclosed
EP-1271143-A1 SPECIMEN HAVING CAPABILITY OF SEPARATING SOLID COMPONENT ARKRAY, Inc. (JP) 2003-01-02 EP disclosed
EP-0860695-A9 METHOD OF MEASUREMENT OF MATERIAL AND TESTPIECE KABUSHIKI KAISHA KYOTO DAIICHI KAGAKU (JP) 2001-10-17 EP disclosed
EP-0860695-A1 METHOD OF MEASUREMENT OF MATERIAL AND TESTPIECE KABUSHIKI KAISHA KYOTO DAIICHI KAGAKU (JP) 1998-08-26 EP disclosed