SCHEMBL3451003

SCHEMBL3451003

C=C(C(=O)OC(C)OCC)C(F)(F)F

nearest known ligand 0.38

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
LMNA P02545 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL23200420 0.81 TP53 (0.31)
SCHEMBL26111852 0.79 LMNA (0.42) LMNA
SCHEMBL20597633 0.79
SCHEMBL23161023 0.79 LMNA (0.46) LMNA
SCHEMBL3388540 0.78 LMNA (0.55) LMNA
SCHEMBL2776589 0.78 TSHR (0.31)
SCHEMBL36100 0.77 TSHR (0.45) LMNA
SCHEMBL8397022 0.77 LMNA (0.44) LMNA
SCHEMBL1958622 0.77 TSHR (0.39) LMNA
SCHEMBL5011169 0.76 FAAH (0.40)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8030419-B2 Process for producing polymer for semiconductor lithography MARUZEN PETROCHEMICAL CO., LTD. (JP) 2011-10-04 US disclosed
US-8030419-B2 Process for producing polymer for semiconductor lithography MARUZEN PETROCHEMICAL CO., LTD. (JP) 2011-10-04 US disclosed
US-7820369-B2 Method for patterning a low activation energy photoresist INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-10-26 US disclosed
US-20100048848-A1 PROCESS FOR PRODUCING POLYMER FOR SEMICONDUCTOR LITHOGRAPHY MARUZEN PETROCHEMICAL CO., LTD. (JP) 2010-02-25 US disclosed
US-20100048848-A1 PROCESS FOR PRODUCING POLYMER FOR SEMICONDUCTOR LITHOGRAPHY MARUZEN PETROCHEMICAL CO., LTD. (JP) 2010-02-25 US disclosed
US-7193023-B2 Low activation energy photoresists INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2007-03-20 US disclosed
US-20050123852-A1 Method for patterning a low activation energy photoresist GLOBALFOUNDRIES U.S. INC. 2005-06-09 US disclosed
US-20050124774-A1 Low activation energy photoresists INTERNATIONAL BUSINESS MACHINES CORPORATION 2005-06-09 US disclosed