SCHEMBL3654003

SCHEMBL3654003

O=C(CCCCCc1ccc(O)c(O)c1O)CCCCCc1ccc(O)c(O)c1O

nearest known ligand 0.62

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
▸ IAPP P10997 3/20 0.49
▸ TYR P14679 1/20 0.46

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3657566 1.00 IAPP (0.49) IAPPTYR
SCHEMBL31676616 1.00 IAPP (0.49) IAPPTYR
SCHEMBL272405 0.80 TYR (0.48) TYR
SCHEMBL29131809 0.79 IAPP (0.58) IAPPTYR
SCHEMBL10608049 0.77 TYR (0.73) TYR
SCHEMBL10607947 0.77 TYR (0.73) TYR
SCHEMBL10608016 0.77 TYR (0.73) TYR
SCHEMBL6436060 0.77 TYR (0.73) TYR
SCHEMBL3654000 0.76 TYR (0.45) TYR
SCHEMBL7855812 0.76 TYR (0.64) TYR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 83 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2203783-A2 THICK FILM RESISTS AZ Electronic Materials USA Corp. (US) 2010-07-07 — — EP claimed
WO-2009040661-A2 THICK FILM RESISTS AZ ELECTRONIC MATERIALS USA CORP. (DE) 2009-04-02 — — WO claimed
US-20090081589-A1 THICK FILM RESISTS MERCK PATENT GMBH (DE) 2009-03-26 — — US claimed
EP-4702010-A1 PHOTOACTIVE COMPOUNDS Merck Patent GmbH (DE) 2026-03-04 — — EP disclosed
US-20250376552-A1 RESIN COMPOSITION, CURED SUBSTANCE, LAMINATE, MANUFACTURING METHOD FOR CURED SUBSTANCE, MANUFACTURING METHOD FOR LAMINATE, MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM CORP (JP) 2025-12-11 — — US disclosed
EP-4597225-A1 FILM PRODUCTION METHOD, PHOTOSENSITIVE RESIN COMPOSITION, CURED PRODUCT PRODUCTION METHOD, CURED PRODUCT, AND LAMINATE FUJIFILM Corporation (JP) 2025-08-06 — — EP disclosed
EP-4596608-A1 RESIN COMPOSITION, CURED PRODUCT, LAMINATE, METHOD FOR PRODUCING CURED PRODUCT, METHOD FOR PRODUCING LAMINATE, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM Corporation (JP) 2025-08-06 — — EP disclosed
EP-4596607-A1 RESIN COMPOSITION, CURED OBJECT, LAYERED PRODUCT, METHOD FOR PRODUCING CURED OBJECT, METHOD FOR PRODUCING LAYERED PRODUCT, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM Corporation (JP) 2025-08-06 — — EP disclosed
US-20250236697-A1 RESIN COMPOSITION, CURED SUBSTANCE, LAMINATE, MANUFACTURING METHOD FOR CURED SUBSTANCE, MANUFACTURING METHOD FOR LAMINATE, MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2025-07-24 — — US disclosed
US-20250230283-A1 RESIN COMPOSITION, CURED SUBSTANCE, LAMINATE, MANUFACTURING METHOD FOR CURED SUBSTANCE, MANUFACTURING METHOD FOR LAMINATE, MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2025-07-17 — — US disclosed
WO-2024223739-A1 PHOTOACTIVE COMPOUNDS MERCK PATENT GMBH (DE) 2024-10-31 — — WO disclosed
EP-0677789-A1 Positive photoresist composition Fuji Photo Film Co., Ltd. (JP) 1995-10-18 — — EP disclosed
EP-0658807-A1 Positive-working photoresist composition FUJI PHOTO FILM CO., LTD. (JP) 1995-06-21 — — EP disclosed
US-5360692-A Positive type 1,2-naphthoquinonediazide photoresist composition containing benzotriazole light absorbing agent FUJI PHOTO FILM CO., LTD. (JP) 1994-11-01 — — US disclosed
US-5340688-A Containing mixture of 1,2-naphthoquinonediazidosulfonate esters of polyhydroxy compounds and alkali soluble resin FUJI PHOTO FILM CO., LTD. (JP) 1994-08-23 — — US disclosed
US-5324619-A Sensitivity, resolution, heat resistance, developability FUJI PHOTO FILM CO., LTD. (JP) 1994-06-28 — — US disclosed
US-5324618-A Provides pattern having high sensitivity, excellent resolution, developability and heat resistance FUJI PHOTO FILM CO., LTD. (JP) 1994-06-28 — — US disclosed
US-5318875-A Resolution; heat resistance; photosensitivity; developability; integrated circuits; semiconductors FUJI PHOTO FILM CO., LTD. (JP) 1994-06-07 — — US disclosed
EP-0555861-A1 Positive photoresist composition FUJI PHOTO FILM CO., LTD. (JP) 1993-08-18 — — EP disclosed
EP-0445819-A2 Positive type photoresist composition FUJI PHOTO FILM CO., LTD. (JP) 1991-09-11 — — EP disclosed
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