SCHEMBL384178

SCHEMBL384178

O=S(=O)(O)C(F)(F)Cc1cccc2ccccc12

nearest known ligand 0.46

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
TDP1 Q9NUW8 1/20 0.46
CA2 P00918 2/20 0.45
ACP3 P15309 1/20 0.45
NQO2 P16083 1/20 0.43
CYP1A2 P05177 3/20 0.42
CYP2C19 P33261 2/20 0.42
KDM4E B2RXH2 1/20 0.42
CYP2C9 P11712 1/20 0.42
KMT2A Q03164 3/20 0.40
MEN1 O00255 2/20 0.40
MTNR1A P48039 1/20 0.40
CTNNB1 P35222 1/20 0.40
CYP2D6 P10635 1/20 0.40
NPY1R P25929 1/20 0.39
NPY5R Q15761 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30355311 1.00 TDP1 (0.46) TDP1CA2ACP3NQO2CYP1A2
SCHEMBL974523 0.98 TDP1 (0.45) TDP1CA2ACP3NQO2CYP1A2
SCHEMBL973166 0.90 CDYL (0.43) TDP1CA2ACP3NQO2CYP1A2
SCHEMBL973165 0.90 CDYL (0.43) TDP1CA2ACP3NQO2CYP1A2
SCHEMBL12308106 0.87 KDM4E (0.39) TDP1CA2ACP3NQO2CYP1A2
SCHEMBL12039318 0.85 NQO2 (0.49) TDP1CA2ACP3NQO2CYP1A2
SCHEMBL17491049 0.84 NQO2 (0.44) TDP1CA2ACP3NQO2CYP1A2
SCHEMBL14111166 0.84 TDP1 (0.44) TDP1CA2ACP3NQO2CYP1A2
SCHEMBL974521 0.82 CA2 (0.44) TDP1CA2ACP3NQO2CYP1A2
SCHEMBL29058341 0.82 MEN1 (0.42) CA2NQO2KMT2AMEN1CYP2D6

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 370 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11884839-B2 Acetal-protected silanol group-containing polysiloxane composition NISSAN CHEMICAL CORPORATION (JP) 2024-01-30 US disclosed
US-20230125270-A1 RADIATION SENSITIVE COMPOSITION NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2023-04-27 US disclosed
CN-111440104-B Novel onium salt, chemically amplified resist composition, and pattern forming method 信越化学工业株式会社 2023-03-24 CN disclosed
US-11561472-B2 Radiation sensitive composition NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2023-01-24 US disclosed
EP-3309614-B1 RADIATION SENSITIVE COMPOSITION NISSAN CHEMICAL CORP (JP) 2021-11-10 EP disclosed
CN-109563371-B Polysiloxane composition comprising acetal-protected silanol groups 日产化学株式会社 2021-09-21 CN disclosed
CN-111793054-A Sulfonium compound, chemically amplified resist composition, and pattern forming method 信越化学工业株式会社 2020-10-20 CN disclosed
CN-111440104-A Novel onium salt, chemically amplified resist composition, and pattern forming method 信越化学工业株式会社 2020-07-24 CN disclosed
US-10705428-B2 Organic processing liquid for patterning chemical amplification resist film, container for organic processing liquid for patterning chemical amplification resist film, and pattern forming method, method of manufacturing electronic device, and electronic device using the same FUJIFILM CORPORATION (JP) 2020-07-07 US disclosed
US-20190196328-A1 PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE COMPOSITION FUJIFILM CORPORATION (JP) 2019-06-27 US disclosed
US-20070099114-A1 Polymer, resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-05-03 US disclosed
US-20070099113-A1 Novel sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-05-03 US disclosed
EP-1780199-A1 Novel fluorohydroxyalkyl sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2007-05-02 EP disclosed
EP-1780198-A1 Novel fluorosulfonyloxyalkyl sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2007-05-02 EP disclosed
US-20070087287-A1 Amine compound, chemically amplified resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2007-04-19 US disclosed
US-20060234153-A1 Radiation-sensitive resin composition JSR CORPORATION (JP) 2006-10-19 US disclosed
US-20060228648-A1 Novel sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2006-10-12 US disclosed
EP-1710230-A1 Novel sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2006-10-11 EP disclosed
CN-1708728-A Radiation-sensitive resin composition JSR CORP (JP) 2005-12-14 CN disclosed
EP-1557718-A1 RADIATION-SENSITIVE RESIN COMPOSITION JSR Corporation (JP) 2005-07-27 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-11561472-B2 Radiation sensitive composition RER1, RAD1, RAD51 TDP1 835/4885CA2 2513/4885ACP3 2986/4885
US-20230125270-A1 RADIATION SENSITIVE COMPOSITION XRCC6, RAD50, XRCC5 TDP1 1157/4885CA2 4815/4885ACP3 2819/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.