SCHEMBL394202

SCHEMBL394202

COCN(OC)C(=O)N(OC)OC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL8647229 0.79
SCHEMBL9014288 0.78
SCHEMBL17979634 0.73 ALDH1A1 (0.35)
SCHEMBL197051 0.66 TSHR (0.32)
SCHEMBL8578958 0.66 ALDH1A1 (0.35)
SCHEMBL5162219 0.66 MEN1 (0.33)
SCHEMBL11597634 0.64 MEN1 (0.32)
SCHEMBL9074850 0.63
SCHEMBL9972956 0.60 CA12 (0.31)
SCHEMBL9075821 0.60 ALDH1A1 (0.30)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 916 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2024036679-A1 ANTI-REFLECTIVE COATING COMPOSITION 嘉庚创新实验室 2024-02-22 WO claimed
US-20230350293-A1 I-LINE NEGATIVE PHOTORESIST COMPOSITION FOR REDUCING HEIGHT DIFFERENCE BETWEEN CENTER AND EDGE AND REDUCING LER, AND I-LINE NEGATIVE PHOTORESIST COMPOSITION FOR IMPROVING PROCESS MARGIN YOUNG CHANG CHEMICAL CO., LTD (KR) 2023-11-02 US claimed
EP-4220301-A1 I-LINE NEGATIVE PHOTORESIST COMPOSITION FOR REDUCING HEIGHT DIFFERENCE BETWEEN CENTER AND EDGE AND REDUCING LER, AND I-LINE NEGATIVE PHOTORESIST COMPOSITION FOR IMPROVING PROCESS MARGIN Young Chang Chemical Co., Ltd. (KR) 2023-08-02 EP claimed
CN-115403976-B Anti-reflection coating composition 嘉庚创新实验室 2023-04-18 CN claimed
US-11586109-B2 Chemically-amplified-type negative-type photoresist composition YOUNG CHANG CHEMICAL CO., LTD (KR) 2023-02-21 US claimed
CN-115403976-A Anti-reflection coating composition 嘉庚创新实验室 2022-11-29 CN claimed
US-20220172955-A1 NOVEL ETCHING PATTERN FORMING METHOD IN SEMICONDUCTOR MANUFACTURING PROCESS YOUNG CHANG CHEMICAL CO., LTD (KR) 2022-06-02 US claimed
EP-3435160-B1 NEGATIVE PHOTORESIST COMPOSITION FOR KRF LASER, HAVING HIGH RESOLUTION AND HIGH ASPECT RATIO YOUNG CHANG CHEMICAL CO LTD (KR) 2022-05-04 EP claimed
EP-3940747-A1 NOVEL ETCHING PATTERN FORMING METHOD IN SEMICONDUCTOR MANUFACTURING PROCESS Young Chang Chemical Co., Ltd. (KR) 2022-01-19 EP claimed
CN-112805333-A Coating with improved scratch resistance 伊士曼化工公司 2021-05-14 CN claimed
WO-1993003063-A1 CELLULOSE ACETOACETATES EASTMAN CHEMICAL COMPANY (US) 1993-02-18 WO claimed
WO-1992014694-A1 THERMOSETTING COATING COMPOSITIONS EASTMAN KODAK COMPANY (US) 1992-09-03 WO claimed
US-5144003-A Curable copolymers containing 1,5-bis(4-carboxycyclohexyl)-3-pentanol monomer; castings and moldings EASTMAN KODAK COMPANY (US) 1992-09-01 US claimed
EP-0409916-A1 WATER-DISSIPATABLE POLYESTER RESINS AND COATINGS PREPARED THEREFROM EASTMAN KODAK COMPANY (US) 1991-01-30 EP claimed
US-4973656-A BRANCHED, CONTAINING SULFONATE GROUPS EASTMAN KODAK COMPANY (US) 1990-11-27 US claimed
WO-1990003994-A2 WATER-DISSIPATABLE POLYESTER RESINS AND COATINGS PREPARED THEREFROM EASTMAN KODAK COMPANY (US) 1990-04-19 WO claimed
EP-0364331-A2 Water-dissipatable polyester resins and coatings prepared therefrom EASTMAN CHEMICAL COMPANY (US) 1990-04-18 EP claimed
EP-0008156-B1 PRODUCTION OF POLYMER MICROPARTICLES AND COATING COMPOSITIONS CONTAINING THEM IMPERIAL CHEMICAL INDUSTRIES PLC (GB) 1984-03-14 EP claimed
US-4340511-A AMINO RESIN CROSSLINKED ADDITION POLYMER IMPERIAL CHEMICAL INDUSTRIES LIMITED (GB) 1982-07-20 US claimed
EP-0008156-A1 Production of polymer microparticles and coating compositions containing them IMPERIAL CHEMICAL INDUSTRIES PLC (GB) 1980-02-20 EP claimed