Water

Water

SCHEMBL4146453

CCC([n+]1ccccc1)S(=O)(=O)O.[OH-]

nearest known ligand 0.00

Full drug profile on Sugi Atlas →

Known targets — ChEMBL curated mechanism

GABRA1GABRA2GABRA3GABRA4GABRA5GABRA6GABRB1GABRB2GABRB3GABRDGABREGABRG1GABRG2GABRG3GABRPGABRQ

The experimentally established mechanism targets of Water. The predicted profile below is derived independently by chemical similarity — agreement is a validation signal, a miss is honest.

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1980407 0.98
Phosphoric Acid SCHEMBL28367097 0.91
SCHEMBL25360569 0.91
Phosphoric Acid SCHEMBL28367096 0.88 GGPS1 (0.31)
Trifluoromethanesulfonic Acid SCHEMBL25361229 0.88
Water SCHEMBL8009819 0.85 CHRM1 (0.34)
Betaine SCHEMBL7550058 0.84 TSHR (0.42)
SCHEMBL9011006 0.82 CHRM1 (0.35)
SCHEMBL17157330 0.80 SLC22A2 (0.38)
Sulfuric Acid SCHEMBL28789324 0.78 CHRM1 (0.32)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 15 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6527622-B1 CMP method for noble metals CABOT MICROELECTRONICS CORPORATION 2003-03-04 US claimed
EP-1599555-B1 CMP COMPOSITION COMPRISING A SULFONIC ACID AND A METHOD FOR POLISHING NOBLE METALS CABOT MICROELECTRONICS CORP (US) 2019-06-12 EP disclosed
EP-1928965-B1 COMPOSITIONS AND METHODS FOR TANTALUM CMP CABOT MICROELECTRONICS CORP (US) 2015-12-30 EP disclosed
EP-1576208-B1 BRIGHTENER FOR ZINC-NICKEL PLATING BATH COVENTYA INC (US) 2013-03-06 EP disclosed
US-20090166583-A1 COMPOSITION FOR ANISOTROPIC PIGMENTED FILM, ANISOTROPIC PIGMENTED FILM, AND POLARIZING ELEMENT MITSUBISHI CHEMICAL CORPORATION (JP) 2009-07-02 US disclosed
EP-1906216-A1 COMPOSITION FOR ANISOTROPIC PIGMENTED FILM, ANISOTROPIC PIGMENTED FILM, AND POLARIZING ELEMENT Mitsubishi Chemical Corporation (JP) 2008-04-02 EP disclosed
EP-1576208-A4 BRIGHTENER FOR ZINC-NICKEL PLATING BATH TASKEM INC (US) 2008-02-13 EP disclosed
US-20060230551-A1 Dye compositions for anisotropic dye films, anisotropic dye films and polarizing elements MITSUBISHI CHEMICAL CORPORATION (JP) 2006-10-19 US disclosed
EP-1707995-A1 DYE COMPOSITION FOR ANISOTROPIC DYE FILM, ANISOTROPIC DYE FILM AND POLARIZER Mitsubishi Chemical Corporation (JP) 2006-10-04 EP disclosed
EP-1576208-A2 BRIGHTENER FOR ZINC-NICKEL PLATING BATH Taskem Inc. (US) 2005-09-21 EP disclosed
WO-2005078163-A1 TERNARY AND QUATERNARY ALLOYS TO REPLACE CHROMIUM TASKEM, INC. (US) 2005-08-25 WO disclosed
US-20050173255-A1 Electroplated quaternary alloys TASKEM, INC. 2005-08-11 US disclosed
US-20050173254-A1 Nickel cobalt boron ternary alloys TASKEM, INC. 2005-08-11 US disclosed
WO-2003006360-A2 BRIGHTENER FOR ZINC-NICKEL PLATING BATH TASKEM INC. (US) 2003-01-23 WO disclosed
US-6468411-B1 CARBOXYLIC ACID, SALT OR ESTER SUBSTITUTED N-METHYLPYRIDINE AND AN ALIPHATIC AMINE SUCH AS POLYETHYLENEIMINE; PRODUCING MIRROR BRIGHT ZINC AND NICKEL ALLOY DEPOSITS; NONBLISTERING, NONDECOMPOSING TASKEM INC. 2002-10-22 US disclosed