Benzoin

Benzoin

SCHEMBL418308

NC(=O)O.O=C(c1ccccc1)C(O)c1ccccc1

nearest known ligand 0.88

Full drug profile on Sugi Atlas →

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CES2 O00748 4/20 0.88
LMNA P02545 3/20 0.88
CES1 P23141 3/20 0.88
ALDH1A1 P00352 3/20 0.61
KDM4E B2RXH2 1/20 0.61
TDP1 Q9NUW8 2/20 0.57
L3MBTL1 Q9Y468 2/20 0.57
MAPK1 P28482 1/20 0.56
CYP3A4 P08684 2/20 0.48
POLB P06746 1/20 0.48
PARP1 P09874 1/20 0.48
MAPT P10636 1/20 0.48
TSHR P16473 1/20 0.48
CYP2C19 P33261 1/20 0.48
RECQL P46063 1/20 0.48
BLM P54132 1/20 0.48
PMP22 Q01453 1/20 0.48
HSD17B10 Q99714 1/20 0.48
HPGD P15428 1/20 0.46
ALKBH5 Q6P6C2 1/20 0.43

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Benzoin SCHEMBL28211858 0.96 CES2 (0.88) CES2LMNACES1ALDH1A1KDM4E
Benzoin SCHEMBL28120851 0.94 CES2 (1.00) CES2LMNACES1ALDH1A1KDM4E
Benzoin SCHEMBL145 0.94 CES2 (1.00) CES2LMNACES1ALDH1A1KDM4E
Benzoin SCHEMBL901258 0.94 CES2 (1.00) CES2LMNACES1ALDH1A1KDM4E
Benzoin SCHEMBL10665271 0.94 CES2 (1.00) CES2LMNACES1ALDH1A1KDM4E
Benzoin SCHEMBL27696284 0.94 CES2 (1.00) CES2LMNACES1ALDH1A1KDM4E
Benzoin SCHEMBL2025536 0.94 CES2 (1.00) CES2LMNACES1ALDH1A1KDM4E
Benzoin SCHEMBL5833429 0.94 CES2 (1.00) CES2LMNACES1ALDH1A1KDM4E
Benzoin SCHEMBL27845663 0.92 CES2 (0.81) CES2LMNACES1ALDH1A1KDM4E
Benzoin SCHEMBL4527488 0.91 CES2 (0.95) CES2LMNACES1ALDH1A1KDM4E

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 474 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4636808-A1 PEELING AGENT COMPOSITION FOR PHOTOIRRADIATION-BASED PEELING, LAMINATE, AND METHOD FOR PRODUCING PROCESSED SEMICONDUCTOR SUBSTRATE OR ELECTRONIC DEVICE LAYER Nissan Chemical Corporation (JP) 2025-10-22 EP claimed
WO-2024128279-A1 PEELING AGENT COMPOSITION FOR PHOTOIRRADIATION-BASED PEELING, LAMINATE, AND METHOD FOR PRODUCING PROCESSED SEMICONDUCTOR SUBSTRATE OR ELECTRONIC DEVICE LAYER 日産化学株式会社 2024-06-20 WO claimed
US-20200201178-A1 PHOTOCURABLE COMPOSITION HAVING LOW SHRINKAGE AFTER CURING CANON KABUSHIKI KAISHA (JP) 2020-06-25 US claimed
EP-2640780-B1 UV CURABLE ANHYDRIDE-MODIFIED POLY(ISOBUTYLENE) 3M INNOVATIVE PROPERTIES CO (US) 2018-05-09 EP claimed
CN-104530417-B A kind of multiple functionalized H types polyethyleneglycol derivative and preparation method thereof 厦门赛诺邦格生物科技股份有限公司 2017-09-08 CN claimed
CN-104530415-B A kind of different functionalization Y types polyethyleneglycol derivative, preparation method and its bio-related substance 厦门赛诺邦格生物科技股份有限公司 2017-09-01 CN claimed
EP-2820052-B1 PHOTOBASE GENERATORS AS LATENT IONIC CROSSLINKERS FOR ACRYLIC PRESSURE-SENSITIVE ADHESIVES 3M INNOVATIVE PROPERTIES CO (US) 2017-06-14 EP claimed
US-20160017073-A1 PHOTOBASE GENERATORS AS LATENT IONIC CROSSLINKERS FOR ACRYLIC PRESSURE-SENSITIVE ADHESIVES 3M INNOVATIVE PROPERTIES COMPANY 2016-01-21 US claimed
US-9238702-B1 Photobase generators as latent ionic crosslinkers for acrylic pressure-sensitive adhesives 3M INNOVATIVE PROPERTIES COMPANY (US) 2016-01-19 US claimed
EP-2960280-A1 Photocrosslinkable compositions, patterned high k thin film dielectrics and related devices E.T.C. S.r.l. (IT) 2015-12-30 EP claimed
US-20050126697-A1 Photochemically and thermally curable adhesive formulations INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2005-06-16 US claimed
US-6096483-A ULTRAVIOLET RADIATION BASE-GENERATING SUBSTANCE; SILOXANE POLYMER HAVING SILICON-HYDROGEN BONDS CAPABLE OF REACTING WITH HYDROXY GROUPS UNDER THE EFFECT OF THE BASE TO FORM SILICON-OXYGEN BONDS AND HYDROGEN; AND ACID; STORAGE STABLE DOW CORNING ASIA, LTD. (JP) 2000-08-01 US claimed
EP-0725106-B1 Radiation curable compositions DOW CORNING ASIA LTD (JP) 1999-11-03 EP claimed
EP-0555749-B1 Radiation sensitive compositions and processes SHIPLEY CO (US) 1999-05-19 EP claimed
US-5891529-A Radiation curable sompositions DOW CORNING ASIA, LTD. (JP) 1999-04-06 US claimed
US-5789460-A Radiation curable compositions DOW CORNING ASIA, LTD. (JP) 1998-08-04 US claimed
EP-0798341-A1 Radiation-curable composition and method for manufacturing cured-product patterns therefrom DOW CORNING ASIA, Ltd. (JP) 1997-10-01 EP claimed
EP-0725106-A2 Radiation curable compositions DOW CORNING ASIA, Ltd. (JP) 1996-08-07 EP claimed
EP-0555749-A1 Radiation sensitive compositions and processes SHIPLEY COMPANY INC. (US) 1993-08-18 EP claimed
EP-0425142-A2 Positive acting photoresist and method of producing same ROHM AND HAAS COMPANY (US) 1991-05-02 EP claimed