SCHEMBL423504

SCHEMBL423504

Cc1ccccc1[S+](c1ccccc1)c1ccccc1

nearest known ligand 0.43

Predicted protein targets (top 17)

geneUniProtsupporting neighboursconfidence
TSHR P16473 4/20 0.43
ACHE P22303 3/20 0.43
LMNA P02545 1/20 0.35
ALOX12 P18054 1/20 0.35
ALDH1A1 P00352 4/20 0.35
CA1 P00915 2/20 0.35
CA2 P00918 2/20 0.35
CA7 P43166 2/20 0.35
CA9 Q16790 2/20 0.35
CYP3A4 P08684 1/20 0.33
TDP1 Q9NUW8 1/20 0.33
CYP2A6 P11509 2/20 0.32
CYP1A2 P05177 2/20 0.32
MGLL Q99685 1/20 0.31
MAPT P10636 1/20 0.30
HTT P42858 1/20 0.30
ESR1 P03372 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Bromide SCHEMBL31555343 0.98 TSHR (0.41) TSHRACHELMNAALOX12ALDH1A1
Bromide SCHEMBL3135269 0.98 TSHR (0.41) TSHRACHELMNAALOX12ALDH1A1
Iodide SCHEMBL6129788 0.98 TSHR (0.41) TSHRACHELMNAALOX12ALDH1A1
SCHEMBL7646743 0.95 TSHR (0.43) TSHRACHELMNAALOX12ALDH1A1
Perchlorate SCHEMBL3139802 0.91 ACHE (0.36) TSHRACHEALDH1A1CA1CA2
SCHEMBL3141108 0.91 ACHE (0.39) TSHRACHEALDH1A1CA1CA2
SCHEMBL3137533 0.88 TSHR (0.33) TSHRACHE
SCHEMBL13158723 0.88 ACHE (0.37) TSHRACHELMNAALDH1A1
SCHEMBL3136160 0.88 TSHR (0.33) TSHRACHE
SCHEMBL8597282 0.84 HPGD (0.32) TSHRACHECYP3A4CYP1A2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 603 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9058935-B2 Compounds containing alkyl-cyano-borate or alkyl-cyano-fluoroborate anions MERC PATENT GMBH (DE) 2015-06-16 US claimed
US-6479210-B2 COMPRISING AN ORGANIC MATERIAL CONTAINING SUBSTITUENT(S) CAPABLE OF BEING RELEASED IN THE PRESENCE OF ACID, AND ACID GENERATORS OF AT LEAST ONE ONIUM SALT AND SULFONE AND/OR SULFONATE COMPOUNDS; RESOLUTION, SENSITIVITY CLARIANT FINANCE (BVI) LIMITED (VG) 2002-11-12 US claimed
EP-0611813-B1 One-component air-activatable polymerisable compositions containing onium salts LOCTITE IRELAND LTD (IE) 1998-12-30 EP claimed
CN-118459372-A Preparation method of photoacid generator sulfonate for ARF photoresist 常州朗芯新材料科技有限公司 2024-08-09 CN disclosed
US-20240219830-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2024-07-04 US disclosed
US-20240219830-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2024-07-04 US disclosed
US-20240210824-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2024-06-27 US disclosed
US-20240210824-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2024-06-27 US disclosed
US-11970596-B2 Photopolymerizable compositions and reaction products thereof 3M INNOVATIVE PROPERTIES COMPANY (US) 2024-04-30 US disclosed
US-11840503-B2 Salt, acid generator, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-12-12 US disclosed
US-11840503-B2 Salt, acid generator, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-12-12 US disclosed
EP-1002817-B1 Photocurable composition SHOWA DENKO KK (JP) 2004-04-28 EP disclosed
EP-0915136-B1 Photocurable paint composition for road markings SHOWA DENKO KK (JP) 2004-01-21 EP disclosed
US-6656660-B1 Resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2003-12-02 US disclosed
US-6486225-B1 Photocurable composition SHOWA DENKO KABUSHIKI KAISHA (JP) 2002-11-26 US disclosed
US-6211260-B1 MARKING ROADS WITH CURABLE PAINT, FILLERS, GLASS BEADS, CATIONIC DYES AND QUATERNARY ORGANIC BORATES SHOWA DENKO K.K. (JP) 2001-04-03 US disclosed
US-6183934-B1 FOE USE IN FORMATION OF PATTERN OF INSULATION FILM, PASSIVATION FILM, .ALPHA.-RAY SHIELDING FILM, OPTICAL WAVEGUIDE KABUSHIKI KAISHA TOSHIBA (JP) 2001-02-06 US disclosed
EP-1024406-A1 Resist composition WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 2000-08-02 EP disclosed
EP-1002817-A2 Photocurable composition SHOWA DENKO KABUSHIKI KAISHA (JP) 2000-05-24 EP disclosed
EP-0915136-A1 Photocurable paint composition for road markings SHOWA DENKO KABUSHIKI KAISHA (JP) 1999-05-12 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (4 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20240210824-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SCO2, CBR1, OXGR1 TSHR 847/4885ACHE 3889/4885LMNA 4690/4885
US-11970596-B2 Photopolymerizable compositions and reaction products thereof CBR1, CBR3, POLL TSHR 2948/4885ACHE 4637/4885LMNA 1974/4885
US-20240219830-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN H1-0, HCN3, RER1 TSHR 1113/4885ACHE 4355/4885LMNA 3803/4885
US-11840503-B2 Salt, acid generator, resist composition and method for producing resist pattern RER1, H1-0, CA7 TSHR 63/4885ACHE 4081/4885LMNA 4757/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.