SCHEMBL4399238

SCHEMBL4399238

C=C(C)C(=O)OC1(C)CC2C=CC1C2

nearest known ligand 0.33

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
CYP2D6 P10635 1/20 0.33
CYP2C19 P33261 1/20 0.33
ALDH1A1 P00352 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4401669 0.85 ALDH1A1 (0.33) CYP2D6CYP2C19ALDH1A1
SCHEMBL1451564 0.83 ALOX15 (0.39) CYP2D6CYP2C19
SCHEMBL31695326 0.83 CYP2D6 (0.32) CYP2D6CYP2C19
SCHEMBL7863152 0.80 CYP2D6 (0.36) CYP2D6CYP2C19
SCHEMBL19771478 0.80 CYP2D6 (0.32) CYP2D6CYP2C19
SCHEMBL4399242 0.78 CYP2D6 (0.36) CYP2D6CYP2C19
SCHEMBL4401912 0.78 CYP2D6 (0.31) CYP2D6CYP2C19
SCHEMBL4399237 0.78 CYP2D6 (0.39) CYP2D6CYP2C19ALDH1A1
SCHEMBL5347779 0.78 CYP2D6 (0.34) CYP2D6CYP2C19
SCHEMBL32689135 0.77 CYP2D6 (0.35) CYP2D6CYP2C19

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 86 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230174471-A1 ACETAL-BASED COMPOUND, ACETAL-BASED PREPOLYMER, ACETAL-BASED POLYMER, AND PHOTORESIST COMPOSITION COMPRISING THE SAME INHA INDUSTRY PARTNERSHIP INSTITUTE (KR) 2023-06-08 US disclosed
US-10191373-B2 Method for producing polymer SHIN-ETSU CHEMICAL CO., LTD. (JP) 2019-01-29 US disclosed
US-10007178-B2 Positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-06-26 US disclosed
US-10005868-B2 Resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-06-26 US disclosed
US-9927708-B2 Pattern forming process and shrink agent SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-03-27 US disclosed
US-9927708-B2 Pattern forming process and shrink agent SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-03-27 US disclosed
US-9910358-B2 Patterning process and chemically amplified negative resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-03-06 US disclosed
US-20180024435-A1 RESIST COMPOSITION AND PATTERNING PROCESS USING THE SAME SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-01-25 US disclosed
US-20180024435-A1 RESIST COMPOSITION AND PATTERNING PROCESS USING THE SAME SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-01-25 US disclosed
US-9869931-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-01-16 US disclosed
US-20080166660-A1 Having acrylic ester functionality with acid labile ester ring functionality and sulfonium sulfonate acid salt; high resolution semiconductor microfabrication patterns; excimer laser lithography SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-07-10 US disclosed
EP-1364975-B1 PROCESSES FOR PRODUCING CYCLOOLEFIN ADDITION POLYMER JSR CORP (JP) 2008-04-30 EP disclosed
US-20070225461-A1 Olefin polymers for imaging members LEXMARK INTERNATIONAL INC. 2007-09-27 US disclosed
US-20070218401-A1 liquid immersion lithography, solves problem of defect caused by residual fluid droplets on the resist film; blend of resin containing no fluorine and acid labile group, and an acrylic fluoro-copolymer with units of a fluoromonomer and units of acid labile, lactone, or hydroxy-functional group SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-09-20 US disclosed
US-20070218401-A1 liquid immersion lithography, solves problem of defect caused by residual fluid droplets on the resist film; blend of resin containing no fluorine and acid labile group, and an acrylic fluoro-copolymer with units of a fluoromonomer and units of acid labile, lactone, or hydroxy-functional group SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-09-20 US disclosed
US-6911507-B2 Processes for producing cycloolefin addition polymer JSR CORPORATION (JP) 2005-06-28 US disclosed
US-6790914-B2 TRANSPARENT (CROSSLINKED) RESIN FILM CAN BE USED AS A POLARIZING FILM, SURFACE PROTECTIVE FILM, RETARDATION FILM, TRANSPARENT CONDUCTIVE FILM, LIGHT DIFFUSION FILM, FILM FOR AN EL DISPLAY DEVICE, TRANSPARENT CONDUCTIVE COMPOSITE MATERIAL, JSR CORPORATION (JP) 2004-09-14 US disclosed
US-20040106740-A1 Resin film and applications thereof JSR CORPORATION (JP) 2004-06-03 US disclosed
US-20040063873-A1 Processes for producing cycloolefin addition polymer JSR CORPORATION (JP) 2004-04-01 US disclosed
EP-1364975-A1 PROCESSES FOR PRODUCING CYCLOOLEFIN ADDITION POLYMER JSR Corporation (JP) 2003-11-26 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20230174471-A1 ACETAL-BASED COMPOUND, ACETAL-BASED PREPOLYMER, ACETAL-BASED POLYMER, AND PHOTORESIST COMPOSITION COMPRISING THE SAME PARP10, ADCY10, APRT CYP2D6 3095/4885CYP2C19 1957/4885ALDH1A1 83/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.