SCHEMBL44331

SCHEMBL44331

C=C(C)C(=O)OC1(C)C2CC3CC(C2)CC1C3

nearest known ligand 0.40

Predicted protein targets (top 4)

geneUniProtsupporting neighboursconfidence
CYP17A1 P05093 2/20 0.40
CYP19A1 P11511 2/20 0.40
ALDH1A1 P00352 2/20 0.35
ELANE P08246 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL27616990 0.93 ALDH1A1 (0.48) CYP17A1CYP19A1ALDH1A1
SCHEMBL21235008 0.92 CYP17A1 (0.36) CYP17A1CYP19A1ALDH1A1
SCHEMBL13900363 0.90 ALDH1A1 (0.39) CYP17A1CYP19A1ALDH1A1
Methacrylic Acid SCHEMBL6296789 0.89 ALDH1A1 (0.44) CYP17A1CYP19A1ALDH1A1
SCHEMBL3394712 0.88 CYP17A1 (0.37) CYP17A1CYP19A1ALDH1A1
Acrylic Acid SCHEMBL6297075 0.85 ALDH1A1 (0.41) CYP17A1CYP19A1ALDH1A1
SCHEMBL8398065 0.85 CYP17A1 (0.40) CYP17A1CYP19A1
SCHEMBL711096 0.85 CYP17A1 (0.40) CYP17A1CYP19A1
SCHEMBL13288279 0.85 CYP17A1 (0.44) CYP17A1CYP19A1
SCHEMBL17247236 0.85 CYP17A1 (0.36) CYP17A1CYP19A1ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 4761 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-120025480-A Modified styrene-acrylic emulsion, interior wall coating and preparation method thereof 立邦涂料(中国)有限公司 2025-05-23 CN claimed
CN-120005123-A Acrylic ester block copolymer resin, photoresist, and preparation method and application thereof 中国石油化工股份有限公司 2025-05-16 CN claimed
CN-119735762-A Acrylic emulsion, application thereof and emulsion pressure-sensitive adhesive 成都友一包装材料有限公司 2025-04-01 CN claimed
CN-119708332-A Polymer for ArF photoresist, preparation method of polymer and photoresist composition 中节能万润股份有限公司 2025-03-28 CN claimed
CN-119286334-B Modified acrylic resin, preparation method thereof, transfer coating and transfer film 广州慧谷新材料科技股份有限公司 2025-03-21 CN claimed
CN-119613607-A Preparation method of 193nm photoresist resin 江苏集萃光敏电子材料研究所有限公司 2025-03-14 CN claimed
CN-119285996-A Temperature-solvent dual-response information processing hydrogel with host-guest recognition and regulation effects, preparation method and application thereof 海南师范大学 2025-01-10 CN claimed
CN-119286334-A Modified acrylic resin, preparation method thereof, transfer coating and transfer film 广州慧谷新材料科技股份有限公司 2025-01-10 CN claimed
CN-119264321-A Method for regulating and controlling molecular weight change of electronic grade acrylic resin 厦门大学 2025-01-07 CN claimed
CN-119024644-A Nanoimprint photoresist and preparation method thereof 珠海莫界科技有限公司 2024-11-26 CN claimed
US-20020150834-A1 Chemically amplified resist composition and method for forming patterned film using same FUJITSU LIMITED (JP) 2002-10-17 US claimed
US-20020081523-A1 Chemical amplification type positive resist composition SUMITOMO CHEMICAL CO., LTD. 2002-06-27 US claimed
US-6348297-B1 COMPOSITION COMPRISING ACID GENERATOR COMPRISING ALIPHATIC SULFONIUM SALT, TRIPHENYLSULFONIUM OR DIPHENYLIODONIUM SALT,RESIN HAVING ACID-LABILE GROUP WHICH IS INSOLUBLE IN ALKALI BUT BECOMES SOLUBLE BY ACTION OF ACID SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2002-02-19 US claimed
US-20010044072-A1 Photoresist compositions comprising blends of ionic and non-ionic photoacid generators SHIPLEY COMPANY, L.L.C. (US) 2001-11-22 US claimed
EP-1128213-A2 Photoresist compositions comprising novel copolymers Shipley Company LLC (US) 2001-08-29 EP claimed
US-6280911-B1 FORMING A PHOTORESIST RELIEF IMAGE ON MICROELECTRONIC WAFER SUBSTRATES OR FLAT PANEL DISPLAY SUBSTRATE, EXPOSURE TO ACTIVATING RADIATION SHIPLEY COMPANY, L.L.C. 2001-08-28 US claimed
EP-1091249-A1 Copolymers having nitride and alicyclic leaving groups and photoresist compositions comprising same Shipley Company LLC (US) 2001-04-11 EP claimed
EP-1041442-A1 Chemical amplification type positive resist SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2000-10-04 EP claimed
CN-1268680-A Chemical enhancement type positive photoetching gum composition SUMOTOMO CHEMICAL CO LTD (JP) 2000-10-04 CN claimed
CN-1261171-A Chemically enhanced possitive photoetching compositions SUMITOMO CHEMICAL CO (JP) 2000-07-26 CN claimed