SCHEMBL4540306

SCHEMBL4540306

COCN1C(=O)N(CO)C(OC)C1OC

nearest known ligand 0.42

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
L3MBTL1 Q9Y468 1/20 0.42

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL36050 0.90 L3MBTL1 (0.31) L3MBTL1
SCHEMBL807563 0.90 L3MBTL1 (0.50) L3MBTL1
SCHEMBL10202163 0.87 L3MBTL1 (0.39) L3MBTL1
SCHEMBL4536626 0.87 L3MBTL1 (0.39) L3MBTL1
SCHEMBL4540605 0.87 L3MBTL1 (0.39) L3MBTL1
SCHEMBL13706072 0.85 L3MBTL1 (0.32) L3MBTL1
SCHEMBL14756634 0.81
SCHEMBL12430562 0.81
SCHEMBL21414069 0.80 L3MBTL1 (0.61) L3MBTL1
SCHEMBL1520247 0.78 L3MBTL1 (0.44) L3MBTL1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 24 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9664827-B2 Colored composition, method of producing color filter using the same, color filter and solid-state imaging device FUJIFILM CORPORATION (JP) 2017-05-30 US disclosed
US-9632222-B2 Method for manufacturing a color filter, color filter and solid-state imaging device FUJIFILM CORPORATION (JP) 2017-04-25 US disclosed
US-20170102618-A1 METHOD OF FORMING PATTERN FUJIFILM CORPORATION (JP) 2017-04-13 US disclosed
US-9507257-B2 Method for manufacturing a color filter, color filter and solid-state imaging device FUJIFILM CORPORATION (JP) 2016-11-29 US disclosed
US-9442373-B2 Method of producing color filter and solid-state imaging device having colored composition containing color agent FUJIFILM CORPORATION (JP) 2016-09-13 US disclosed
US-9442374-B2 Coloring composition, method for manufacturing a color filter using the same, color filter and solid-state imaging device FUJIFILM CORPORATION (JP) 2016-09-13 US disclosed
US-20160209747-A1 ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE COMPOSITION, AND RESIST FILM, PATTERN FORMING METHOD, RESIST-COATED MASK BLANK, METHOD FOR PRODUCING PHOTOMASK, PHOTOMASK, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE, EACH OF WHICH USES SAID ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE COMPOSITION FUJIFILM CORPORATION (JP) 2016-07-21 US disclosed
US-20160147154-A1 PATTERN FORMATION METHOD, ACTIVE LIGHT-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PRODUCTION METHOD FOR ELECTRONIC DEVICE USING SAME, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2016-05-26 US disclosed
US-20140242359-A1 METHOD OF FORMING PATTERN AND COMPOSITION FOR CROSSLINKED LAYER FORMATION TO BE USED IN THE METHOD FUJIFILM CORPORATION (JP) 2014-08-28 US disclosed
US-20140178634-A1 COLORING COMPOSITION, METHOD FOR MANUFACTURING A COLOR FILTER USING THE SAME, COLOR FILTER AND SOLID-STATE IMAGING DEVICE FUJIFILM CORPORATION (JP) 2014-06-26 US disclosed
US-20140127629-A1 METHOD OF FORMING PATTERN FUJIFILM CORPORATION (JP) 2014-05-08 US disclosed
US-8663907-B2 Method of forming pattern FUJIFILM CORPORATION (JP) 2014-03-04 US disclosed
US-8637222-B2 Negative resist pattern forming method, developer and negative chemical-amplification resist composition used therefor, and resist pattern FUJIFILM CORPORATION (JP) 2014-01-28 US disclosed
WO-2013065878-A1 METHOD OF FORMING PATTERN AND COMPOSITION FOR CROSSLINKED LAYER FORMATION TO BE USED IN THE METHOD FUJIFILM CORPORATION (JP) 2013-05-10 WO disclosed
US-20130101812-A1 METHOD OF FORMING PATTERN FUJIFILM CORPORATION (JP) 2013-04-25 US disclosed
WO-2012062615-A2 BINDER FOR WOOD MATERIALS EVONIK DEGUSSA GMBH (DE) 2012-05-18 WO disclosed
US-20120052449-A1 METHOD OF FORMING PATTERN FUJIFILM CORPORATION (JP) 2012-03-01 US disclosed
US-20110287234-A1 NEGATIVE RESIST PATTERN FORMING METHOD, DEVELOPER AND NEGATIVE CHEMICAL-AMPLIFICATION RESIST COMPOSITION USED THEREFOR, AND RESIST PATTERN FUJIFILM CORPORATION (JP) 2011-11-24 US disclosed
US-7432034-B2 Negative resist composition FUJIFILM CORPORATION (JP) 2008-10-07 US disclosed
US-7432034-B2 Negative resist composition FUJIFILM CORPORATION (JP) 2008-10-07 US disclosed