SCHEMBL482181

SCHEMBL482181

CCC(C)(C)OC(=O)c1c2ccccc2cc2ccccc12

nearest known ligand 0.47

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 7/20 0.47
KDM4E B2RXH2 7/20 0.47
HPGD P15428 6/20 0.47
KMT2A Q03164 4/20 0.47
MEN1 O00255 3/20 0.47
GLA P06280 2/20 0.47
HSD17B10 Q99714 2/20 0.47
CYP1A2 P05177 2/20 0.47
CYP2C19 P33261 2/20 0.47
L3MBTL1 Q9Y468 3/20 0.46
MAPK1 P28482 2/20 0.41
TDP1 Q9NUW8 2/20 0.41
LMNA P02545 1/20 0.41
MAPT P10636 1/20 0.41
ATM Q13315 1/20 0.41
NR1I2 O75469 1/20 0.38
CDC25B P30305 3/20 0.37
NPSR1 Q6W5P4 1/20 0.37
POLB P06746 1/20 0.37
PPARG P37231 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL482475 0.83 ALDH1A1 (0.53) ALDH1A1KDM4EHPGDKMT2AMEN1
SCHEMBL13327344 0.81 KDM4E (0.50) ALDH1A1KDM4EHPGDKMT2AMEN1
SCHEMBL13327346 0.78 CDC25B (0.52) ALDH1A1KDM4EHPGDKMT2AMEN1
SCHEMBL13327342 0.77 TSHR (0.40) ALDH1A1KDM4EHSD17B10CYP1A2CYP2C19
SCHEMBL5835576 0.77 CA12 (0.55) ALDH1A1KDM4EHPGDKMT2AMEN1
SCHEMBL13159644 0.76 ALDH1A1 (0.43) ALDH1A1KDM4EHPGDKMT2AMEN1
SCHEMBL21939652 0.76 ALDH1A1 (0.52) ALDH1A1KDM4EHPGDKMT2AMEN1
SCHEMBL9908975 0.75 ALDH1A1 (0.52) ALDH1A1KDM4EHPGDKMT2AMEN1
SCHEMBL1164214 0.75 KDM4E (0.55) ALDH1A1KDM4EHPGDKMT2AMEN1
SCHEMBL12689824 0.75 MEN1 (0.39) ALDH1A1KDM4EHPGDKMT2AMEN1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 99 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
JP-10120628-A None JP disclosed
EP-2105794-B1 Novel photoacid generator, resist composition, and patterning process SHINETSU CHEMICAL CO (JP) 2015-08-19 EP disclosed
EP-2033966-B1 Novel photoacid generators, resist compositons, and patterning processes SHINETSU CHEMICAL CO (JP) 2015-07-29 EP disclosed
EP-2507669-B1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, FILM FORMED USING THE COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORP (JP) 2015-01-07 EP disclosed
US-8741542-B2 Actinic ray-sensitive or radiation-sensitive resin composition, film formed using the composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2014-06-03 US disclosed
US-8741542-B2 Actinic ray-sensitive or radiation-sensitive resin composition, film formed using the composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2014-06-03 US disclosed
EP-1710230-B1 Novel sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process SHINETSU CHEMICAL CO (JP) 2013-08-14 EP disclosed
US-20120244472-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, FILM FORMED USING THE COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2012-09-27 US disclosed
US-20120244472-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, FILM FORMED USING THE COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2012-09-27 US disclosed
EP-1117003-B1 Process of preparing a chemical amplification type resist composition SHINETSU CHEMICAL CO (JP) 2012-06-20 EP disclosed
EP-1039346-A1 Resist compositions and pattering process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-09-27 EP disclosed
US-6117621-A APPLYING A CHEMICALLY AMPLIFIED POSITIVE RESIST OF A POLYMER WITH ACID LABILE GROUPS, A PHOTOACID GENERATOR AND A ORGANIC SOLVENT; RESOLUTION AND FOCAL DEPTH; EXPOSING, BAKING, AND DEVELOPING; CALIBRATION OF EXPOSURES AND DISSOLUTION RATES SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-09-12 US disclosed
US-6114462-A CROSSLINKING A POLYVINYLPHENOL DERIVATIVE WITH UNSATURATED ETHER DERIVATIVES SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-09-05 US disclosed
US-6048661-A POLYMER WITH HYDROXY AND CARBOXY GROUPS AND ETHER ESTER GROUPS FOR PHOTORESISTS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-04-11 US disclosed
US-6033828-A POLYVINYLPHENOL DERIVATIVES SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-03-07 US disclosed
US-6027854-A ACTINIC RADIATION-SENSITIVE, CROSSLINKED TERPOLYMER CONTAINING STYRENIC GROUPS RING-SUBSTITUTED WITH HYDROXYL, HYDROXYALKYLOXY, CARBOXYALKYLOXY MOIETIES AND ACID LABILE GROUPS; ETCHING AND HEAT RESISTANCE SHIN-ETSU CHEMICAL CO., LTD. 2000-02-22 US disclosed
US-5942367-A HIGH SENSITIVITY, RESOLUTION SHIN-ETSU CHEMICAL CO., LTD. (JP) 1999-08-24 US disclosed
EP-0908783-A1 Resist compositions, their preparation and use for patterning processes SHIN-ETSU CHEMICAL CO., LTD. (JP) 1999-04-14 EP disclosed
EP-0908473-A1 Styrene polymers, chemically-amplified positive resist compositions, their preparation and use in a patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 1999-04-14 EP disclosed
JP-H10120628-A CARBOXYLIC ACID DERIVATIVE HAVING TRICYCLIC AROMATIC SKELETON SHIN ETSU CHEM CO LTD 1998-05-12 JP disclosed