SCHEMBL482310

SCHEMBL482310

CC(C)(C)Oc1ccc(S(=O)(=O)c2ccc(OC(C)(C)C)cc2)cc1

nearest known ligand 0.58

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
PKM P14618 4/20 0.58
ELANE P08246 2/20 0.55
MAPT P10636 2/20 0.50
POLB P06746 1/20 0.50
GAA P10253 4/20 0.48
HSD11B1 P28845 1/20 0.46
HTT P42858 2/20 0.46
SMN1; SMN2 Q16637 1/20 0.46
ALDH1A1 P00352 4/20 0.42
CYP3A4 P08684 2/20 0.41
LMNA P02545 2/20 0.41
MAPK1 P28482 1/20 0.41
MPO P05164 1/20 0.41
CYP2C9 P11712 1/20 0.41
TSHR P16473 1/20 0.41
HTR6 P50406 1/20 0.41
NPSR1 Q6W5P4 1/20 0.41
TDP1 Q9NUW8 1/20 0.41
L3MBTL1 Q9Y468 1/20 0.41
LOX P28300 1/20 0.40

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL23075718 0.92 HTR6 (0.54) PKMELANEMAPTPOLBGAA
SCHEMBL21540971 0.92 GAA (0.61) PKMELANEMAPTPOLBGAA
SCHEMBL16281927 0.90 ALDH1A1 (0.50) PKMELANEMAPTPOLBGAA
SCHEMBL419122 0.90 ELANE (0.65) PKMELANEMAPTPOLBGAA
SCHEMBL22295637 0.87 HTT (0.62) PKMELANEHSD11B1HTTSMN1; SMN2
SCHEMBL22295587 0.87 HTT (0.62) PKMELANEHSD11B1HTTSMN1; SMN2
SCHEMBL18435569 0.87 MAPT (0.51) PKMELANEMAPTPOLBGAA
SCHEMBL12606796 0.87 HTT (0.67) PKMELANEMAPTPOLBGAA
SCHEMBL22373765 0.86 ALDH1A1 (0.49) PKMELANEMAPTPOLBGAA
SCHEMBL18801598 0.86 ALDH1A1 (0.49) PKMELANEMAPTPOLBGAA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 166 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20240069441-A1 COMPOSITION FOR RESIST UNDERLYING FILM FORMATION NISSAN CHEMICAL CORPORATION (JP) 2024-02-29 US disclosed
US-20240069441-A1 COMPOSITION FOR RESIST UNDERLYING FILM FORMATION NISSAN CHEMICAL CORPORATION (JP) 2024-02-29 US disclosed
US-11815815-B2 Composition for forming silicon-containing resist underlayer film removable by wet process NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2023-11-14 US disclosed
US-11815815-B2 Composition for forming silicon-containing resist underlayer film removable by wet process NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2023-11-14 US disclosed
US-20230176481-A1 FILM-FORMING COMPOSITION NISSAN CHEMICAL CORPORATION (JP) 2023-06-08 US disclosed
US-20230176481-A1 FILM-FORMING COMPOSITION NISSAN CHEMICAL CORPORATION (JP) 2023-06-08 US disclosed
US-20230168582-A1 COMPOSITION FOR FORMING RESIST UNDERLYING FILM NISSAN CHEMICAL CORPORATION (JP) 2023-06-01 US disclosed
US-20230168582-A1 COMPOSITION FOR FORMING RESIST UNDERLYING FILM NISSAN CHEMICAL CORPORATION (JP) 2023-06-01 US disclosed
US-20230152699-A1 FILM-FORMING COMPOSITION NISSAN CHEMICAL CORPORATION (JP) 2023-05-18 US disclosed
US-20230152700-A1 FILM-FORMING COMPOSITION NISSAN CHEMICAL CORPORATION (JP) 2023-05-18 US disclosed
EP-1039346-A1 Resist compositions and pattering process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-09-27 EP disclosed
US-6117621-A APPLYING A CHEMICALLY AMPLIFIED POSITIVE RESIST OF A POLYMER WITH ACID LABILE GROUPS, A PHOTOACID GENERATOR AND A ORGANIC SOLVENT; RESOLUTION AND FOCAL DEPTH; EXPOSING, BAKING, AND DEVELOPING; CALIBRATION OF EXPOSURES AND DISSOLUTION RATES SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-09-12 US disclosed
US-6114462-A CROSSLINKING A POLYVINYLPHENOL DERIVATIVE WITH UNSATURATED ETHER DERIVATIVES SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-09-05 US disclosed
US-6048661-A POLYMER WITH HYDROXY AND CARBOXY GROUPS AND ETHER ESTER GROUPS FOR PHOTORESISTS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-04-11 US disclosed
US-6033828-A POLYVINYLPHENOL DERIVATIVES SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-03-07 US disclosed
US-6027854-A ACTINIC RADIATION-SENSITIVE, CROSSLINKED TERPOLYMER CONTAINING STYRENIC GROUPS RING-SUBSTITUTED WITH HYDROXYL, HYDROXYALKYLOXY, CARBOXYALKYLOXY MOIETIES AND ACID LABILE GROUPS; ETCHING AND HEAT RESISTANCE SHIN-ETSU CHEMICAL CO., LTD. 2000-02-22 US disclosed
US-5942367-A HIGH SENSITIVITY, RESOLUTION SHIN-ETSU CHEMICAL CO., LTD. (JP) 1999-08-24 US disclosed
EP-0908783-A1 Resist compositions, their preparation and use for patterning processes SHIN-ETSU CHEMICAL CO., LTD. (JP) 1999-04-14 EP disclosed
EP-0908473-A1 Styrene polymers, chemically-amplified positive resist compositions, their preparation and use in a patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 1999-04-14 EP disclosed
US-4605940-A CONTAINING A PHENOLIC COMPOUND AND AN AROMATIC DIETHER SULFONE YOSHITOMI PHARMACEUTICAL INDUSTRIES, LTD. (JP) 1986-08-12 US disclosed