SCHEMBL482619

SCHEMBL482619

CC(=CC=Cc1ccc(O)cc1)c1ccccc1

nearest known ligand 0.53

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CYP3A4 P08684 2/20 0.50
HSPD1 P10809 2/20 0.50
HSPE1 P61604 2/20 0.50
KMT2A Q03164 2/20 0.50
PKM P14618 1/20 0.50
NFKB1 P19838 1/20 0.50
RAB9A P51151 1/20 0.50
NFKB2 Q00653 1/20 0.50
RELA Q04206 1/20 0.50
APP P05067 1/20 0.50
ESR1 P03372 7/20 0.48
ESR2 Q92731 3/20 0.48
MAPT P10636 3/20 0.46
KDM4E B2RXH2 1/20 0.46
ALDH1A1 P00352 1/20 0.46
TDP1 Q9NUW8 2/20 0.45
DEGS1 O15121 1/20 0.44
TTR P02766 1/20 0.44
MEN1 O00255 1/20 0.42
ALDH2 P05091 1/20 0.42

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL482810 0.91 ESR1 (0.59) CYP3A4KMT2APKMRAB9AAPP
SCHEMBL23458229 0.89 MAOB (0.52) CYP3A4KMT2ARAB9AMAPTKDM4E
SCHEMBL4614234 0.89 MAOB (0.52) CYP3A4KMT2ARAB9AMAPTKDM4E
SCHEMBL243079 0.89 MAOB (0.52) CYP3A4KMT2ARAB9AMAPTKDM4E
SCHEMBL1420823 0.86 ALDH1A1 (0.53) CYP3A4KMT2AMAPTKDM4EALDH1A1
SCHEMBL3700257 0.84 LMNA (0.50) CYP3A4HSPD1HSPE1KMT2APKM
Acrylic Acid Methyl Ester SCHEMBL2706183 0.84 CA12 (0.48) CYP3A4HSPD1HSPE1KMT2APKM
SCHEMBL23457953 0.81 MAOB (0.54) CYP3A4RAB9AAPPMAPTKDM4E
SCHEMBL23458034 0.81 MAOB (0.54) CYP3A4RAB9AAPPMAPTKDM4E
SCHEMBL5272455 0.81 TRPV1 (0.46) KMT2ARAB9AMAPTKDM4EALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 105 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
JP-6032849-A None JP disclosed
EP-2105794-B1 Novel photoacid generator, resist composition, and patterning process SHINETSU CHEMICAL CO (JP) 2015-08-19 EP disclosed
EP-2000851-B1 Photomask blank, resist pattern forming process, and photomask preparation process SHINETSU CHEMICAL CO (JP) 2015-07-29 EP disclosed
EP-2033966-B1 Novel photoacid generators, resist compositons, and patterning processes SHINETSU CHEMICAL CO (JP) 2015-07-29 EP disclosed
EP-1099983-B1 Chemically amplified positive resist composition and patterning method SHINETSU CHEMICAL CO (JP) 2014-08-06 EP disclosed
US-8609889-B2 Photoacid generator, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-12-17 US disclosed
US-8541158-B2 Positive resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-09-24 US disclosed
EP-1710230-B1 Novel sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process SHINETSU CHEMICAL CO (JP) 2013-08-14 EP disclosed
US-8394570-B2 Sulfonium salt, acid generator, resist composition, photomask blank, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-03-12 US disclosed
US-8343694-B2 Photomask blank, resist pattern forming process, and photomask preparation process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-01-01 US disclosed
US-6416928-B1 HALOGENONIUM OR SULFONIUM SALTS OF SULFONATED DIPHENYLALKANE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-07-09 US disclosed
US-20020076643-A1 Novel onium salts, photoacid generators, resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-06-20 US disclosed
US-20020077493-A1 Novel onium salts, photoacid generators, resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-06-20 US disclosed
US-6395446-B1 CONTAINING SULFONYLDIAZOMETHANE COMPOUND AS ACID GENERATOR SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-05-28 US disclosed
US-6338931-B1 PHOTOACID GENERATOR OF SULFONYLDIAZOMETHANE COMPOUND SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-01-15 US disclosed
US-20010035394-A1 Chemically amplified positive resist composition and patterning method SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-11-01 US disclosed
EP-1136885-A1 Chemically amplified positive resist composition and patterning method SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-09-26 EP disclosed
EP-1099983-A1 Chemically amplified positive resist composition and patterning method Shin-Etsu Chemical Co., Ltd. (JP) 2001-05-16 EP disclosed
EP-1077391-A1 Onium salts, photoacid generators for resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-02-21 EP disclosed
JP-H0632849-A P-HYDROXYSTYRENE-ALPHA-METHYLSTYRENE BLOCK COPOLYMER PARTIALLY ESTERIFIED WITH T-BUTOXYCARBONYL GROUP AND ITS PRODUCTION SHIN ETSU CHEM CO LTD 1994-02-08 JP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20020077493-A1 Novel onium salts, photoacid generators, resist compositions, and patterning process ABL1, PI4K2B, FES CYP3A4 2960/4885HSPD1 4715/4885HSPE1 4768/4885
US-20020076643-A1 Novel onium salts, photoacid generators, resist compositions, and patterning process PNN, PI4K2B, PI4K2A CYP3A4 2625/4885HSPD1 4476/4885HSPE1 4576/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.