SCHEMBL499375

SCHEMBL499375

O=C(O)OC(c1ccccc1[N+](=O)[O-])[N+](=O)[O-]

nearest known ligand 0.54

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
CYP1A2 P05177 2/20 0.54
ALDH1A1 P00352 6/20 0.53
TSHR P16473 2/20 0.51
MAPT P10636 2/20 0.41
MEN1 O00255 3/20 0.40
KMT2A Q03164 3/20 0.40
TDP1 Q9NUW8 3/20 0.40
GPR35 Q9HC97 1/20 0.39
CTSD P07339 1/20 0.38
L3MBTL1 Q9Y468 1/20 0.38
HSD17B10 Q99714 1/20 0.38
NPSR1 Q6W5P4 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5490056 0.86 ALDH1A1 (0.51) CYP1A2ALDH1A1TSHRMAPTMEN1
SCHEMBL5604453 0.86 ALDH1A1 (0.55) CYP1A2ALDH1A1TSHRMAPTTDP1
SCHEMBL11239221 0.82 ALDH1A1 (0.55) CYP1A2ALDH1A1TSHRMAPTTDP1
SCHEMBL2821430 0.81 ALDH1A1 (0.51) CYP1A2ALDH1A1TSHRMEN1KMT2A
SCHEMBL27889264 0.81 ALDH1A1 (0.56) CYP1A2ALDH1A1TSHRMAPTMEN1
SCHEMBL5932886 0.79 ALDH1A1 (0.46) CYP1A2ALDH1A1MAPTMEN1KMT2A
SCHEMBL626087 0.78 ALDH1A1 (0.49) CYP1A2ALDH1A1TSHRMEN1KMT2A
SCHEMBL286963 0.78 GSR (0.43) ALDH1A1MAPTKMT2ATDP1L3MBTL1
SCHEMBL28306131 0.75 ALDH1A1 (0.46) CYP1A2ALDH1A1TSHRMEN1KMT2A
SCHEMBL9681718 0.75 CYP1A2 (0.63) CYP1A2ALDH1A1TSHRMAPTMEN1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 192 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4667537-A1 PRIMER COMPOSITION, LAMINATE, AND METHOD FOR PRODUCING LAMINATE TOKYO OHKA KOGYO CO., LTD. (JP) 2025-12-24 EP disclosed
US-20250382500-A1 PRIMER COMPOSITION, LAMINATE, AND METHOD FOR PRODUCING LAMINATE TOKYO OHKA KOGYO CO LTD (JP) 2025-12-18 US disclosed
US-20250271751-A1 PHOTOSENSITIVE COMPOSITION, PHOTOSENSITIVE FILM, LOWER LAYER FILM, METHOD FOR PRODUCING STRUCTURE HAVING PHASE-SEPARATED STRUCTURE, AND COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2025-08-28 US disclosed
US-20250189895-A1 METHOD OF MANUFACTURING PLATED ARTICLE TOKYO OHKA KOGYO CO., LTD. (JP) 2025-06-12 US disclosed
US-20250172872-A1 CHEMICALLY AMPLIFIED POSITIVE-TYPE PHOTOSENSITIVE COMPOSITION, METHOD OF MANUFACTURING SUBSTRATE WITH TEMPLATE, AND METHOD OF MANUFACTURING PLATED ARTICLE TOKYO OHKA KOGYO CO., LTD. (JP) 2025-05-29 US disclosed
CN-119620544-A Photosensitive resin composition, dry film, photosensitive dry film, resist film, molded substrate with mold, and method for producing plated molded article 东京应化工业株式会社 2025-03-14 CN disclosed
EP-3961676-B1 ETCHING METHOD AND PHOTOSENSITIVE RESIN COMPOSITION TOKYO OHKA KOGYO CO LTD (JP) 2025-01-22 EP disclosed
CN-110317174-B Hydrogen barrier agent, composition for forming hydrogen barrier film, method for producing hydrogen barrier film, and electronic device 东京应化工业株式会社 2024-10-22 CN disclosed
CN-118829948-A Method for manufacturing plating shaped article 东京应化工业株式会社 2024-10-22 CN disclosed
CN-118742854-A Chemically amplified positive photosensitive composition, method for producing molded substrate with mold, and method for producing plated molded article 东京应化工业株式会社 2024-10-01 CN disclosed
US-20060141387-A1 Chemically amplified positive photoresist composition for thick film, thick-film photoresist laminated product, manufacturing method for thick-film resist pattern, and manufacturing method for connection terminal TOKYO OHKA KOGYO CO., LTD. (JP) 2006-06-29 US disclosed
US-7063934-B2 Negative photoresist compositions for the formation of thick films, photoresist films and methods of forming bumps using the same TOYKO OHKA KOGYO CO., LTD. (JP) 2006-06-20 US disclosed
WO-2006059757-A2 PROCESS FOR PRODUCING RESIST PATTERN AND CONDUCTOR PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2006-06-08 WO disclosed
WO-2006059747-A1 PROCESS FOR PRODUCING RESIST PATTERN AND CONDUCTOR PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2006-06-08 WO disclosed
US-20060035170-A1 Negative photoresist compositions for the formation of thick films, photoresist films and methods of forming bumps using the same SAITO KOJI 2006-02-16 US disclosed
US-20060035169-A1 Negative photoresist compositions for the formation of thick films, photoresist films and methods of forming bumps using the same TOKYO OHKA KOGYO CO., LTD. 2006-02-16 US disclosed
WO-2006003757-A1 METHOD OF FORMING PLATED PRODUCT USING NEGATIVE PHOTORESIST COMPOSITION AND PHOTOSENSITIVE COMPOSITION USED THEREIN TOKYO OHKA KOGYO CO., LTD. (JP) 2006-01-12 WO disclosed
US-6838229-B2 Chemically amplified negative photoresist composition for the formation of thick films, photoresist base material and method of forming bumps using the same TOKYO OHKA KOGYO CO., LTD. (JP) 2005-01-04 US disclosed
US-20030064319-A1 Negative photoresist compositions for the formation of thick films, photoresist films and methods of forming bumps using the same TOKYO OHKA KOGYO CO., LTD. 2003-04-03 US disclosed
US-20030039921-A1 Chemically amplified negative photoresist composition for the formation of thick films, photoresist base material and method of forming bumps using the same TOKYO OHKA KOGYO CO., LTD. 2003-02-27 US disclosed