SCHEMBL503479

SCHEMBL503479

O=S(=O)(Oc1cccc(OS(=O)(=O)C(F)(C(F)(F)F)C(F)(F)C(F)(F)F)c1OS(=O)(=O)C(F)(C(F)(F)F)C(F)(F)C(F)(F)F)C(F)(C(F)(F)F)C(F)(F)C(F)(F)F

nearest known ligand 0.32

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
DRD2 P14416 2/20 0.32
DRD3 P35462 2/20 0.32
HTR1D P28221 1/20 0.32
DRD4 P21917 1/20 0.32
HTR5A P47898 1/20 0.32
ELANE P08246 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2895999 0.82 CA2 (0.41)
SCHEMBL66020 0.81 DRD2 (0.40) DRD2DRD3HTR1DDRD4HTR5A
SCHEMBL3696269 0.81 CA2 (0.42)
SCHEMBL6550061 0.79 DRD2 (0.34) DRD2DRD3HTR1DDRD4HTR5A
SCHEMBL7641839 0.75 DRD2 (0.32) DRD2DRD3HTR1DDRD4HTR5A
SCHEMBL8776806 0.73 ELANE (0.31) ELANE
SCHEMBL20943735 0.72 DRD2 (0.38) DRD2DRD3HTR1DDRD4HTR5A
SCHEMBL4686314 0.70 EPAS1 (0.38) DRD2DRD3HTR1DDRD4HTR5A
SCHEMBL17310208 0.70 DRD2 (0.36) DRD2DRD3HTR1DDRD4HTR5A
SCHEMBL1712822 0.69 CA2 (0.41) DRD2DRD3HTR1D

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8435718-B2 Upper layer-forming composition and photoresist patterning method JSR CORPORATION (JP) 2013-05-07 US disclosed
EP-1950610-B1 IMMERSION LITHOGRAPHIC COMPOSITION FOR FORMING UPPER FILM AND METHOD FOR FORMING PHOTORESIST PATTERN JSR CORP (JP) 2012-05-02 EP disclosed
US-20120028198-A1 UPPER LAYER-FORMING COMPOSITION AND PHOTORESIST PATTERNING METHOD JSR CORPORATION (JP) 2012-02-02 US disclosed
US-20100003615-A1 UPPER LAYER-FORMING COMPOSITION AND PHOTORESIST PATTERNING METHOD JSR CORPORATION (JP) 2010-01-07 US disclosed
EP-1950610-A1 COMPOSITION FOR FORMING UPPER FILM AND METHOD FOR FORMING PHOTORESIST PATTERN JSR Corporation (JP) 2008-07-30 EP disclosed