Trifluoromethanesulfonic Acid

Trifluoromethanesulfonic Acid

SCHEMBL516028

O=C1CCCCC1[S+](C1CCCCC1)C1CCCCC1.O=S(=O)([O-])C(F)(F)F

nearest known ligand 0.37

Full drug profile on Sugi Atlas →

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
KMT2A Q03164 1/20 0.37
CA1 P00915 2/20 0.34
CA2 P00918 2/20 0.34
CA4 P22748 1/20 0.34
MAPT P10636 1/20 0.33
CA12 O43570 1/20 0.31
CA9 Q16790 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5367225 0.86 KMT2A (0.32) KMT2A
Trifluoromethanesulfonic Acid SCHEMBL65803 0.85 KMT2A (0.39) KMT2ACA1CA2CA4MAPT
SCHEMBL5353043 0.85 CA2 (0.31) KMT2ACA2
Trifluoromethanesulfonic Acid SCHEMBL4165039 0.84
Trifluoromethanesulfonic Acid SCHEMBL6140981 0.84 CA1 (0.37) KMT2ACA1CA2CA4MAPT
SCHEMBL686045 0.83 KMT2A (0.45) KMT2ACA1CA2CA4MAPT
Trifluoromethanesulfonic Acid SCHEMBL6140329 0.82 KMT2A (0.35) KMT2ACA1CA2CA4
Trifluoromethanesulfonic Acid SCHEMBL4410247 0.82 KMT2A (0.36) KMT2ACA1CA2CA4
Trifluoromethanesulfonic Acid SCHEMBL515932 0.81 CA1 (0.40) KMT2ACA1CA2CA4MAPT
SCHEMBL8169160 0.80 KMT2A (0.39) KMT2ACA1CA2CA4MAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 295 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0745633-B1 Si containing high molecular compound and photosensitive resin composition NEC CORP (JP) 2000-08-02 EP claimed
US-5738975-A MIXTURE CONTAINING (METH)ACRYLATE TERPOLYMER HAVING GROUP WHICH REACTS WITH AN ACID TO CONVERT POLARITY OF POLYMER, PHOTO ACID GENERATING COMPOUND, SOLVENT NEC CORPORATION (JP) 1998-04-14 US claimed
US-5621019-A PHOTORESIST CONTAINING PHOTO ACID GENERATOR AND ULTRAVIOLET RADIATION TRANSPARENT ACRYLIC POLYMER HAVING BRIDGED CYCLOHYDROCARBON GROUP RESIDUE; RESOLUTION, DRY ETCH RESISTANCE NEC CORPORATION (JP) 1997-04-15 US claimed
EP-4747233-A2 COMPOUNDS, COMPOSITIONS CONTAINING COMPOUNDS, AND METHODS OF MANUFACTURING RESIST MEMBRANES Merck Patent GmbH (DE) 2026-05-27 EP disclosed
CN-120077771-A Curable composition for organic EL element, cured product for organic EL element, method for producing cured product for organic EL element, and polymer JSR株式会社 2025-05-30 CN disclosed
WO-2025017121-A2 COMPOUNDS, COMPOSITIONS CONTAINING COMPOUNDS, AND METHODS OF MANUFACTURING RESIST MEMBRANES MERCK PATENT GMBH (DE) 2025-01-23 WO disclosed
CN-110850680-B Curable composition, display element, and method for forming cured film JSR株式会社 2024-10-25 CN disclosed
WO-2024101411-A1 CURABLE COMPOSITION FOR ORGANIC EL ELEMENTS, CURED PRODUCT FOR ORGANIC EL ELEMENTS AND METHOD FOR PRODUCING SAME, ORGANIC EL ELEMENT, AND POLYMER JSR株式会社 2024-05-16 WO disclosed
US-11681222-B2 Fluorine-containing polymer, purification method, and radiation-sensitive resin composition JSR CORPORATION (JP) 2023-06-20 US disclosed
US-11370888-B2 Silicon-rich silsesquioxane resins DOW SILICONES CORPORATION (US) 2022-06-28 US disclosed
CN-107544208-B Negative photosensitive resin composition, spacer, protective film and liquid crystal display element 奇美实业股份有限公司 2022-05-31 CN disclosed
US-5866304-A USING AN ACRYLATED ACID TERPOLYMER NEC CORPORATION (JP) 1999-02-02 US disclosed
EP-0849634-A1 Radiation sensitive resin composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1998-06-24 EP disclosed
US-5770346-A BRIDGED CYCLIC HYDROCARBON GROUP-CONTAINING ACRYLATE POLYMER NEC CORPORATION (JP) 1998-06-23 US disclosed
US-5738975-A MIXTURE CONTAINING (METH)ACRYLATE TERPOLYMER HAVING GROUP WHICH REACTS WITH AN ACID TO CONVERT POLARITY OF POLYMER, PHOTO ACID GENERATING COMPOUND, SOLVENT NEC CORPORATION (JP) 1998-04-14 US disclosed
US-5665518-A CARBOXY-SUBSTITUTED, BRIDGED CARBOCYCLIC (METH)ACRYLATE DERIVATIVE MONOMERS; TRANSPARENCY, RESOLUTION, SOLUBILITY, AND DRY-ETCHING RESISTANCE; SEMICONDUCTORS NEC CORPORATION (JP) 1997-09-09 US disclosed
EP-0789278-A2 Radiation-sensitive resin composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1997-08-13 EP disclosed
US-5635332-A MIXTURE WITH ULTRAVIOLET TRANSPARENT POLYMER HAVING GROUPS WHICH ARE UNSTABLE TO ACID NEC CORPORATION (JP) 1997-06-03 US disclosed
US-5621019-A PHOTORESIST CONTAINING PHOTO ACID GENERATOR AND ULTRAVIOLET RADIATION TRANSPARENT ACRYLIC POLYMER HAVING BRIDGED CYCLOHYDROCARBON GROUP RESIDUE; RESOLUTION, DRY ETCH RESISTANCE NEC CORPORATION (JP) 1997-04-15 US disclosed
US-5585507-A FINENESS PATTERNS NEC CORPORATION (JP) 1996-12-17 US disclosed