Trifluoromethanesulfonic Acid

Trifluoromethanesulfonic Acid

SCHEMBL515932

C[S+](C)C1CCCCC1=O.O=S(=O)([O-])C(F)(F)F

nearest known ligand 0.40

Full drug profile on Sugi Atlas →

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
CA1 P00915 2/20 0.40
CA2 P00918 2/20 0.40
CA4 P22748 1/20 0.40
KMT2A Q03164 1/20 0.39
MAPT P10636 1/20 0.31
KDM4E B2RXH2 1/20 0.30
HSD17B10 Q99714 1/20 0.30
CA12 O43570 1/20 0.30
CA9 Q16790 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Trifluoromethanesulfonic Acid SCHEMBL1078830 0.87 CA1 (0.36) CA1CA2CA4KMT2AMAPT
Trifluoromethanesulfonic Acid SCHEMBL6140981 0.86 CA1 (0.37) CA1CA2CA4KMT2AMAPT
SCHEMBL5364680 0.86 CA2 (0.34) CA1CA2CA4KMT2A
Trifluoromethanesulfonic Acid SCHEMBL65803 0.85 KMT2A (0.39) CA1CA2CA4KMT2AMAPT
SCHEMBL5367168 0.84 CA2 (0.33) CA1CA2CA4KMT2A
Trifluoromethanesulfonic Acid SCHEMBL6821487 0.83 CA1 (0.34) CA1CA2CA4KMT2A
SCHEMBL685946 0.82 CA1 (0.50) CA1CA2CA4KMT2AMAPT
Trifluoromethanesulfonic Acid SCHEMBL6140329 0.82 KMT2A (0.35) CA1CA2CA4KMT2A
Trifluoromethanesulfonic Acid SCHEMBL64419 0.81 CA1 (0.31) CA1CA2CA4KMT2A
Trifluoromethanesulfonic Acid SCHEMBL516028 0.81 KMT2A (0.37) CA1CA2CA4KMT2AMAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 270 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0745633-B1 Si containing high molecular compound and photosensitive resin composition NEC CORP (JP) 2000-08-02 EP claimed
US-5738975-A MIXTURE CONTAINING (METH)ACRYLATE TERPOLYMER HAVING GROUP WHICH REACTS WITH AN ACID TO CONVERT POLARITY OF POLYMER, PHOTO ACID GENERATING COMPOUND, SOLVENT NEC CORPORATION (JP) 1998-04-14 US claimed
US-5621019-A PHOTORESIST CONTAINING PHOTO ACID GENERATOR AND ULTRAVIOLET RADIATION TRANSPARENT ACRYLIC POLYMER HAVING BRIDGED CYCLOHYDROCARBON GROUP RESIDUE; RESOLUTION, DRY ETCH RESISTANCE NEC CORPORATION (JP) 1997-04-15 US claimed
CN-110850680-B Curable composition, display element, and method for forming cured film JSR株式会社 2024-10-25 CN disclosed
US-11681222-B2 Fluorine-containing polymer, purification method, and radiation-sensitive resin composition JSR CORPORATION (JP) 2023-06-20 US disclosed
CN-107544208-B Negative photosensitive resin composition, spacer, protective film and liquid crystal display element 奇美实业股份有限公司 2022-05-31 CN disclosed
CN-108700835-B Resist pattern forming method and resist 日本瑞翁株式会社 2022-05-27 CN disclosed
US-20220137508-A9 FLUORINE-CONTAINING POLYMER, PURIFICATION METHOD, AND RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2022-05-05 US disclosed
CN-109415513-B Silicon-rich silsesquioxane resins 美国陶氏有机硅公司 2022-02-25 CN disclosed
US-20210278764-A1 FLUORINE-CONTAINING POLYMER, PURIFICATION METHOD, AND RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2021-09-09 US disclosed
US-11036133-B2 Fluorine-containing polymer, purification method, and radiation-sensitive resin composition JSR CORPORATION (JP) 2021-06-15 US disclosed
EP-0930541-A1 Radiation sensitive resin composition JSR Corporation (JP) 1999-07-21 EP disclosed
US-5866304-A USING AN ACRYLATED ACID TERPOLYMER NEC CORPORATION (JP) 1999-02-02 US disclosed
EP-0849634-A1 Radiation sensitive resin composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1998-06-24 EP disclosed
US-5770346-A BRIDGED CYCLIC HYDROCARBON GROUP-CONTAINING ACRYLATE POLYMER NEC CORPORATION (JP) 1998-06-23 US disclosed
US-5738975-A MIXTURE CONTAINING (METH)ACRYLATE TERPOLYMER HAVING GROUP WHICH REACTS WITH AN ACID TO CONVERT POLARITY OF POLYMER, PHOTO ACID GENERATING COMPOUND, SOLVENT NEC CORPORATION (JP) 1998-04-14 US disclosed
US-5665518-A CARBOXY-SUBSTITUTED, BRIDGED CARBOCYCLIC (METH)ACRYLATE DERIVATIVE MONOMERS; TRANSPARENCY, RESOLUTION, SOLUBILITY, AND DRY-ETCHING RESISTANCE; SEMICONDUCTORS NEC CORPORATION (JP) 1997-09-09 US disclosed
EP-0789278-A2 Radiation-sensitive resin composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1997-08-13 EP disclosed
US-5621019-A PHOTORESIST CONTAINING PHOTO ACID GENERATOR AND ULTRAVIOLET RADIATION TRANSPARENT ACRYLIC POLYMER HAVING BRIDGED CYCLOHYDROCARBON GROUP RESIDUE; RESOLUTION, DRY ETCH RESISTANCE NEC CORPORATION (JP) 1997-04-15 US disclosed
US-5585507-A FINENESS PATTERNS NEC CORPORATION (JP) 1996-12-17 US disclosed