SCHEMBL5164652

SCHEMBL5164652

CCCCCOC1CC2CCC1C2

nearest known ligand 0.39

Predicted protein targets (top 17)

geneUniProtsupporting neighboursconfidence
GBA1 P04062 3/20 0.39
ALDH1A1 P00352 1/20 0.34
TDP1 Q9NUW8 1/20 0.34
EPHX2 P34913 2/20 0.33
ATM Q13315 1/20 0.33
CTSV O60911 1/20 0.33
CTSL P07711 1/20 0.33
CTSS P25774 1/20 0.33
CTSK P43235 1/20 0.33
GRM1 Q13255 2/20 0.33
PPP5C P53041 1/20 0.33
CYP19A1 P11511 1/20 0.31
MAPT P10636 2/20 0.31
MEN1 O00255 1/20 0.31
THRB P10828 1/20 0.31
HTT P42858 1/20 0.31
KMT2A Q03164 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12228751 0.98 GBA1 (0.41) GBA1ALDH1A1TDP1EPHX2ATM
SCHEMBL14619689 0.94 PPP5C (0.36) GBA1ATMCTSVCTSLCTSS
SCHEMBL14318437 0.86 GRM1 (0.38) EPHX2ATMCTSVCTSLCTSS
SCHEMBL18473591 0.78 CTSV (0.37) EPHX2CTSVCTSLCTSSCTSK
SCHEMBL76360 0.78 GRM1 (0.39) ALDH1A1EPHX2ATMGRM1CYP19A1
SCHEMBL2633205 0.78 GRM1 (0.39) ALDH1A1EPHX2ATMGRM1CYP19A1
SCHEMBL22507523 0.78 GRM1 (0.39) ALDH1A1EPHX2ATMGRM1CYP19A1
SCHEMBL13677258 0.78 GRM1 (0.39) ALDH1A1EPHX2ATMGRM1CYP19A1
SCHEMBL10835988 0.75 ATM (0.38) ATMGRM1CYP19A1
SCHEMBL9586910 0.75 ATM (0.40) EPHX2ATMGRM1CYP19A1MAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 12 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8043788-B2 Alkali soluble resin; immersion lithography SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-10-25 US disclosed
US-7598016-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-10-06 US disclosed
US-7598016-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-10-06 US disclosed
US-7514204-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-04-07 US disclosed
US-7514204-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-04-07 US disclosed
US-20090011365-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-01-08 US disclosed
US-20090011365-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-01-08 US disclosed
US-20080241736-A1 Immersion lithography; copolymer containing ammonium salt of carboxylic acid and fluorine monomer SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-10-02 US disclosed
US-20080241736-A1 Immersion lithography; copolymer containing ammonium salt of carboxylic acid and fluorine monomer SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-10-02 US disclosed
US-20080096131-A1 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2008-04-24 US disclosed
US-20080096131-A1 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2008-04-24 US disclosed
WO-2007007084-A2 COPPER (II) CATALYSED ADDITIONS TO ALKENES IC INNOVATIONS LIMITED (GB) 2007-01-18 WO disclosed