SCHEMBL5408671

SCHEMBL5408671

CC(C)c1ccc([I+](OS(=O)(=O)c2c(F)c(F)c(F)c(F)c2F)c2ccc(C(C)C)cc2)cc1

nearest known ligand 0.31

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
CA1 P00915 2/20 0.31
CA2 P00918 2/20 0.31
KDM4E B2RXH2 1/20 0.31
ALDH1A1 P00352 1/20 0.31
LMNA P02545 1/20 0.31
GAA P10253 1/20 0.31
MAPT P10636 1/20 0.31
TYR P14679 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1800655 0.82 CA1 (0.33) CA1CA2ALDH1A1
SCHEMBL2902231 0.82 CA1 (0.33) CA1CA2GAAMAPT
SCHEMBL5408480 0.80 LMNA (0.41) CA1CA2KDM4EALDH1A1LMNA
SCHEMBL503664 0.78 CA1 (0.38) CA1CA2
SCHEMBL503801 0.78 HDAC11 (0.37) CA1CA2ALDH1A1LMNAGAA
SCHEMBL5409951 0.78 CA2 (0.40) CA1CA2KDM4EALDH1A1LMNA
SCHEMBL5404365 0.78 CNR2 (0.39) ALDH1A1LMNAMAPT
SCHEMBL7896688 0.76 TYR (0.36) CA1CA2KDM4EALDH1A1LMNA
SCHEMBL1803566 0.76 CA1 (0.38) CA1CA2
SCHEMBL5411400 0.76 CA2 (0.43) CA1CA2ALDH1A1LMNAGAA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7312014-B2 Poly(p-hydroxystyrene/styrene/alkyl acrylate) terpolymer derivative and acid generator comprising triphenylsulfonium benzenesulfonate derivative; forming positive pattern using transcription technology in high vacuum with irradiated energy such as electron beam, extreme ultraviolet ray and X-ray WAKO PURE CHEMICAL INDUSTRIES LTD. (JP) 2007-12-25 US disclosed
US-20040170918-A1 Poly(p-hydroxystyrene/styrene/alkyl acrylate) terpolymer derivative and acid generator comprising triphenylsulfonium benzenesulfonate derivative; forming positive pattern using transcription technology in high vacuum with irradiated energy such as electron beam, extreme ultraviolet ray and X-ray WAKO PURE CHEMICAL INDUSTRIES LTD. (JP) 2004-09-02 US disclosed
EP-1406123-A1 RESIST COMPOSITIONS Wako Pure Chemical Industries, Ltd. (JP) 2004-04-07 EP disclosed