Ethylene Glycol

Ethylene Glycol

SCHEMBL545519

COCCOCCOCCOC(C)=O.OCCO

nearest known ligand 0.56

Full drug profile on Sugi Atlas →

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 5/20 0.56
TSHR P16473 4/20 0.56
CHRM5 P08912 2/20 0.40
CHRM1 P11229 2/20 0.40
CHRM3 P20309 2/20 0.40
PGR P06401 1/20 0.40
CHRM2 P08172 1/20 0.40
CHRM4 P08173 1/20 0.40
HTR1A P08908 1/20 0.40
CHRNB2 P17787 1/20 0.40
TBXA2R P21731 1/20 0.40
CHRNB4 P30926 1/20 0.40
CHRNA3 P32297 1/20 0.40
CHRNA7 P36544 1/20 0.40
CHRNA4 P43681 1/20 0.40
SMN1; SMN2 Q16637 1/20 0.40
CHRNA10 Q9GZZ6 1/20 0.40
CHRNA9 Q9UGM1 1/20 0.40
GALR3 O60755 2/20 0.39
GAA P10253 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Triethylene Glycol SCHEMBL545520 0.94 TSHR (0.54) ALDH1A1TSHRCHRM5CHRM1CHRM3
SCHEMBL144109 0.93 ALDH1A1 (0.62) ALDH1A1TSHRCHRM5CHRM1CHRM3
SCHEMBL5241372 0.93 ALDH1A1 (0.62) ALDH1A1TSHRCHRM5CHRM1CHRM3
SCHEMBL10348268 0.93 ALDH1A1 (0.62) ALDH1A1TSHRCHRM5CHRM1CHRM3
SCHEMBL273033 0.93 ALDH1A1 (0.62) ALDH1A1TSHRCHRM5CHRM1CHRM3
SCHEMBL10348270 0.93 ALDH1A1 (0.62) ALDH1A1TSHRCHRM5CHRM1CHRM3
SCHEMBL2702088 0.93 ALDH1A1 (0.62) ALDH1A1TSHRCHRM5CHRM1CHRM3
SCHEMBL17932923 0.93 ALDH1A1 (0.62) ALDH1A1TSHRCHRM5CHRM1CHRM3
Ethylene Glycol SCHEMBL6926850 0.93 ALDH1A1 (0.50) ALDH1A1TSHRCHRM5CHRM1CHRM3
Acetic Acid SCHEMBL2688979 0.92 TSHR (0.48) ALDH1A1TSHRCHRM5CHRM1CHRM3

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 105 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12024693-B2 Imidazolidinethione-containing compositions for post-ash residue removal and/or for oxidative etching of a layer or mask comprising TiN BASF SE (DE) 2024-07-02 US claimed
CN-116286222-A TIN pullback and cleaning compositions 巴斯夫欧洲公司 2023-06-23 CN claimed
US-20210189298-A1 IMIDAZOLIDINETHIONE-CONTAINING COMPOSITIONS FOR POST-ASH RESIDUE REMOVAL AND/OR FOR OXIDATIVE ETCHING OF A LAYER OR MASK COMPRISING TiN BASF SE (DE) 2021-06-24 US claimed
EP-3776083-A1 IMIDAZOLIDINETHIONE-CONTAINING COMPOSITIONS FOR POST-ASH RESIDUE REMOVAL AND/OR FOR OXIDATIVE ETCHING OF A LAYER OR MASK COMPRISING TIN BASF SE (DE) 2021-02-17 EP claimed
US-10879076-B2 Etching solution for selectively removing silicon-germanium alloy from a silicon-germanium/silicon stack during manufacture of a semiconductor device VERSUM MATERIALS US, LLC (US) 2020-12-29 US claimed
EP-3143117-B1 TIN PULL-BACK AND CLEANING COMPOSITION BASF SE (DE) 2019-09-04 EP claimed
US-10233413-B2 Cleaning formulations VERSUM MATERIALS US, LLC (US) 2019-03-19 US claimed
US-10170296-B2 TiN pull-back and cleaning composition BASF SE (DE) 2019-01-01 US claimed
US-10141181-B2 2018-11-27 US claimed
US-20170081622-A1 Cleaning Formulations AIR PRODUCTS AND CHEMICALS, INC. (US) 2017-03-23 US claimed
US-20060293208-A1 Composition for removal of residue comprising cationic salts and methods using same VERSUM MATERIALS US, LLC 2006-12-28 US claimed
EP-1736534-A1 Composition for removal of residue comprising cationic salts and methods using same Air Products and Chemicals, Inc. (US) 2006-12-27 EP claimed
CN-1776532-A Composition for removal of residual material from substrate and method using the composition AIR PROD & CHEM (US) 2006-05-24 CN claimed
EP-1619557-A1 Composition for removing photoresist and/or etching residue from a substrate and use thereof AIR PRODUCTS AND CHEMICALS, INC. (US) 2006-01-25 EP claimed
US-20060014656-A1 Composition for stripping and cleaning and use thereof VERSUM MATERIALS US, LLC 2006-01-19 US claimed
US-20060003910-A1 Composition and method comprising same for removing residue from a substrate AIR PRODUCTS AND CHEMICALS, INC. 2006-01-05 US claimed
EP-1612858-A2 Composition for stripping and cleaning and use thereof AIR PRODUCTS AND CHEMICALS, INC. (US) 2006-01-04 EP claimed
CN-1715389-A Composition for cleaning and cleansing and use thereof AIR PROD & CHEM (US) 2006-01-04 CN claimed
EP-1610185-A2 Composition and method using same for removing residue from a substrate AIR PRODUCTS AND CHEMICALS, INC. (US) 2005-12-28 EP claimed
US-20050119143-A1 Compositions for the removal of organic and inorganic residues VERSUM MATERIALS US, LLC 2005-06-02 US claimed