SCHEMBL545728

SCHEMBL545728

CC[Si](C)(C)N([Co]N([Si](C)(C)CC)[Si](C)(C)CC)[Si](C)(C)CC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL545794 0.71 LMNA (0.30)
SCHEMBL972471 0.67
SCHEMBL22200158 0.65
SCHEMBL545225 0.62
SCHEMBL31347640 0.62
SCHEMBL22734006 0.62
SCHEMBL6046989 0.62
SCHEMBL4543014 0.60
SCHEMBL1428307 0.60
SCHEMBL1927648 0.60

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 58 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20240218503-A1 SELECTIVE COBALT DEPOSITION ON COPPER SURFACES APPLIED MATERIALS, INC. 2024-07-04 US disclosed
US-20240213088-A1 SUBTRACTIVE METALS AND SUBTRACTIVE METAL SEMICONDUCTOR STRUCTURES APPLIED MATERIALS, INC. 2024-06-27 US disclosed
US-11990368-B2 Doped selective metal caps to improve copper electromigration with ruthenium liner APPLIED MATERIALS, INC. (US) 2024-05-21 US disclosed
US-11959167-B2 Selective cobalt deposition on copper surfaces APPLIED MATERIALS, INC. (US) 2024-04-16 US disclosed
US-11923244-B2 Subtractive metals and subtractive metal semiconductor structures APPLIED MATERIALS, INC. (US) 2024-03-05 US disclosed
US-11875987-B2 Contacts having a geometry to reduce resistance INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2024-01-16 US disclosed
US-11384429-B2 Selective cobalt deposition on copper surfaces APPLIED MATERIALS, INC. (US) 2022-07-12 US disclosed
US-11373903-B2 Doped selective metal caps to improve copper electromigration with ruthenium liner APPLIED MATERIALS, INC. (US) 2022-06-28 US disclosed
US-11062993-B2 Contacts having a geometry to reduce resistance INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2021-07-13 US disclosed
US-20200194371-A1 CONTACTS HAVING A GEOMETRY TO REDUCE RESISTANCE INTERNATIONAL BUSINESS MACHINES CORPORATION 2020-06-18 US disclosed
WO-2010025068-A2 COBALT DEPOSITION ON BARRIER SURFACES APPLIED MATERIALS, INC. (US) 2010-03-04 WO disclosed
WO-2009134840-A2 SELECTIVE COBALT DEPOSITION ON COPPER SURFACES APPLIED MATERIALS, INC. (US) 2009-11-05 WO disclosed
WO-2009134916-A2 PROCESS FOR FORMING COBALT AND COBALT SILICIDE MATERIALS IN TUNGSTEN CONTACT APPLICATIONS APPLIED MATERIALS, INC. (US) 2009-11-05 WO disclosed
WO-2009134925-A2 PROCESS FOR FORMING COBALT AND COBALT SILICIDE MATERIALS IN COPPER CONTACT APPLICATIONS APPLIED MATERIALS, INC. (US) 2009-11-05 WO disclosed
US-20090269507-A1 SELECTIVE COBALT DEPOSITION ON COPPER SURFACES APPLIED MATERIALS, INC. 2009-10-29 US disclosed
US-20090053426-A1 COBALT DEPOSITION ON BARRIER SURFACES APPLIED MATERIALS, INC. 2009-02-26 US disclosed
US-20090004850-A1 PROCESS FOR FORMING COBALT AND COBALT SILICIDE MATERIALS IN TUNGSTEN CONTACT APPLICATIONS APPLIED MATERIALS, INC. 2009-01-01 US disclosed
US-20080268635-A1 PROCESS FOR FORMING COBALT AND COBALT SILICIDE MATERIALS IN COPPER CONTACT APPLICATIONS APPLIED MATERIALS, INC. 2008-10-30 US disclosed
WO-2007121249-A2 PROCESS FOR FORMING COBALT-CONTAINING MATERIALS APPLIED MATERIALS, INC. (US) 2007-10-25 WO disclosed
US-20070202254-A1 PROCESS FOR FORMING COBALT-CONTAINING MATERIALS APPLIED MATERIALS, INC. 2007-08-30 US disclosed