SCHEMBL547288

SCHEMBL547288

O=C(OC12CC3CC(C1)C(=O)C(C3)C2)OS(=O)(=O)C(F)F

nearest known ligand 0.49

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
TSHR P16473 1/20 0.49
NPSR1 Q6W5P4 1/20 0.49
EPHX2 P34913 2/20 0.37
CA2 P00918 1/20 0.31
NAAA Q02083 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1348804 0.88 TSHR (0.40) TSHRNPSR1
SCHEMBL2193633 0.80 TSHR (0.43) TSHRNPSR1EPHX2
SCHEMBL1697272 0.77 TSHR (0.56) TSHRNPSR1EPHX2NAAA
SCHEMBL12705217 0.74 TSHR (0.53) TSHRNPSR1EPHX2NAAA
SCHEMBL14019740 0.73 TSHR (0.63) TSHRNPSR1EPHX2NAAA
SCHEMBL19261603 0.73 TSHR (0.52) TSHRNPSR1EPHX2CA2NAAA
SCHEMBL547287 0.73 TSHR (0.52) TSHRNPSR1EPHX2CA2NAAA
SCHEMBL10203472 0.73 TSHR (0.49) TSHRNPSR1EPHX2CA2NAAA
SCHEMBL10150821 0.72 TSHR (0.51) TSHRNPSR1EPHX2CA2NAAA
SCHEMBL10150481 0.71 NPSR1 (0.53) TSHRNPSR1EPHX2NAAA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9122155-B2 Sulfonium salt, resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-09-01 US disclosed
EP-2146247-B1 Resist patterning process and manufacturing photo mask SHINETSU CHEMICAL CO (JP) 2015-04-15 EP disclosed
US-8956803-B2 Sulfonium salt, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-02-17 US disclosed
US-8110335-B2 Resist patterning process and manufacturing photo mask SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-02-07 US disclosed
EP-2146247-A1 Resist patterning process and manufacturing photo mask Shin-Etsu Chemical Co., Ltd. (JP) 2010-01-20 EP disclosed
US-20100009271-A1 Resist patterning process and manufacturing photo mask SHIN-ETSU CHEMICAL CO., LTD (JP) 2010-01-14 US disclosed